Characterization of novel spacecraft materials under high energy electron and atomic oxygen exposure
Keyword(s):
1994 ◽
Vol 137
(1-2)
◽
pp. 187-194
◽
Keyword(s):
Reflection high-energy electron diffraction (RHEED) for in situ characterization of thin film growth
2011 ◽
pp. 3-28
◽
Keyword(s):
2011 ◽
Vol 205
(21-22)
◽
pp. 5130-5134
◽
Keyword(s):
2010 ◽
Vol 114
(47)
◽
pp. 20062-20067
◽
Keyword(s):
Keyword(s):
Keyword(s):