scholarly journals Оптические и фотолюминесцентные свойства тонкой пленки оксида цинка на подложке из тантала лития

2022 ◽  
Vol 130 (2) ◽  
pp. 242
Author(s):  
Л.В. Григорьев ◽  
А.А. Семенов ◽  
А.В. Михайлов
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Spectral Dependence ◽  
Quartz Substrate ◽  
Luminescent Properties ◽  
Zinc Oxide Film ◽  
Transmission Spectra ◽  
X Ray ◽  
Photo Luminescent ◽  
Spectral Ranges

Presents the results of the study of the structural, optical and photo luminescent properties of the thin films ZnO on LiNbO3 substrate. The results of X-ray structural analysis of a zinc oxide film synthesized on a single-crystal LiTaO3 substrate and on a KU-1 quartz substrate are presented. Present the transmission spectra, reflection spectra and the spectral dependence of zinc oxide thin films on substrate LiTaO3 and the structure of ZnO-SiO2 in the ultraviolet and visible spectral ranges.

scholarly journals Оптические и фотолюминесцентные свойства тонкопленочной структуры ZnO-ЦТСЛ в ультрафиолетовом и видимом диапазонах спектра

2019 ◽  
Vol 127 (12) ◽  
pp. 986
Author(s):  
Л.В. Григорьев ◽  
Я.Б. Егорова ◽  
Н.А. Быков ◽  
А.А. Семенов ◽  
А.А. Никитин
Keyword(s):  
Thin Film ◽  
Quartz Substrate ◽  
Film Structure ◽  
Ferroelectric Ceramics ◽  
Zinc Oxide Film ◽  
Transmission Spectra ◽  
X Ray Diffraction ◽  
X Ray ◽  
Thin Film Structure ◽  
Spectral Ranges

The results of a study of the structural, optical, and photoluminescent properties of the thin-film structure ZnO/ferroelectric ceramics PLZT are presented. The results of X-ray diffraction analysis of a zinc oxide film synthesized on a PLZT substrate and on a quartz substrate are presented. The transmission spectra, reflection spectra, absorption spectra, and spectral dependence of the photoluminescence of the thin-film structure of ZnO- PLZT and the structure of ZnO-SiO2 in the ultraviolet and visible spectral ranges are presented.

Mechanism of Blue Shift of Optical Band Gap in Aluminum-Doped ZnO Thin Films with Blend Bond

2011 ◽  
Vol 685 ◽  
pp. 98-104
Author(s):  
Ling Shen ◽  
Cheng Shen ◽  
Jie Yang ◽  
Fei Xu ◽  
Zhong Quan Ma
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Band Gap ◽  
Optical Band Gap ◽  
Quartz Substrate ◽  
Blue Shift ◽  
X Ray Diffraction ◽  
X Ray ◽  
Atomic Force ◽  
Nano Crystalline

In this paper, aluminum–doped nano-crystalline zinc oxide (ZnO:Al or AZO) thin films were deposited on fused quartz substrate by pulsed laser ablation at various temperatures. The physical phase and surface morphology were characterized by using X-ray diffraction (XRD) and atomic force microscope (AFM), respectively. The variation of the optical band gap (Egopt) of the films with the temperature was measured through transmittance in UV-VIS wavelength. The results showed that there was a blue shift of Egoptfrom 3.44 eV to 3.62 eV as the growing temperature decreased from 500°C to 200°C. The value of Egoptimmediately recurred from 3.30 to 3.35 eV after a thermal annealing of the samples at 700 °C, inclining to a normal value of bulk zinc oxide. The analyses of XRD and AFM testified that the presence of amorphous phase in the AZO films was the main reason for the blue shift of the optical band gap Egopt.

Synthesis of CaWO4:(Eu3+,Tb3+) Thin Films by a Two-Step Method at Room Temperature

2013 ◽  
Vol 710 ◽  
pp. 170-173
Author(s):  
Lian Ping Chen ◽  
Yuan Hong Gao
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Phase Composition ◽  
Room Temperature ◽  
Electrochemical Techniques ◽  
Luminescent Properties ◽  
X Ray Diffraction ◽  
Step Method ◽  
X Ray ◽  
Rare Earth Doped

It is hardly possible to obtain rare earth doped CaWO4thin films directly through electrochemical techniques. A two-step method has been proposed to synthesize CaWO4:(Eu3+,Tb3+) thin films at room temperature. X-ray diffraction, energy dispersive X-ray analysis, spectrophotometer were used to characterize their phase, composition and luminescent properties. Results reveal that (Eu3+,Tb3+)-doped CaWO4films have a tetragonal phase. When the ratio of n (Eu)/n (Tb) in the solution is up to 3:1, CaWO4:(Eu3+,Tb3+) thin film will be enriched with Tb element; on the contrary, when the ratio in the solution is lower than 1:4, CaWO4:(Eu3+,Tb3+) thin film will be enriched with Eu element. Under the excitation of 242 nm, sharp emission peaks at 612, 543, 489 and 589 nm have been observed for CaWO4:(Eu3+,Tb3+) thin films.

Physical Characterization of Zirconium Doped Zinc Oxide Thin Firms Deposited by Spray Pyrolysis

1998 ◽  
Vol 520 ◽  
Author(s):  
A. Maldonado ◽  
D.R. Acosta ◽  
M. De La Luz Olvera ◽  
R. Castanedo ◽  
G. Torres ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Zinc Oxide ◽  
Spray Pyrolysis ◽  
Doping Concentration ◽  
Film Properties ◽  
Preferential Growth ◽  
X Ray ◽  
Substrate Temperatures

ABSTRACTZinc oxide thin films doped with zirconium were prepared from solutions with doping material dispersed at several concentrations and using the spray pyrolysis technique.The films were deposited over sodocalcic glasses at different substrate temperatures. Effects of doping material concentration and substrate temperatures on electrical, optical, structural and morphological film properties are presented. Results show an evolution in morphology and grains size as the doping concentration is increased. Preferential growth in the (002) orientation was detected for each thin film from X ray diffractograms.

Growth of Highly Oriented Zinc Oxide Thin Films by Plasma Enhanced Chemical Vapor Deposition

2006 ◽  
Vol 321-323 ◽  
pp. 1687-1690 ◽  
Author(s):  
Hee Joon Kim ◽  
Dong Young Jang ◽  
Prem Kumar Shishodia ◽  
Akira Yoshida
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Chemical Vapor Deposition ◽  
Vapor Deposition ◽  
Photoelectron Spectroscopy ◽  
Visible Region ◽  
Chemical Vapor ◽  
Zno Films ◽  
X Ray ◽  
Crystalline Films

In the paper, zinc oxide (ZnO) thin films are deposited by plasma enhanced chemical vapor deposition (PECVD) at different substrate temperatures. The ZnO films are characterized by X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS). The analysis results indicate that highly crystalline films with high orientation can be obtained at a substrate temperature of 300 oC with 50 ml/min flow rate from Diethylzinc (DEZ). Furthermore, the investigation of optical property shows that ZnO films are transparent, and the peak transmittance in the visible region is as high as 85%.

Investigation of structural, optical and luminescent properties of sprayed N-doped zinc oxide thin films

2012 ◽  
Vol 97 ◽  
pp. 181-188 ◽  
Author(s):  
S.S. Shinde ◽  
P.S. Shinde ◽  
Y.W. Oh ◽  
D. Haranath ◽  
C.H. Bhosale ◽  
...  
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Luminescent Properties ◽  
Oxide Thin Films ◽  
Optical And Luminescent Properties

scholarly journals Structural and X-Ray Photoelectron Spectroscopy Study of Al-Doped Zinc-Oxide Thin Films

2015 ◽  
Vol 2015 ◽  
pp. 1-5 ◽  
Author(s):  
Bong Ju Lee ◽  
Ho Jun Song ◽  
Jin Jeong
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Flow Rate ◽  
Photoelectron Spectroscopy ◽  
Gas Flow ◽  
Rf Magnetron Sputtering ◽  
Photoelectron Spectra ◽  
Gas Flow Rate ◽  
X Ray ◽  
Oxide Component

Al-doped zinc-oxide (AZO) thin films were prepared by RF magnetron sputtering at different oxygen partial pressures and substrate temperatures. The charge-carrier concentrations in the films decreased from 1.69 × 1021to 6.16 × 1017 cm−3with increased gas flow rate from 7 to 21 sccm. The X-ray diffraction (XRD) patterns show that the (002)/(103) peak-intensity ratio decreased as the gas flow rate increased, which was related to the increase of AZO thin film disorder. X-ray photoelectron spectra (XPS) of the O1s were decomposed into metal oxide component (peak A) and the adsorbed molecular oxygen on thin films (peak B). The area ratio of XPS peaks (A/B) was clearly related to the stoichiometry of AZO films; that is, the higher value of A/B showed the higher stoichiometric properties.

Accuracy and Reproducibility of X-ray Texture Measurements on Thin Films

2002 ◽  
Vol 721 ◽  
Author(s):  
Mark D. Vaudin ◽  
Glen R. Fox ◽  
Glen R. Kowach
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Zinc Oxide ◽  
Full Width ◽  
Half Maximum ◽  
Rocking Curve ◽  
X Ray ◽  
Area Detector ◽  
Geometric Factors ◽  
Pt Films

AbstractRocking curve texture measurements were made on thin films of zinc oxide (ZnO) and platinum (Pt) using a powder x-ray diffractometer, and, in the case of ZnO, an area detector. The intensity corrections for defocussing and other geometric factors were made using a technique and associated software (Texture Plus*) developed at NIST. In both thin film systems, the texture was axisymmetric (fiber) and sharp, with full width at half maximum values of about 2.5°. Care was taken in the Pt case to ensure that the linear range of the x-ray detector was used to measure the intensities; for the ZnO data the degree of detector non-linearity was determined, and corrections were applied where necessary. The suitability of the Pt films for thin film texture standards was studied.

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