Geodetic support for an absolute calibration experiment of a high-precision radio altimeter

2021 ◽  
Vol 65 (5) ◽  
pp. 505-516
Author(s):  
Langeman I.P. ◽  
◽  
Kupriyanov A.O. ◽  
Morozov D.A. ◽  
Kuznetsov D.A. ◽  
...  
Keyword(s):  
High Precision ◽  
Absolute Calibration ◽  
Calibration Experiment

Представлено геодезическое обеспечение экспериментального исследования по выполнению калибровки высокоточного радиовысотомера. Рассмотрены организационные и методические аспекты исследования, конструкция водомерного буя. Приводятся результаты вычислений высоты морской топографической поверхности и поправки за поперечный уклон геоида.

scholarly journals Ibiza Absolute Calibration Experiment: Survey and Preliminary Results

2004 ◽  
Vol 27 (3-4) ◽  
pp. 657-681 ◽  
Author(s):  
J. J. MARTINEZ-BENJAMIN ◽  
M. MARTINEZ-GARCIA ◽  
S. GONZALEZ LOPEZ ◽  
A. NUÑEZ ANDRES ◽  
F. BUILL POZUELO ◽  
...  
Keyword(s):  
Absolute Calibration ◽  
Preliminary Results ◽  
Calibration Experiment

Absolute calibration of a soft X-ray spectrograph for X-ray laser research using white beam

1998 ◽  
Vol 5 (3) ◽  
pp. 756-758 ◽  
Author(s):  
C. Fujikawa ◽  
T. Kawachi ◽  
K. Ando ◽  
N. Yamaguchi ◽  
T. Hara
Keyword(s):  
Synchrotron Radiation ◽  
Grazing Incidence ◽  
Absolute Calibration ◽  
Absolute Sensitivity ◽  
X Ray ◽  
White Beam ◽  
Wavelength Standard ◽  
Calibration Experiment ◽  
Ccd Detector ◽  
Flat Field

Absolute calibration of a soft X-ray spectrograph has been performed using a white beam of synchrotron radiation. The calibrated spectrograph was a flat-field grazing-incidence spectrograph with an X-ray CCD detector for X-ray laser research. Absolute sensitivity of the spectrograph system can be obtained from transmitted spectra using filters made of several different materials, each providing an absorption-edge wavelength standard. The absolute sensitivity determined in this work shows nearly the same behaviour with wavelength as that in another calibration experiment using a laser-produced plasma as an X-ray source.

scholarly journals A detector interferometric calibration experiment for high precision astrometry

2016 ◽  
Vol 595 ◽  
pp. A108 ◽  
Author(s):  
A. Crouzier ◽  
F. Malbet ◽  
F. Henault ◽  
A. Léger ◽  
C. Cara ◽  
...  
Keyword(s):  
High Precision ◽  
Calibration Experiment ◽  
Precision Astrometry

scholarly journals The absolute calibration of high-precision optical flats across a wide range of spatial frequencies

2015 ◽  
Vol 584 ◽  
pp. 012020 ◽  
Author(s):  
Yana V Gladysheva ◽  
Ilya V Zhivotovsky ◽  
Dmitry G Denisov ◽  
Nikolay V Baryshnikov ◽  
Valery E Karasik ◽  
...  
Keyword(s):  
High Precision ◽  
Absolute Calibration ◽  
Spatial Frequencies ◽  
Wide Range ◽  
The Absolute

Automatic measurement of SAED patterns from asbestos minerals

1988 ◽  
Vol 46 ◽  
pp. 846-847
Author(s):  
J. C. Russ ◽  
T. Taguchi ◽  
P. M. Peters ◽  
E. Chatfield ◽  
J. C. Russ ◽  
...  
Keyword(s):  
Diffraction Pattern ◽  
High Precision ◽  
Diffraction Data ◽  
Automatic Measurement ◽  
Automatic Method ◽  
Important Method ◽  
X Ray ◽  
Integrated Intensity ◽  
Asbestiform Minerals ◽  
True Center

Conventional SAD patterns as obtained in the TEM present difficulties for identification of materials such as asbestiform minerals, although diffraction data is considered to be an important method for making this purpose. The preferred orientation of the fibers and the spotty patterns that are obtained do not readily lend themselves to measurement of the integrated intensity values for each d-spacing, and even the d-spacings may be hard to determine precisely because the true center location for the broken rings requires estimation. We have implemented an automatic method for diffraction pattern measurement to overcome these problems. It automatically locates the center of patterns with high precision, measures the radius of each ring of spots in the pattern, and integrates the density of spots in that ring. The resulting spectrum of intensity vs. radius is then used just as a conventional X-ray diffractometer scan would be, to locate peaks and produce a list of d,I values suitable for search/match comparison to known or expected phases.

On effects of non-systematic reflections on weak-beam images of partial dislocations

1991 ◽  
Vol 49 ◽  
pp. 688-689
Author(s):  
K. Z. Botros ◽  
S. S. Sheinin
Keyword(s):  
High Precision ◽  
Stacking Fault ◽  
Important Application ◽  
Stacking Fault Energy ◽  
Sharp Peak ◽  
Weak Beam ◽  
Partial Dislocations ◽  
Deviation Parameter ◽  
Beam Diffraction

The main features of weak beam images of dislocations were first described by Cockayne et al. using calculations of intensity profiles based on the kinematical and two beam dynamical theories. The feature of weak beam images which is of particular interest in this investigation is that intensity profiles exhibit a sharp peak located at a position very close to the position of the dislocation in the crystal. This property of weak beam images of dislocations has an important application in the determination of stacking fault energy of crystals. This can easily be done since the separation of the partial dislocations bounding a stacking fault ribbon can be measured with high precision, assuming of course that the weak beam relationship between the positions of the image and the dislocation is valid. In order to carry out measurements such as these in practice the specimen must be tilted to "good" weak beam diffraction conditions, which implies utilizing high values of the deviation parameter Sg.

Digital differential hysteresis iimage processing displays what the microscope acquires but the eye can't see

1995 ◽  
Vol 53 ◽  
pp. 642-643
Author(s):  
Klaus-Ruediger Peters
Keyword(s):  
Image Processing ◽  
Visual System ◽  
High Precision ◽  
Image Data ◽  
Processing Technology ◽  
Output Data ◽  
Contrast Resolution ◽  
Pixel Intensity ◽  
Data Reading ◽  
Hysteresis Properties

Differential hysteresis processing is a new image processing technology that provides a tool for the display of image data information at any level of differential contrast resolution. This includes the maximum contrast resolution of the acquisition system which may be 1,000-times higher than that of the visual system (16 bit versus 6 bit). All microscopes acquire high precision contrasts at a level of <0.01-25% of the acquisition range in 16-bit - 8-bit data, but these contrasts are mostly invisible or only partially visible even in conventionally enhanced images. The processing principle of the differential hysteresis tool is based on hysteresis properties of intensity variations within an image.Differential hysteresis image processing moves a cursor of selected intensity range (hysteresis range) along lines through the image data reading each successive pixel intensity. The midpoint of the cursor provides the output data. If the intensity value of the following pixel falls outside of the actual cursor endpoint values, then the cursor follows the data either with its top or with its bottom, but if the pixels' intensity value falls within the cursor range, then the cursor maintains its intensity value.

High precision measurement of the SOS surface thickness in the rough phase

1991 ◽  
Vol 1 (12) ◽  
pp. 1669-1673 ◽  
Author(s):  
Hans Gerd Evertz ◽  
Martin Hasenbusch ◽  
Mihail Marcu ◽  
Klaus Pinn ◽  
Sorin Solomon
Keyword(s):  
High Precision ◽  
Precision Measurement ◽  
High Precision Measurement ◽  
Surface Thickness
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