New Methods for Improved Accuracy of Broad Band Free Space Dielectric Measurements

Author(s):  
J.W. Schultz ◽  
R. Geryak ◽  
J.G. Maloney
Author(s):  
GERSHON ELBER ◽  
ELAINE COHEN

Most offset approximation algorithms for freeform curves and surfaces may be classified into two main groups. The first approximates the curve using simple primitives such as piecewise arcs and lines and then calculates the (exact) offset operator to this approximation. The second offsets the control polygon/mesh and then attempts to estimate the error of the approximated offset over a region. Most of the current offset algorithms estimate the error using a finite set of samples taken from the region and therefore can not guarantee the offset approximation is within a given tolerance over the whole curve or surface. This paper presents new methods to globally bound the error of the approximated offset of freeform curves and surfaces and then automatically derive new approximations with improved accuracy. These tools can also be used to develop a global error bound for a variable distance offset operation and to detect and trim out loops in the offset.


2007 ◽  
Author(s):  
O. V. Belai ◽  
L. L. Frumin ◽  
E. V. Podivilov ◽  
O. Ya. Schwarz ◽  
D. A. Shapiro

2011 ◽  
Vol 09 (05) ◽  
pp. 631-645 ◽  
Author(s):  
WENLONG TANG ◽  
HONGBAO CAO ◽  
JUNBO DUAN ◽  
YU-PING WANG

With the development of genomic techniques, the demand for new methods that can handle high-throughput genome-wide data effectively is becoming stronger than ever before. Compressed sensing (CS) is an emerging approach in statistics and signal processing. With the CS theory, a signal can be uniquely reconstructed or approximated from its sparse representations, which can therefore better distinguish different types of signals. However, the application of CS approach to genome-wide data analysis has been rarely investigated. We propose a novel CS-based approach for genomic data classification and test its performance in the subtyping of leukemia through gene expression analysis. The detection of subtypes of cancers such as leukemia according to different genetic markups is significant, which holds promise for the individualization of therapies and improvement of treatments. In our work, four statistical features were employed to select significant genes for the classification. With our selected genes out of 7,129 ones, the proposed CS method achieved a classification accuracy of 97.4% when evaluated with the cross validation and 94.3% when evaluated with another independent data set. The robustness of the method to noise was also tested, giving good performance. Therefore, this work demonstrates that the CS method can effectively detect subtypes of leukemia, implying improved accuracy of diagnosis of leukemia.


1999 ◽  
Vol 08 (01) ◽  
pp. 89-105 ◽  
Author(s):  
P. Y. HAN ◽  
G. C. CHO ◽  
X.-C. ZHANG

We present in this article the recent development of the measurement technique for coherent free-space THz field and applications in the mid-infrared range. The technique is based on the second-order nonlinear optical interaction both for the generation and for the detection of THz pulse. Particularly the detection process based on free-space electro-optic sampling gives us a possibility to timely trace directly the ultrabroad band coherent THz field unparalleled by other technique. Using an ultrashort laser pulse our measurement system is feasible to measure the ultrashort THz pulse with a bandwidth up to 40 THz. We present a detailed comparative study on the generation and detection using different nonlinear material. We demonstrate applications of the coherent THz technique for time-resolved semiconductor spectroscopy, time-domain imaging with high spatial resolution and broad band refractive and absorptive characterization of material in the mid-infrared range.


2013 ◽  
Vol 62 (7) ◽  
pp. 1982-1989 ◽  
Author(s):  
Christian Orlob ◽  
Tobias Reinecke ◽  
Eckhard Denicke ◽  
Bernd Geck ◽  
Ilona Rolfes

1996 ◽  
Vol 430 ◽  
Author(s):  
Doug Rytting

AbstractThe electronics market is constantly pushing the state of the art in design to reduce cost, size, weight, and power consumption. New designs are emerging causing rapid changes in technology driving high design turnover. This drives the need for component and material measurements that will reduced design cycles and time to market. In the design and measurement of linear devices, error corrected S-parameters are traditionally measured with a network analyzer. the network analyzer combines magnitude with phase measurements for improved accuracy. Time domain techniques are used to get a better physical understanding of the device characteristics. Error correction procedures have been improved to provide high accuracy and ease of use. New methods to measure impedance results in high precision capacitor and inductor models necessary for both surface mount and integrated circuit applications. Note: In the following paper the relevant text follows each slide.


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