Surface roughness is an important factor in many soil moisture retrieval models. Therefore, any mischaracterization of surface roughness parameters (root mean square height, RMSH, and correlation length, ʅ) may result in unreliable predictions and soil moisture estimations. In many environments, but particularly in agricultural settings, surface roughness parameters may show different behaviours with respect to the orientation or azimuth. Consequently, the relationship between SAR polarimetric variables and surface roughness parameters may vary depending on measurement orientation. Generally, roughness obtained for many SAR-based studies is estimated using pin profilers that may, or may not, be collected with careful attention to orientation to the satellite look angle. In this study, we characterized surface roughness parameters in multi-azimuth mode using a terrestrial laser scanner (TLS). We characterized the surface roughness parameters in different orientations and then examined the sensitivity between polarimetric variables and surface roughness parameters; further, we compared these results to roughness profiles obtained using traditional pin profilers. The results showed that the polarimetric variables were more sensitive to the surface roughness parameters at higher incidence angles (θ). Moreover, when surface roughness measurements were conducted at the look angle of RADARSAT-2, more significant correlations were observed between polarimetric variables and surface roughness parameters. Our results also indicated that TLS can represent more reliable results than pin profiler in the measurement of the surface roughness parameters.
Irregular Electrodeposition of Cu-Sn Alloy Coatings in [EMIM]Cl Outside the Glove Box with Large Layer Thickness
