scholarly journals Оптические и фотолюминесцентные свойства тонкопленочной структуры ZnO-ЦТСЛ в ультрафиолетовом и видимом диапазонах спектра

2019 ◽  
Vol 127 (12) ◽  
pp. 986
Author(s):  
Л.В. Григорьев ◽  
Я.Б. Егорова ◽  
Н.А. Быков ◽  
А.А. Семенов ◽  
А.А. Никитин
Keyword(s):  
Thin Film ◽  
Quartz Substrate ◽  
Film Structure ◽  
Ferroelectric Ceramics ◽  
Zinc Oxide Film ◽  
Transmission Spectra ◽  
X Ray Diffraction ◽  
X Ray ◽  
Thin Film Structure ◽  
Spectral Ranges

The results of a study of the structural, optical, and photoluminescent properties of the thin-film structure ZnO/ferroelectric ceramics PLZT are presented. The results of X-ray diffraction analysis of a zinc oxide film synthesized on a PLZT substrate and on a quartz substrate are presented. The transmission spectra, reflection spectra, absorption spectra, and spectral dependence of the photoluminescence of the thin-film structure of ZnO- PLZT and the structure of ZnO-SiO2 in the ultraviolet and visible spectral ranges are presented.

Progress in study of mono- and multilayers and thin film structure by X-ray reflectivity, grazing incidence X-ray diffraction and spectroscopy

2014 ◽  
Vol 83 (12) ◽  
Author(s):  
M A Shcherbina ◽  
S N Chvalun ◽  
Sergey Anatol'evich Ponomarenko ◽  
Mikhail Valentinovich Kovalchuk
Keyword(s):  
Thin Film ◽  
Grazing Incidence ◽  
Film Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
Thin Film Structure

scholarly journals Оптические и фотолюминесцентные свойства тонкой пленки оксида цинка на подложке из тантала лития

2022 ◽  
Vol 130 (2) ◽  
pp. 242
Author(s):  
Л.В. Григорьев ◽  
А.А. Семенов ◽  
А.В. Михайлов
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Spectral Dependence ◽  
Quartz Substrate ◽  
Luminescent Properties ◽  
Zinc Oxide Film ◽  
Transmission Spectra ◽  
X Ray ◽  
Photo Luminescent ◽  
Spectral Ranges

Presents the results of the study of the structural, optical and photo luminescent properties of the thin films ZnO on LiNbO3 substrate. The results of X-ray structural analysis of a zinc oxide film synthesized on a single-crystal LiTaO3 substrate and on a KU-1 quartz substrate are presented. Present the transmission spectra, reflection spectra and the spectral dependence of zinc oxide thin films on substrate LiTaO3 and the structure of ZnO-SiO2 in the ultraviolet and visible spectral ranges.

The Effect of H2 Dilution On Thin Film SiN Deposited by Hot Wire Cvd Using SiH4 and NH3 Gas Mixtures

2001 ◽  
Vol 664 ◽  
Author(s):  
A. C. Dillon ◽  
L. Gedvillas ◽  
D. L. Williamson ◽  
J. Thiesen ◽  
J. D. Perkins ◽  
...  
Keyword(s):  
Thin Film ◽  
Gas Phase ◽  
Chemical Vapor ◽  
Structural Disorder ◽  
Gas Mixtures ◽  
Film Structure ◽  
Hot Wire ◽  
X Ray Diffraction ◽  
X Ray ◽  
N Incorporation

ABSTRACTThe structure of thin film SiN, deposited by the hot wire chemical vapor deposition (HWCVD) technique using SiH4 and NH3 gas mixtures, has been examined as a function of the amount of H2 dilution of the gas mixture. For NH3/SiH4 gas ratios > 0.5/1, all films are a-SiN:H. While H2 dilution does not change the basic film structure, in that the films are amorphous with all dilutions, H2 dilution does increase the efficiency of NH3 dissociation in the gas phase, and causes a further reduction in the already small amount of N-H bonding in a-SiN:H films deposited by HWCVD. For NH3/SiH4 gas ratios typically <0.5/1 and with high H2 dilution, the first deposition of µc-SiN is demonstrated. X-ray diffraction (XRD) measurements demonstrate that the structure of these films consists of silicon crystallites embedded in an a-SiN:H matrix. An upper limit for N incorporation with the preservation of microcrystallinity was found, beyond which the films again became amorphous. The existence of this limit is explained in terms of structural disorder in the a-SiN:H tissue brought about by N incorporation.

FET device performance, morphology and X-ray thin film structure of unsubstituted and modified quinquethiophenes

2004 ◽  
Vol 146 (3) ◽  
pp. 243-250 ◽  
Author(s):  
P. Ostoja ◽  
P. Maccagnani ◽  
M. Gazzano ◽  
M. Cavallini ◽  
J.C. Kengne ◽  
...  
Keyword(s):  
Thin Film ◽  
Film Structure ◽  
Device Performance ◽  
X Ray ◽  
Thin Film Structure

High and Low-Cycle Fatigue Damage Evaluation of Multilayer Thin Film Structure

1991 ◽  
Vol 113 (1) ◽  
pp. 58-62 ◽  
Author(s):  
Yoshiki Oshida ◽  
P. C. Chen
Keyword(s):  
Thin Film ◽  
Dislocation Density ◽  
Strain Amplitude ◽  
Low Cycle Fatigue ◽  
Film Structure ◽  
Applied Strain ◽  
X Ray Diffraction ◽  
Thin Film Structure ◽  
Dislocation Densities ◽  
Number Of Cycles

A five-layered (Cu/Cr/Kapton® /Cr/Cu) metallic thin film structure was subjected to a completely reversed bending fatigue cycling with a wide ranges of applied strain amplitudes from 0.25 percent to about 30 percent. A new model for determination of the number of cycles to fatigue failure NF was proposed for single-crack and multi-crack formations. Within a strain amplitude ranging from 1 to 10 percent, a Manson-Coffin’s relationship was recognized for both the number of cycles to crack initiation NC and NF with exponents of 0.39 and 0.51, respectively. Selected fatigued test samples were further subjected to X-ray diffraction line analysis for dislocation density (ρ) calculation, which was related to the number of fatigue cycles N and strain amplitude (Δ εT) in an empirical formula. It was also found that dislocation densities accumulated up to both Nc and NF were related to applied strain amplitudes. Consequently, if applied strain amplitude is known and progressive change in dislocation density is measured, one can predict the remaining fatigue life as well as fatigue cycles which were already consumed.

scholarly journals Formal preparation of regioregular and alternating thiophene–thiophene copolymers bearing different substituents

2020 ◽  
Vol 16 ◽  
pp. 317-324 ◽  
Author(s):  
Atsunori Mori ◽  
Keisuke Fujita ◽  
Chihiro Kubota ◽  
Toyoko Suzuki ◽  
Kentaro Okano ◽  
...  
Keyword(s):  
Thin Film ◽  
Diffraction Analysis ◽  
Organic Solvents ◽  
Film Structure ◽  
X Ray Diffraction ◽  
Solubility Test ◽  
X Ray ◽  
Alternating Copolymers ◽  
Excellent Yield ◽  
Catalyzed Polymerization

Differently substituted thiophene–thiophene-alternating copolymers were formally synthesized employing a halo-bithiophene as a monomer. Nickel-catalyzed polymerization of bithiophene with substituents at the 3-position, including alkyl-, fluoroalkyl-, or oligosiloxane-containing groups, afforded the corresponding copolymers in good to excellent yield. The solubility test in organic solvents was performed to reveal that several copolymers showed a superior solubility. X-ray diffraction analysis of the thin film of the alternating copolymers composed of methyl and branched oligosiloxane substituents was also performed, and the results suggested the formation of a dual-layered film structure.

scholarly journals Penumbuhan Lapisan Tipis Barium Titanat (BaTiO3) menggunakan Metode Sol-Gel dengan Variasi Mol

2017 ◽  
Vol 2 ◽  
pp. 36
Author(s):  
Ayu Uswatu Lissa Sapta Setyadi ◽  
Yofentina Iriani ◽  
Fahru Nurosyid
Keyword(s):  
Thin Film ◽  
Particle Size ◽  
Spin Coating ◽  
Quartz Substrate ◽  
Sol Gel ◽  
X Ray Diffraction ◽  
X Ray ◽  
Number Of Layers ◽  
Barium Titanate Thin Film

<p class="AbstractEnglish"><strong>Abstra</strong><strong>ct</strong><strong>:</strong><strong> </strong>Preparation of Barium Titanate thin film (BaTiO3) has been done on Quartz substrate using sol gel method with spin coating technique. A thin film BaTiO3 wase made with a mole variation of 0.4 mol and 0.8 mol at a rotation speed of 3000 rpm. The samples were annealed at 400 ° C with 30 minutes stand-up time and at 900 ° C with 2 hours stand-up time and a heating rate of 5 ° C per minute. Characterization of optical properties samples was performed using UV-Vis spectrometers and characterization of microstructure samples using X-Ray Diffraction (XRD). The particle size was calculated by Scherer's formula. Based on the results of the analysis it was found that mole variation of the solution influenced the absorbance value, intensity, crystality level and BaTiO3 thin film particle size. The greater mole of BaTiO<sub>3</sub> solution the higher then absorbance value. The fewer then number of layers the greater then diffraction peak intensity. More number of layers the greater the level of crystallinity and particle size.</p><p class="KeywordsEngish"> </p><p class="AbstrakIndonesia"><strong>Abstra</strong><strong>k: </strong>Pembuatan lapisan tipis Barium Titanat (BaTiO<sub>3</sub>) telah dilakukan  diatas substrat Quartz menggunakan metode sol gel dengan teknik spin coating. Lapisan tipis BaTiO<sub>3 </sub>dibuat dengan variasi mol  0.4 mol dan  0.8 mol pada kecepatan putar 3000 rpm. Sampel diannealing  pada suhu 400<sup>o</sup>C dengan waktu tahan 30 menit  dan pada suhu 900<sup>o</sup>C dengan waktu tahan 2 jam dan kenaikan suhunya 5<sup>o</sup>C per menit. Karakterisasi sifat optik sampel dilakukan  menggunakan spektrometer UV-Vis dan karakterisasi struktrur mikro sampel menggunakan X-Ray Diffraction (XRD).Ukuran partikel dihitung dengan formula Scherer. Berdasarkan hasil analisis didapat bahwa variasi mol larutan mempengaruhi  mempengaruhi nilai absorbansi, intensitas, tingkat kekristalan dan ukuran partikel lapisan tipis BaTiO<sub>3</sub>. Semakin besar mol larutan BaTiO<sub>3 </sub>maka semakin tinggi nilai absorbansinya. Semakin sedikit jumlah lapisan maka intensitas puncak difraksi semakin besar. Semakin banyak jumlah lapisan maka semakin besar pula tingkat kekristalan dan ukuran partikel<em>. </em></p>

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