Extraction of High Quality RNA from Cannabis sativa Bast Fibres: A Vademecum for Molecular Biologists

Hemp growing is becoming a promising direction for the development of agriculture in Russia in the coming years due to the tasks of import substitution of cotton for domestic fiber from hemp and flax. The most important technological process in the cultivation of seeded hemp is its harvesting, which requires the use of specialized equipment and equipment due to the peculiarities of the structure of the stem and the significant height of the crops. The purpose of this work is to study the issue of technical equipment of domestic hemp growing and to find modern machines and technical solutions for hemp harvesting. Cannabis sativa L. is cultivated for seeds, fiber, and two-way use. Hence, various technologies are used for its harvesting. In our country, hemp harvesting equipment has not been produced for a long time; classic combines and general-purpose machines are used for harvesting crops. The technique used in hemp growing farms in Russia is considered. Combine harvesters such as PALESSE – GS12, ACROS – 585/595, Don – 1500B, etc., are adapted to collect hemp seeds; the flow of the process and high-quality threshing are ensured. However, an uncut stem with a height of 1.2 meters remains in the field. For harvesting crops for fiber (‘zelenets’), innovative machines have been developed based on domestic forage harvesters Don – 680M and RSMF – 2450 with a set of conversions for hemp. Field tests of prototypes have shown a positive result. Harvesters completely cut the stems, chop them into 50 cm lengths and put them in a swath, but do not comb them from green leaves and inflorescences. Based on the results of the work, a scheme of an innovative universal hemp harvester was proposed for harvesting sowing hemp in all directions of cultivation. Its application will fully mechanize the process of sowing hemp harvesting, collecting seeds and stems and obtaining high-quality hemp raw materials.

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An Overview of Galenic Preparation Methods for Medicinal Cannabis

Current Bioactive Compounds ◽

10.2174/1573407214666180612080412 ◽

2019 ◽

Vol 15 (2) ◽

pp. 174-195 ◽

Cited By ~ 3

Author(s):

Luigi Romano ◽

Arno Hazekamp

Keyword(s):

The Netherlands ◽

Cannabis Sativa ◽

Therapeutic Potential ◽

Basic Knowledge ◽

High Quality ◽

Preparation Methods ◽

Us States ◽

The World ◽

Medicinal Cannabis

In recent years, the Cannabis plant (Cannabis sativa L.) has been rediscovered as a source of new medicines around the world. Despite the fact that a number of registered medicines have been developed on the basis of purified cannabis components, there is a rapid increasing acceptance and use of cannabis in its herbal form. Licensed producers of high quality cannabis plants now operate in various countries including The Netherlands, Canada, Israel, and Australia, and in many US states. The legal availability of cannabis flowers allows to prescribe and prepare different cannabis galenic preparations by pharmacists. It is believed that synergy between cannabis components, known as “entourage effect”, may be responsible for the superior effects of using herbal cannabis versus isolated compounds. So far, only a few cannabis components have been properly characterized for their therapeutic potential, making it unclear which of the isolated compounds should be further developed into registered medicines. Until such products become available, simple and accessible galenic preparations from the cannabis plant could play an important role. In cannabis, phytochemical and pharmacological attention has been attributed mainly to four major cannabinoids (Δ9- tetrahydrocannabinol, cannabidiol, cannabigerol and cannabichromene) and to terpene components. This means a basic knowledge of these compounds and their bioavailability in different administration forms is useful for producers as well as prescribers of galenic preparations. This work will outline the most important aspects of cannabinoids and terpenes, and their behaviors during preparation and use of various administration forms including vaporizing, cannabis oils and extracts, tea, and skin creams.

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Some problems of objective-prism spectra classification

Symposium - International Astronomical Union ◽

10.1017/s0074180900053183 ◽

1966 ◽

Vol 24 ◽

pp. 51-52

Author(s):

E. K. Kharadze ◽

R. A. Bartaya

Keyword(s):

Short Wave ◽

High Quality ◽

Stellar Spectra ◽

Objective Prism

The unique 70-cm meniscus-type telescope of the Abastumani Astrophysical Observatory supplied with two objective prisms and the seeing conditions characteristic at Mount Kanobili (Abastumani) permit us to obtain stellar spectra of a high quality. No additional design to improve the “climate” immediately around the telescope itself is being applied. The dispersions and photographic magnitude limits are 160 and 660Å/mm, and 12–13, respectively. The short-wave end of spectra reaches 3500–3400Å.

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A non-cyanide method of electropolishing silver

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100107873 ◽

1978 ◽

Vol 36 (1) ◽

pp. 146-147

Author(s):

R. L. Lyles ◽

S. J. Rothman ◽

W. Jäger

Keyword(s):

Electron Microscopy ◽

Sulphuric Acid ◽

Methyl Alcohol ◽

Health Hazards ◽

Silver Alloy ◽

High Quality ◽

Silver Alloys ◽

Free Sample ◽

Specimen Quality ◽

Standard Techniques

Standard techniques of electropolishing silver and silver alloys for electron microscopy in most instances have relied on various CN recipes. These methods have been characteristically unsatisfactory due to difficulties in obtaining large electron transparent areas, reproducible results, adequate solution lifetimes, and contamination free sample surfaces. In addition, there are the inherent health hazards associated with the use of CN solutions. Various attempts to develop noncyanic methods of electropolishing specimens for electron microscopy have not been successful in that the specimen quality problems encountered with the CN solutions have also existed in the previously proposed non-cyanic methods.The technique we describe allows us to jet polish high quality silver and silver alloy microscope specimens with consistant reproducibility and without the use of CN salts.The solution is similar to that suggested by Myschoyaev et al. It consists, in order of mixing, 115ml glacial actic acid (CH3CO2H, specific wt 1.04 g/ml), 43ml sulphuric acid (H2SO4, specific wt. g/ml), 350 ml anhydrous methyl alcohol, and 77 g thiourea (NH2CSNH2).

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A High Resolution Scanning Microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100101529 ◽

1968 ◽

Vol 26 ◽

pp. 356-357

Author(s):

A. V. Crewe ◽

J. Wall ◽

L. M. Welter

Keyword(s):

High Resolution ◽

Field Emission ◽

Spherical Aberration ◽

Focal Length ◽

Spot Size ◽

Emission Source ◽

Field Of View ◽

Scanning Microscope ◽

Magnetic Lens ◽

High Quality

A scanning microscope using a field emission source has been described elsewhere. This microscope has now been improved by replacing the single magnetic lens with a high quality lens of the type described by Ruska. This lens has a focal length of 1 mm and a spherical aberration coefficient of 0.5 mm. The final spot size, and therefore the microscope resolution, is limited by the aberration of this lens to about 6 Å.The lens has been constructed very carefully, maintaining a tolerance of + 1 μ on all critical surfaces. The gun is prealigned on the lens to form a compact unit. The only mechanical adjustments are those which control the specimen and the tip positions. The microscope can be used in two modes. With the lens off and the gun focused on the specimen, the resolution is 250 Å over an undistorted field of view of 2 mm. With the lens on,the resolution is 20 Å or better over a field of view of 40 microns. The magnification can be accurately varied by attenuating the raster current.

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Quantitative defect studies in semiconductor TEM samples prepared by low angle ion milling

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100138932 ◽

1995 ◽

Vol 53 ◽

pp. 512-513

Author(s):

L. Mulestagno ◽

J.C. Holzer ◽

P. Fraundorf

Keyword(s):

Sample Preparation ◽

Milling Time ◽

High Density ◽

Low Density ◽

Ion Milling ◽

High Quality ◽

Variable Angle ◽

Major Disadvantage ◽

Induced Defects

Due to the wealth of information, both analytical and structural that can be obtained from it TEM always has been a favorite tool for the analysis of process-induced defects in semiconductor wafers. The only major disadvantage has always been, that the volume under study in the TEM is relatively small, making it difficult to locate low density defects, and sample preparation is a somewhat lengthy procedure. This problem has been somewhat alleviated by the availability of efficient low angle milling.Using a PIPS® variable angle ion -mill, manufactured by Gatan, we have been consistently obtaining planar specimens with a high quality thin area in excess of 5 × 104 μm2 in about half an hour (milling time), which has made it possible to locate defects at lower densities, or, for defects of relatively high density, obtain information which is statistically more significant (table 1).

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Structural changes in silicon-on-insulator material during post-implantation annealing

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100145054 ◽

1986 ◽

Vol 44 ◽

pp. 736-737

Author(s):

C. O. Jung ◽

S. J. Krause ◽

S.R. Wilson

Keyword(s):

Integrated Circuits ◽

Oxide Layer ◽

High Speed ◽

Structural Changes ◽

Device Fabrication ◽

Silicon On Insulator ◽

High Quality ◽

Radiation Hardened ◽

Post Implantation ◽

Very High

Silicon-on-insulator (SOI) structures have excellent potential for future use in radiation hardened and high speed integrated circuits. For device fabrication in SOI material a high quality superficial Si layer above a buried oxide layer is required. Recently, Celler et al. reported that post-implantation annealing of oxygen implanted SOI at very high temperatures would eliminate virtually all defects and precipiates in the superficial Si layer. In this work we are reporting on the effect of three different post implantation annealing cycles on the structure of oxygen implanted SOI samples which were implanted under the same conditions.

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Performance and applications of a field-emission gun TEM/STEM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100129346 ◽

1992 ◽

Vol 50 (2) ◽

pp. 942-943

Author(s):

Judith M. Brock ◽

Max T. Otten ◽

Marc. J.C. de Jong

Keyword(s):

Field Emission ◽

High Resolution Imaging ◽

High Quality ◽

Small Energy ◽

High Brightness ◽

Small Probe ◽

Resolution Imaging ◽

Convergent Beam ◽

Beam Patterns ◽

Beam Diffraction

A Field Emission Gun (FEG) on a TEM/STEM instrument provides a major improvement in performance relative to one equipped with a LaB6 emitter. The improvement is particularly notable for small-probe techniques: EDX and EELS microanalysis, convergent beam diffraction and scanning. The high brightness of the FEG (108 to 109 A/cm2srad), compared with that of LaB6 (∼106), makes it possible to achieve high probe currents (∼1 nA) in probes of about 1 nm, whilst the currents for similar probes with LaB6 are about 100 to 500x lower. Accordingly the small, high-intensity FEG probes make it possible, e.g., to analyse precipitates and monolayer amounts of segregation on grain boundaries in metals or ceramics (Fig. 1); obtain high-quality convergent beam patterns from heavily dislocated materials; reliably detect 1 nm immuno-gold labels in biological specimens; and perform EDX mapping at nm-scale resolution even in difficult specimens like biological tissue.The high brightness and small energy spread of the FEG also bring an advantage in high-resolution imaging by significantly improving both spatial and temporal coherence.

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