DiPoly (Diffraction analysis of Polymers) - программное обеспечение для диагностики биополимеров по порошковым дифракционным данным

Analysis of light optical diffraction patterns produced by electron micrographs can easily lead to much nonsense. Such diffraction patterns are referred to as optical transforms and are compared with transforms produced by a variety of mathematical manipulations. In the use of light optical diffraction patterns to study periodicities in macromolecular ultrastructures, a number of potential pitfalls have been rediscovered. The limitations apply to the formation of the electron micrograph as well as its analysis.(1) The high resolution electron micrograph is itself a complex diffraction pattern resulting from the specimen, its stain, and its supporting substrate. Cowley and Moodie (Proc. Phys. Soc. B, LXX 497, 1957) demonstrated changing image patterns with changes in focus. Similar defocus images have been subjected to further light optical diffraction analysis.

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Electron Diffraction Analysis of Microtwin Structures in Regrown (III) Silicon

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100054765 ◽

1982 ◽

Vol 40 ◽

pp. 460-461

Author(s):

P. Ling ◽

R. Gronsky ◽

J. Washburn

Keyword(s):

Electron Diffraction ◽

Ion Implantation ◽

Diffraction Analysis ◽

Diffraction Pattern ◽

Direct Consequence ◽

The Other ◽

Electron Diffraction Analysis ◽

Defect Microstructures ◽

Ion Implanted

The defect microstructures of Si arising from ion implantation and subsequent regrowth for a (111) substrate have been found to be dominated by microtwins. Figure 1(a) is a typical diffraction pattern of annealed ion-implanted (111) Si showing two groups of extra diffraction spots; one at positions (m, n integers), the other at adjacent positions between <000> and <220>. The object of the present paper is to show that these extra reflections are a direct consequence of the microtwins in the material.

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Computers and diffraction analysis

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100152197 ◽

1989 ◽

Vol 47 ◽

pp. 44-45

Author(s):

J. A. Eades

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Electron Diffraction ◽

Diffraction Analysis ◽

Electron Diffraction Analysis ◽

Image Simulation ◽

Correct Interpretation ◽

High Profile ◽

High Resolution Images ◽

Image Simulations

For well over two decades computers have played an important role in electron microscopy; they now pervade the whole field - as indeed they do in so many other aspects of our lives. The initial use of computers was mainly for large (as it seemed then) off-line calculations for image simulations; for example, of dislocation images.Image simulation has continued to be one of the most notable uses of computers particularly since it is essential to the correct interpretation of high resolution images. In microanalysis, too, the computer has had a rather high profile. In this case because it has been a necessary part of the equipment delivered by manufacturers. By contrast the use of computers for electron diffraction analysis has been slow to prominence. This is not to say that there has been no activity, quite the contrary; however it has not had such a great impact on the field.

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Diffraction analysis of the lithium battery cathode material Li1.2Mn0.4Ni0.3Co0.1O2

Zeitschrift für Kristallographie ◽

10.1524/zkri.2007.2007.suppl_26.483 ◽

2007 ◽

Vol 2007 (suppl_26) ◽

pp. 483-488

Author(s):

P. S. Whitfield ◽

I. J. Davidson ◽

P. W. Stephens ◽

L. M. D. Cranswick ◽

I. P. Swainson

Keyword(s):

Cathode Material ◽

Diffraction Analysis ◽

Lithium Battery

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DIFFRACTION ANALYSIS OF DEFORMED METALS: Theory, Methods, Programs

10.31519/monography_1598 ◽

2019 ◽

Author(s):

Faina Satdarova

Keyword(s):

Experimental Design ◽

Dislocation Density ◽

Mathematical Models ◽

Diffraction Analysis ◽

Experimental Research ◽

Russian Federation ◽

Statistical Estimation ◽

X Rays ◽

National University ◽

The Russian Federation

General analysis of the distribution of crystals orientation and dislocation density in the polycrystalline system is presented. Recovered information in diffraction of X-rays adopting is new to structure states of polycrystal. Shear phase transformations in metals — at the macroscopic and microscopic levels — become a clear process. Visualizing the advances is produced by program included in package delivered. Mathematical models developing, experimental design, optimal statistical estimation, simulation the system under study and evolution process on loading serves as instrumentation. To reduce advanced methods to research and studies problem-oriented software will promote when installed. Automation programs passed a testing in the National University of Science and Technology “MISIS” (The Russian Federation, Moscow). You score an advantage in theoretical and experimental research in the field of physics of metals.

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