scholarly journals Biological Applications of Short Wavelength Microscopy Based on Compact, Laser-Produced Gas-Puff Plasma Source

2020 ◽  
Vol 10 (23) ◽  
pp. 8338
Author(s):  
Alfio Torrisi ◽  
Przemysław W. Wachulak ◽  
Andrzej Bartnik ◽  
Łukasz Węgrzyński ◽  
Tomasz Fok ◽  
...  
Keyword(s):  
Spatial Resolution ◽  
Extreme Ultraviolet ◽  
Plasma Source ◽  
Short Exposure ◽  
Biological Applications ◽  
Short Exposure Time ◽  
Full Field ◽  
X Ray ◽  
Water Window ◽  
Imaging Results

Over the last decades, remarkable efforts have been made to improve the resolution in photon-based microscopes. The employment of compact sources based on table-top laser-produced soft X-ray (SXR) in the “water window” spectral range (λ = 2.3–4.4 nm) and extreme ultraviolet (EUV) plasma allowed to overcome the limitations imposed by large facilities, such as synchrotrons and X-ray free electron lasers (XFEL), because of their high complexity, costs, and limited user access. A laser-plasma double stream gas-puff target source represents a powerful tool for microscopy operating in transmission mode, significantly improving the spatial resolution into the nanometric scale, comparing to the traditional visible light (optical) microscopes. Such an approach allows generating the plasma efficiently, without debris, providing a high flux of EUV and SXR photons. In this review, we present the development and optimization of desktop imaging systems: a EUV and an SXR full field microscope, allowing to achieve a sub-50 nm spatial resolution with short exposure time and an SXR contact microscope, capable to resolve internal structures in a thin layer of sensitive photoresist. Details about the source, as well as imaging results for biological applications, will be presented and discussed.

scholarly journals Table-Top Water-Window Microscope Using a Capillary Discharge Plasma Source with Spatial Resolution 75 nm

2020 ◽  
Vol 10 (18) ◽  
pp. 6373
Author(s):  
Tomáš Parkman ◽  
Michal Nevrkla ◽  
Alexandr Jančárek ◽  
Jana Turňová ◽  
Dalibor Pánek ◽  
...  
Keyword(s):  
Spatial Resolution ◽  
Large Scale ◽  
Fresnel Zone ◽  
Ccd Camera ◽  
Plasma Source ◽  
Capillary Discharge ◽  
Sample Plane ◽  
X Ray ◽  
Water Window ◽  
Imaging Results

We present a design of a compact transmission water-window microscope based on the Z-pinching capillary discharge nitrogen plasma source. The microscope operates at wavelength of 2.88 nm (430 eV), and with its table-top dimensions provides an alternative to large-scale soft X-ray (SXR) microscope systems based on synchrotrons and free-electron lasers. The emitted soft X-ray radiation is filtered by a titanium foil and focused by an ellipsoidal condenser mirror into the sample plane. A Fresnel zone plate was used to create a transmission image of the sample onto a charge-coupled device (CCD) camera. To assess the resolution of the microscope, we imaged a standard sample-copper mesh. The spatial resolution of the microscope is 75 nm at half-pitch, calculated via a 10–90% intensity knife-edge test. The applicability of the microscope is demonstrated by the imaging of green algae-Desmodesmus communis. This paper describes the principle of capillary discharge source, design of the microscope, and experimental imaging results of Cu mesh and biological sample.

scholarly journals Nanoimaging using soft X-ray and EUV laser-plasma sources

2018 ◽  
Vol 167 ◽  
pp. 03001 ◽  
Author(s):  
Przemyslaw Wachulak ◽  
Alfio Torrisi ◽  
Mesfin Ayele ◽  
Andrzej Bartnik ◽  
Joanna Czwartos ◽  
...  
Keyword(s):  
Laser Plasma ◽  
Material Science ◽  
Imaging Systems ◽  
Fibroblast Cells ◽  
Plasma Sources ◽  
Full Field ◽  
X Ray ◽  
Water Window ◽  
Imaging Results ◽  
New Research

In this work we present three experimental, compact desk-top imaging systems: SXR and EUV full field microscopes and the SXR contact microscope. The systems are based on laser-plasma EUV and SXR sources based on a double stream gas puff target. The EUV and SXR full field microscopes, operating at 13.8 nm and 2.88 nm wavelengths are capable of imaging nanostructures with a sub-50 nm spatial resolution and short (seconds) exposure times. The SXR contact microscope operates in the “water-window” spectral range and produces an imprint of the internal structure of the imaged sample in a thin layer of SXR sensitive photoresist. Applications of such desk-top EUV and SXR microscopes, mostly for biological samples (CT26 fibroblast cells and Keratinocytes) are also presented. Details about the sources, the microscopes as well as the imaging results for various objects will be presented and discussed. The development of such compact imaging systems may be important to the new research related to biological, material science and nanotechnology applications.

Aspects of nanometer scale imaging with extreme ultraviolet (EUV) laboratory sources

2012 ◽  
Vol 20 (1) ◽  
pp. 1-14 ◽  
Author(s):  
P. Wachulak ◽  
M. Marconi ◽  
A. Isoyan ◽  
L. Urbanski ◽  
A. Bartnik ◽  
...  
Keyword(s):  
Spatial Resolution ◽  
Extreme Ultraviolet ◽  
Fresnel Zone ◽  
Imaging Techniques ◽  
Imaging Systems ◽  
Short Exposure ◽  
Short Exposure Time ◽  
Euv Lithography ◽  
Mask Inspection ◽  
2D And 3D

AbstractImaging systems with nanometer resolution are instrumental to the development of the fast evolving field of nanoscience and nanotechnology. Decreasing the wavelength of illumination is a direct way to improve the spatial resolution in photon-based imaging systems and motivated a strong interest in short wavelength imaging techniques in the extreme ultraviolet (EUV) region. In this review paper, various EUV imaging techniques, such as 2D and 3D holography, EUV microscopy using Fresnel zone plates, EUV reconstruction of computer generated hologram (CGH) and generalized Talbot self-imaging will be presented utilizing both coherent and incoherent compact laboratory EUV sources. Some of the results lead to the imaging with spatial resolution reaching 50 nm in a very short exposure time. These techniques can be used in a variety of applications from actinic mask inspection in the EUV lithography, biological imaging to mask-less lithographic processes in nanofabrication.

A Compact “Water Window” Microscope with 60 nm Spatial Resolution for Applications in Biology and Nanotechnology

2015 ◽  
Vol 21 (5) ◽  
pp. 1214-1223 ◽  
Author(s):  
Przemyslaw Wachulak ◽  
Alfio Torrisi ◽  
Muhammad F. Nawaz ◽  
Andrzej Bartnik ◽  
Daniel Adjei ◽  
...  
Keyword(s):  
Spatial Resolution ◽  
Exposure Time ◽  
Imaging System ◽  
Optical Systems ◽  
Radiation Absorption ◽  
Short Exposure ◽  
Nanometer Scale ◽  
Short Exposure Time ◽  
Water Window ◽  
Stage Of Development

AbstractShort illumination wavelength allows an extension of the diffraction limit toward nanometer scale; thus, improving spatial resolution in optical systems. Soft X-ray (SXR) radiation, from “water window” spectral range, λ=2.3–4.4 nm wavelength, which is particularly suitable for biological imaging due to natural optical contrast provides better spatial resolution than one obtained with visible light microscopes. The high contrast in the “water window” is obtained because of selective radiation absorption by carbon and water, which are constituents of the biological samples. The development of SXR microscopes permits the visualization of features on the nanometer scale, but often with a tradeoff, which can be seen between the exposure time and the size and complexity of the microscopes. Thus, herein, we present a desk-top system, which overcomes the already mentioned limitations and is capable of resolving 60 nm features with very short exposure time. Even though the system is in its initial stage of development, we present different applications of the system for biology and nanotechnology. Construction of the microscope with recently acquired images of various samples will be presented and discussed. Such a high resolution imaging system represents an interesting solution for biomedical, material science, and nanotechnology applications.

Carbon nanotube pellicles: imaging results of the first full-field extreme ultraviolet exposures

2021 ◽  
Vol 20 (02) ◽  
Author(s):  
Joost Bekaert ◽  
Emily Gallagher ◽  
Rik Jonckheere ◽  
Lieve Van Look ◽  
Remko Aubert ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Extreme Ultraviolet ◽  
Full Field ◽  
Imaging Results

High spatial resolution full-field microscopy using a desktop-size soft x-ray laser

2007 ◽  
Author(s):  
Courtney A. Brewer ◽  
Fernando Brizuela ◽  
Dale Martz ◽  
Georgiy Vaschenko ◽  
Mario C. Marconi ◽  
...  
Keyword(s):  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Full Field ◽  
X Ray

Short Exposure Time Characteristics Of X-Ray Generators

1983 ◽  
Author(s):  
Bruce A. Horn ◽  
Kim C. Luk ◽  
David M. Thomasson ◽  
Charles E. Finney
Keyword(s):  
Exposure Time ◽  
Short Exposure ◽  
Short Exposure Time ◽  
X Ray

X-Ray Analysis of Stress in a Localized Area by Use of Imaging Plate

1991 ◽  
Vol 35 (A) ◽  
pp. 537-543 ◽  
Author(s):  
Yasuo Yoshioka ◽  
Shin'ichi Ohya
Keyword(s):  
Short Exposure ◽  
Imaging Plate ◽  
Image Analyzer ◽  
Single Exposure ◽  
Short Exposure Time ◽  
X Ray ◽  
Area Detector ◽  
Lattice Strains ◽  
Exposure Method

AbstractFor determination of stress in a localized area, we combined a modified single exposure technique and the imaging plate, which is an x-ray digital area detector. With the, single exposure method, stress value is obtained from lattice strains in two directions with a single incident x-ray beam directed at an oblique angle. However, since diffraction data around a whole Debye-Scherrer ring was used in this study, a stress value can be accurately determined in comparison with the single exposure method. We observed the DS ring by use of the imaging plate with requiring only a short exposure time. Lattice strains in many directions on a DS ring were measured by an image analyzer connected to a computer; we verified the effectiveness of this method.

scholarly journals HiSPoD: a program for high-speed polychromatic X-ray diffraction experiments and data analysis on polycrystalline samples

2016 ◽  
Vol 23 (4) ◽  
pp. 1046-1053 ◽  
Author(s):  
Tao Sun ◽  
Kamel Fezzaa
Keyword(s):  
Diffraction Data ◽  
High Speed ◽  
Short Pulse ◽  
Frame Rate ◽  
Short Exposure ◽  
X Rays ◽  
X Ray Diffraction ◽  
Short Exposure Time ◽  
X Ray ◽  
Structure Information

A high-speed X-ray diffraction technique was recently developed at the 32-ID-B beamline of the Advanced Photon Source for studying highly dynamic, yet non-repeatable and irreversible, materials processes. In experiments, the microstructure evolution in a single material event is probed by recording a series of diffraction patterns with extremely short exposure time and high frame rate. Owing to the limited flux in a short pulse and the polychromatic nature of the incident X-rays, analysis of the diffraction data is challenging. Here,HiSPoD, a stand-alone Matlab-based software for analyzing the polychromatic X-ray diffraction data from polycrystalline samples, is described. WithHiSPoD, researchers are able to perform diffraction peak indexing, extraction of one-dimensional intensity profiles by integrating a two-dimensional diffraction pattern, and, more importantly, quantitative numerical simulations to obtain precise sample structure information.

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