scholarly journals Using the Emission of Muonic X-rays as a Spectroscopic Tool for the Investigation of the Local Chemistry of Elements

Nanomaterials ◽  
2020 ◽  
Vol 10 (7) ◽  
pp. 1260
Author(s):  
Matteo Aramini ◽  
Chiara Milanese ◽  
Adrian D. Hillier ◽  
Alessandro Girella ◽  
Christian Horstmann ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Qualitative Method ◽  
Hydrogen Desorption ◽  
Systematic Investigation ◽  
Muonic Atom ◽  
X Rays ◽  
X Ray ◽  
Spectroscopic Tool ◽  
X Ray Absorption

There are several techniques providing quantitative elemental analysis, but very few capable of identifying both the concentration and chemical state of elements. This study presents a systematic investigation of the properties of the X-rays emitted after the atomic capture of negatively charged muons. The probability rates of the muonic transitions possess sensitivity to the electronic structure of materials, thus making the muonic X-ray Emission Spectroscopy complementary to the X-ray Absorption and Emission techniques for the study of the chemistry of elements, and able of unparalleled analysis in case of elements bearing low atomic numbers. This qualitative method is applied to the characterization of light elements-based, energy-relevant materials involved in the reaction of hydrogen desorption from the reactive hydride composite Ca(BH4)2-Mg2NiH4. The origin of the influence of the band-structure on the muonic atom is discussed and the observed effects are attributed to the contribution of the electronic structure to the screening and to the momentum distribution in the muon cascade.

Characterization of Cellulosic Biomass Loaded with Iron and Arsenic Using High Energy X-Rays

2007 ◽  
Vol 20-21 ◽  
pp. 643-646 ◽  
Author(s):  
G. Cordeiro Silva ◽  
Regina Pinto de Carvalho ◽  
M. Sylvia S. Dantas ◽  
Virgínia S.T. Ciminelli
Keyword(s):  
Fine Structure ◽  
Arsenic Species ◽  
High Energy ◽  
Cellulosic Biomass ◽  
X Rays ◽  
Iron Ions ◽  
X Ray ◽  
X Ray Absorption ◽  
Exafs Spectra

The biosorption of arsenic species by dried lettuce leaves (L.sativa) was investigated. Arsenic sorption, that is not effective on in natura biomass, was enhanced when the biomass was previously loaded with Fe(III). Analysis of X-ray Absorption Near-Edge Spectroscopy (XANES) spectra showed that iron was incorporated as Fe(III) and arsenic as As(V), regardless the contact with the lowest or highest valence species of these elements. The features of Extended X-ray Absorption Fine-Structure Spectroscopy (EXAFS) spectra suggest that the nearest neighboring atoms of iron ions are the same in all the samples, even in the As-Fe loaded ones. These results indicate the arsenic oxyanions as the sorbed species on the iron-loaded biomass.

The Characterization of Thin Films and Layered Structures Using X-RAY Absorption and Reflection at Grazing Incidence

1984 ◽  
Vol 37 ◽  
Author(s):  
S. M. Heald ◽  
J. M. Tranquada ◽  
D. O. Welch ◽  
H. Chen
Keyword(s):  
Thin Films ◽  
Fine Structure ◽  
High Resolution ◽  
Grazing Incidence ◽  
X Rays ◽  
X Ray ◽  
Surface And Interface ◽  
Interface Structures ◽  
X Ray Absorption

AbstractX-rays at grazing incidence have a short, controllable penetration depth and are well suited as a probe of surface and interface structures. This paper examines the possibility applying grazing-incidence reflectivity and Extended X-Ray Absorption Fine Structure (EXAFS) measurements to such systems. Results are presented for an Al-Cu couple for which both high resolution reflectivity and interface EXAFS measurements are made. The latter results are the first interface specific EXAFS data to be reported. Distinct changes in both signals are observed upon annealing, demonstrating the potential of the techniques.

Characterization of Local Crystal and Electronic Structure on Sr2CuO2F2+x Material by Synchrotron Radiation

2016 ◽  
Vol 850 ◽  
pp. 175-179
Author(s):  
Hai Bo Wang ◽  
Qian Wang ◽  
Yan Dong Ji ◽  
Meng Meng Yang ◽  
Yong Qi Dong
Keyword(s):  
Electronic Structure ◽  
Synchrotron Radiation ◽  
Valence State ◽  
Physical Property ◽  
Good Method ◽  
X Ray ◽  
The Relationship ◽  
X Ray Absorption ◽  
Crystal And Electronic Structure

In order to study the evolution of local crystal and electronic structure of Sr2CuO2F2+x, the synchrotron radiation x-ray absorption (XAS) and x-ray absorption fine structure (XAFS) techniques were both performed on different amount of Sr2CuO2F2+x materials. The relationship between high Tc superconductivity and valence state of cooper was mainly discussed. And the effect of by-reproduce SrF2 in non-superconductive Sr2CuO2F2+x on physical property of this material was considered. The experimental results showed that the valence state of Cu and the amount of SrF2 was mainly related with high Tc superconductivity of Sr2CuO2F2+x material, indicating a good method for improving Tc.

Elemental, chemical, and orientational characterization of easily damageable materials with x-ray microscopy

1995 ◽  
Vol 53 ◽  
pp. 92-93
Author(s):  
H. Ade
Keyword(s):  
Linear Dichroism ◽  
Aqueous Environment ◽  
X Rays ◽  
Edge Structure ◽  
X Ray ◽  
Elemental Sensitivity ◽  
Linearly Polarized ◽  
Synchrotron Light ◽  
X Ray Absorption

Many of the transmission x-ray microscopy developments since the late seventies, including the ones at the National Synchrotron Light Source (NSLS), were driven primarily by the potential of x-ray microscopy to image wet and unstained biological samples with low radiation dose. High image contrast between an aqueous environment and carbon based materials can be achieved with photon energies between the carbon and oxygen K absorption edges (290-540 eV). This contrast is based on differences in cross section of the elements oxygen and carbon in this energy range. Going beyond this "elemental" sensitivity, Ade et al. recently demonstrated how chemical (valence) sensitivity can be achieved via the X-ray Absorption Near Edge Structure (XANES) at the carbon K edge. In addition, linear dichroism microscopy can exploit the dependence of x-ray absorption resonances on the bond orientation relative to the linearly polarized x rays. For an application of the latter technique see A.P. Smith et al.

Characterization of the electronic structure of SiCl4 probed by X-ray absorption and ion desorption techniques

1995 ◽  
Vol 246 (3) ◽  
pp. 285-290 ◽  
Author(s):  
Jin-Ming Chen ◽  
Ruth Klauser ◽  
Shih-Chyuan Yang ◽  
Ching-Rong Wen
Keyword(s):  
Electronic Structure ◽  
X Ray ◽  
Ion Desorption ◽  
X Ray Absorption

Digital x-ray mapping of nanometer-size supported bimetallic catalysts

1988 ◽  
Vol 46 ◽  
pp. 530-531
Author(s):  
L. T. Germinario
Keyword(s):  
Background Radiation ◽  
Metal Cluster ◽  
Single Element ◽  
Beam Diameter ◽  
X Rays ◽  
X Ray ◽  
Major Interest ◽  
Induced Changes

Understanding the role of metal cluster composition in determining catalytic selectivity and activity is of major interest in heterogeneous catalysis. The electron microscope is well established as a powerful tool for ultrastructural and compositional characterization of support and catalyst. Because the spatial resolution of x-ray microanalysis is defined by the smallest beam diameter into which the required number of electrons can be focused, the dedicated STEM with FEG is the instrument of choice. The main sources of errors in energy dispersive x-ray analysis (EDS) are: (1) beam-induced changes in specimen composition, (2) specimen drift, (3) instrumental factors which produce background radiation, and (4) basic statistical limitations which result in the detection of a finite number of x-ray photons. Digital beam techniques have been described for supported single-element metal clusters with spatial resolutions of about 10 nm. However, the detection of spurious characteristic x-rays away from catalyst particles produced images requiring several image processing steps.

EXELFS Studies of Carbon Fibers

1990 ◽  
Vol 48 (2) ◽  
pp. 72-73
Author(s):  
V. Serin ◽  
K. Hssein ◽  
G. Zanchi ◽  
J. Sévely
Keyword(s):  
Carbon Fibers ◽  
Energy Analysis ◽  
Electron Excitation ◽  
Complex Structures ◽  
High Modulus ◽  
Promising Technique ◽  
X Ray ◽  
Fine Structures ◽  
X Ray Absorption

The present developments of electron energy analysis in the microscopes by E.E.L.S. allow an accurate recording of the spectra and of their different complex structures associated with the inner shell electron excitation by the incident electrons (1). Among these structures, the Extended Energy Loss Fine Structures (EXELFS) are of particular interest. They are equivalent to the well known EXAFS oscillations in X-ray absorption spectroscopy. Due to the EELS characteristic, the Fourier analysis of EXELFS oscillations appears as a promising technique for the characterization of composite materials, the major constituents of which are low Z elements. Using EXELFS, we have developed a microstructural study of carbon fibers. This analysis concerns the carbon K edge, which appears in the spectra at 285 eV. The purpose of the paper is to compare the local short range order, determined by this way in the case of Courtauld HTS and P100 ex-polyacrylonitrile carbon fibers, which are high tensile strength (HTS) and high modulus (HM) fibers respectively.

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