scholarly journals Comparison of Single-Event Transients in an Epitaxial Silicon Diode Resulting from Heavy Ion- Focused X-Rayand Pulsed Laser-Induced Charge Generation.

2020 ◽  
Author(s):  
Kaitlyn Ryder ◽  
◽  
Landen Ryder ◽  
Andrew Sternberg ◽  
John Kozub ◽  
...  
Keyword(s):  
Pulsed Laser ◽  
Heavy Ion ◽  
Single Event ◽  
Epitaxial Silicon ◽  
Charge Generation ◽  
Silicon Diode ◽  
Single Event Transients ◽  
Induced Charge

scholarly journals Comparison of Single-Event Transients in an Epitaxial Silicon Diode Resulting from Heavy Ion-, Focused X-Ray-, and Pulsed Laser-Induced Charge Generation

2021 ◽  
pp. 1-1
Author(s):  
Kaitlyn L. Ryder ◽  
Landen D. Ryder ◽  
Andrew L. Sternberg ◽  
John A. Kozub ◽  
En Xia Zhang ◽  
...  
Keyword(s):  
Pulsed Laser ◽  
Heavy Ion ◽  
Single Event ◽  
Epitaxial Silicon ◽  
Charge Generation ◽  
X Ray ◽  
Silicon Diode ◽  
Single Event Transients ◽  
Induced Charge

Heavy Ion and High Energy Proton-Induced Single Event Transients in 90 nm Inverter, NAND and NOR Gates

2009 ◽  
Vol 56 (6) ◽  
pp. 3511-3518 ◽  
Author(s):  
Ethan H. Cannon ◽  
Manuel Cabanas-Holmen
Keyword(s):  
Heavy Ion ◽  
High Energy ◽  
Single Event ◽  
High Energy Proton ◽  
Energy Proton ◽  
Single Event Transients

Investigations on heavy ion induced Single-Event Transients (SETs) in highly-scaled FinFETs

2015 ◽  
Vol 365 ◽  
pp. 631-635 ◽  
Author(s):  
M. Gaillardin ◽  
M. Raine ◽  
P. Paillet ◽  
P.C. Adell ◽  
S. Girard ◽  
...  
Keyword(s):  
Heavy Ion ◽  
Single Event ◽  
Single Event Transients

Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser

2014 ◽  
Vol 30 (1) ◽  
pp. 149-154 ◽  
Author(s):  
Y. Ren ◽  
A.-L. He ◽  
S.-T. Shi ◽  
G. Guo ◽  
L. Chen ◽  
...  
Keyword(s):  
Pulse Width ◽  
Pulsed Laser ◽  
Heavy Ion ◽  
Single Event ◽  
Single Event Transient ◽  
Pulse Width Modulator ◽  
Ion Proton ◽  
Transient Measurements

Impacts of Proton Radiation on Heavy-Ion-Induced Single-Event Transients in 65-nm CMOS Technology

2019 ◽  
Vol 66 (1) ◽  
pp. 177-183
Author(s):  
Zhenyu Wu ◽  
Shuming Chen ◽  
Jianjun Chen ◽  
Pengcheng Huang
Keyword(s):  
Cmos Technology ◽  
Heavy Ion ◽  
Proton Radiation ◽  
Single Event ◽  
Single Event Transients

Heavy-ion and pulsed-laser single event effects in 130-nm CMOS-based thin/thick gate oxide anti-fuse PROMs

2019 ◽  
Vol 30 (5) ◽  
Author(s):  
Chang Cai ◽  
Tian-Qi Liu ◽  
Xiao-Yuan Li ◽  
Jie Liu ◽  
Zhan-Gang Zhang ◽  
...  
Keyword(s):  
Pulsed Laser ◽  
Gate Oxide ◽  
Heavy Ion ◽  
Single Event ◽  
Single Event Effects

Comparison of radiation-induced charge sharing generated by heavy ion and pulsed laser

2016 ◽  
Author(s):  
Song Ruiqiang ◽  
Chen Shuming ◽  
Han Jianwei ◽  
Chi Yaqing ◽  
Chen Rui ◽  
...  
Keyword(s):  
Pulsed Laser ◽  
Heavy Ion ◽  
Charge Sharing ◽  
Radiation Induced ◽  
Induced Charge

Single event transients in PDSOI CMOS inverter chain irradiated by pulsed laser

2014 ◽  
Author(s):  
Xing Zhao ◽  
Bo Mei ◽  
Jinshun Bi ◽  
Zhongshan Zheng ◽  
Linchun Gao ◽  
...  
Keyword(s):  
Pulsed Laser ◽  
Single Event ◽  
Cmos Inverter ◽  
Single Event Transients
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