Исследование структуры объемного гетероперехода в полимерных солнечных элементах с помощью комбинации ультрамикротомирования и атомно-силовой микроскопии

AbstractA method for visualization via atomic-force microscopy of the internal structure of photoactive layers of polymer solar cells using an ultramicrotome for photoactive layer cutting is proposed and applied. The method creates an opportunity to take advantage of atomic-force microscopy in structural investigations of the bulk of soft samples. Such advantages of atomic-force microscopy include a high contrast and the ability to measure various surface properties at nanometer resolution. Using the proposed method, samples of the photoactive layer of polymer solar cells based on a mixture of PTB7 polythiophene and PC_71BM fullerene derivatives are studied. The disclosed details of the bulk structure of this mixture allow us to draw additional conclusions about the effect of morphology on the efficiency of organic solar cells.

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Quantitative characterization of phase separation in the photoactive layer of polymer solar cells by the phase image of atomic force microscopy

Thin Solid Films ◽

10.1016/j.tsf.2015.01.009 ◽

2015 ◽

Vol 576 ◽

pp. 81-87 ◽

Cited By ~ 8

Author(s):

H.L. Gao ◽

X.W. Zhang ◽

J.H. Meng ◽

Z.G. Yin ◽

L.Q. Zhang ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Solar Cells ◽

Phase Separation ◽

Polymer Solar Cells ◽

Phase Image ◽

Quantitative Characterization ◽

Photoactive Layer ◽

Force Microscopy ◽

Atomic Force

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Charge Transport in Intermixed Regions of All-Polymer Solar Cells Studied by Conductive Atomic Force Microscopy

ACS Applied Materials & Interfaces ◽

10.1021/acsami.7b00979 ◽

2017 ◽

Vol 9 (18) ◽

pp. 15615-15622 ◽

Cited By ~ 18

Author(s):

Miki Osaka ◽

Daisuke Mori ◽

Hiroaki Benten ◽

Hiroki Ogawa ◽

Hideo Ohkita ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Solar Cells ◽

Charge Transport ◽

Polymer Solar Cells ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

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Combined Ultramicrotomy and Atomic Force Microscopy Study of the Structure of a Bulk Heterojunction in Polymer Solar Cells

Semiconductors ◽

10.1134/s1063782618010025 ◽

2018 ◽

Vol 52 (1) ◽

pp. 105-111

Author(s):

A. M. Alekseev ◽

A. Al-Afeef ◽

G. J. Hedley ◽

S. S. Kharintsev ◽

A. E. Efimov ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Solar Cells ◽

Bulk Heterojunction ◽

Polymer Solar Cells ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force

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Electroluminescence mapping of CuGaSe2 solar cells by atomic force microscopy

Applied Physics Letters ◽

10.1063/1.2360230 ◽

2006 ◽

Vol 89 (14) ◽

pp. 143120 ◽

Cited By ~ 10

Author(s):

Manuel J. Romero ◽

C.-S. Jiang ◽

J. Abushama ◽

H. R. Moutinho ◽

M. M. Al-Jassim ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Solar Cells ◽

Force Microscopy ◽

Atomic Force

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Phase Contrast Imaging in Atomic Force Microscopy

Microscopy and Microanalysis ◽

10.1017/s143192760001326x ◽

1997 ◽

Vol 3 (S2) ◽

pp. 1275-1276

Author(s):

Sergei Magonov

Keyword(s):

Atomic Force Microscopy ◽

Phase Contrast ◽

Phase Changes ◽

Phase Imaging ◽

Phase Detection ◽

Contrast Imaging ◽

Force Microscopy ◽

Atomic Force ◽

Resonance Frequencies ◽

Soft Samples

Phase detection in TappingMode™ enhances capabilities of Atomic Force Microscopy (AFM) for soft samples (polymers and biological materials). Changes of amplitude and phase changes of a fast oscillating probe are caused by tip-sample force interactions. Height images reflect the amplitude changes, and in most cases they present a sample topography. Phase images show local differences between phases of free-oscillating probe and of probe interacting with a sample surface. These differences are related to the change of the resonance frequency of the probe either by attractive or repulsive tip-sample forces. Therefore phase detection helps to choose attractive or repulsive force regime for surface imaging and to minimize tip-sample force. For heterogeneous materials the phase imaging allows to distinguish individual components and to visualize their distribution due to differences in phase contrast. This is typically achieved in moderate tapping, when set-point amplitude, Asp, is about half of the amplitude of free-oscillating cantilever, Ao. In contrast, light tapping with Asp close to Ao is best suited for recording a true topography of the topmost surface layer of soft samples. Examples of phase imaging of polymers obtained with a scanning probe microscope Nanoscope® IIIa (Digital Instruments). Si probes (225 μk long, resonance frequencies 150-200 kHz) were used.

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Nanostructure and Optoelectronic Characterization of Small Molecule Bulk Heterojunction Solar Cells by Photoconductive Atomic Force Microscopy

Advanced Functional Materials ◽

10.1002/adfm.201000799 ◽

2010 ◽

Vol 20 (19) ◽

pp. 3314-3321 ◽

Cited By ~ 88

Author(s):

Xuan-Dung Dang ◽

Arnold B. Tamayo ◽

Junghwa Seo ◽

Corey V. Hoven ◽

Bright Walker ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Solar Cells ◽

Small Molecule ◽

Bulk Heterojunction ◽

Heterojunction Solar Cells ◽

Force Microscopy ◽

Bulk Heterojunction Solar Cells ◽

Atomic Force

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Imaging Electron Transport across Grain Boundaries in an Integrated Electron and Atomic Force Microscopy Platform: Application to Polycrystalline Silicon Solar Cells

MRS Proceedings ◽

10.1557/proc-1153-a15-03 ◽

2009 ◽

Vol 1153 ◽

Cited By ~ 4

Author(s):

Manuel J Romero ◽

Fude Liu ◽

Oliver Kunz ◽

Johnson Wong ◽

Chun-Sheng Jiang ◽

...

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Solar Cells ◽

Electron Transport ◽

Grain Boundaries ◽

Polycrystalline Silicon ◽

High Energy ◽

Dominant Factor ◽

Force Microscopy ◽

Atomic Force

AbstractWe have investigated the local electron transport in polycrystalline silicon (pc-Si) thin-films by atomic force microscopy (AFM)-based measurements of the electron-beam-induced current (EBIC). EVA solar cells are produced at UNSW by <i>EVAporation</i> of a-Si and subsequent <i>solid-phase crystallization</i>–a potentially cost-effective approach to the production of pc-Si photovoltaics. A fundamental understanding of the electron transport in these pc-Si thin films is of prime importance to address the factors limiting the efficiency of EVA solar cells. EBIC measurements performed in combination with an AFM integrated inside an electron microscope can resolve the electron transport across individual grain boundaries. AFM-EBIC reveals that most grain boundaries present a high energy barrier to the transport of electrons for both p-type and n-type EVA thin-films. Furthermore, for p-type EVA pc-Si, in contrast with n-type, charged grain boundaries are seen. Recombination at grain boundaries seems to be the dominant factor limiting the efficiency of these pc-Si solar cells.

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