scholarly journals Microstructure and Properties of Ag-Doped ZnO Grown Hydrothermally on a Graphene-Coated Polyethylene Terephthalate Bilayer Flexible Substrate

2021 ◽  
Vol 9 ◽  
Author(s):  
Taotao Ai ◽  
Yuanyuan Fan ◽  
Huhu Wang ◽  
Xiangyu Zou ◽  
Weiwei Bao ◽  
...  
Keyword(s):  
Thin Film ◽  
Phase Composition ◽  
Electrical Properties ◽  
Flexible Substrate ◽  
Zno Nanorods ◽  
Synthesis Method ◽  
Zno Films ◽  
Zno Thin Film ◽  
Ion Sputtering ◽  
Doped Zno

Ag-doped ZnO nanorods growth on a PET-graphene substrate (Ag-ZnO/PET-GR) with different Ag-doped content were synthesized by low-temperature ion-sputtering-assisted hydrothermal synthesis method. The phase composition, morphologies of ZnO, and electrical properties were analyzed. Ag-doping affects the initially perpendicular growth of ZnO nanorods, resulting in oblique growth of ZnO nanorods becoming more obvious as the Ag-doped content increases, and the diameter of the nanorods decreasing gradually. The width of the forbidden band gap of the ZnO films decreases with increasing Ag-doped content. For the Ag-ZnO/PET-GR composite structure, the Ag-ZnO thin film with 5% Ag-doped content has the largest carrier concentration (8.1 × 1018 cm−3), the highest mobility (67 cm2 · V−1 · s−1), a small resistivity (0.09 Ω·cm), and impressive electrical properties.

Optical Properties of Al Doped Zinc Oxide Nanorods Thin Film Deposited by Immersion Technique

2013 ◽  
Vol 667 ◽  
pp. 388-392
Author(s):  
S.Z. Muhamed ◽  
Mohamad Hafiz Mamat ◽  
Mohamad Rusop
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Electrical Properties ◽  
Surface Morphology ◽  
Immersion Time ◽  
Zno Nanorods ◽  
Zinc Oxide Nanorods ◽  
Oxide Nanorods ◽  
Immersion Technique ◽  
Doped Zno

We investigated the effect of immersion time on optical, electrical properties and surface morphology of nanostructured Aluminium (Al) doped Zinc Oxide (ZnO) thin films prepared by immersion technique. UV-Vis-NIR spectra indicate that the transmittance of the samples decrease with immersion time. Electrical properties study reveals the nanostructured Al doped ZnO thin film at 1 hr shows the lowest resistivity compared to other samples. Surface morphology results as characterized by scanning electron microscope (SEM) show that the Al doped ZnO nanorods quantity increased with immersion time.

Tunable Electrical Properties in High-Valent Transition-Metal-Doped ZnO Thin-Film Transistors

2014 ◽  
Vol 35 (7) ◽  
pp. 759-761 ◽  
Author(s):  
Lei Xu ◽  
Zhe Li ◽  
Xingqiang Liu ◽  
Jingli Wang ◽  
Xiangheng Xiao ◽  
...  
Keyword(s):  
Thin Film ◽  
Electrical Properties ◽  
Transition Metal ◽  
Thin Film Transistors ◽  
Zno Thin Film ◽  
Doped Zno ◽  
High Valent ◽  
Metal Doped

Electrical Properties in Group IV Elements-Doped ZnO Thin-Film Transistors

2015 ◽  
Vol 11 (8) ◽  
pp. 670-673 ◽  
Author(s):  
Zhe Li ◽  
Lei Xu ◽  
Ablat Abliz ◽  
Yang Hua ◽  
Jinchai Li ◽  
...  
Keyword(s):  
Thin Film ◽  
Electrical Properties ◽  
Thin Film Transistors ◽  
Group Iv ◽  
Zno Thin Film ◽  
Doped Zno ◽  
Group Iv Elements

scholarly journals STUDYING THE TRANSPARENT AND ELECTRICAL PROPERTIES OF ZnO:Ti THIN FILM WHICH IS PREPARED BY DC MAGNETRON SPUTTERINGSPUTTERING

2009 ◽  
Vol 12 (12) ◽  
pp. 59-64
Author(s):  
Binh Van Ho ◽  
Hung Vu Tuan Le ◽  
Nhien Thi Ngoc Nguyen ◽  
Dat Thanh Huynh ◽  
Phuong Ai Duong ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Electrical Resistivity ◽  
Electrical Properties ◽  
Zno Films ◽  
Dc Magnetron Sputtering ◽  
Glass Substrates ◽  
Conductive Oxide ◽  
Doped Zno ◽  
Ceramic Targets

The Ti-doped Zno films were deposited onto glass substrates from ceramic targets ZnO with various Ti concentrations using a DC magnetron sputtering. The experimental results show that all thin films are transparent and conductive oxide films, with the appropriate Ti concentration (⁓1.5% Ti), the conductance of films can be improved. Optical characteristics of thin films was determined by UV-V is spectroscopy. The thickness of thin films was measured by Stylus method. The electrical resistivity was measured by four-point probe, and the roughness of films was determined by AFM.

Sign in / Sign up

Export Citation Format

Share Document