Bestimmung von Material- und Modellparametern hyperelastischer Silikonklebungen im konstruktiven Glasbau/Determination of material and model parameters of hyperelastic silicone bondings in structural glass construction

Bauingenieur ◽  
2021 ◽  
Vol 96 (01-02) ◽  
pp. 37-46
Author(s):  
B. Schaaf ◽  
B. Abeln ◽  
C. Richter ◽  
M. Feldmann ◽  
E. Toups ◽  
...  
Keyword(s):  
Model Parameters ◽  
Structural Glass ◽  
Wird Eine ◽  
Structural Silicone ◽  
Stand Der Technik ◽  
Etag 002

Zusammenfassung Der Einsatzbereich geklebter Glaskonstruktion unter Verwendung von Silikonen mit hyperelastischem Materialverhalten ist aufgrund hoher bauaufsichtlicher Hürden sehr eingeschränkt. Hinsichtlich der Bemessung von Structural Silicone Glazing (SSG) Klebungen ist die Europäische Technische Zulassungsrichtlinie ETAG 002 für Silikon-Klebungen das einzige normative Dokument. Darin wird eine Berechnungsmethode empfohlen, bei der sich die Normalspannungen aus der einwirkenden Kraft über die Klebfläche berechnen, was jedoch als eine grobe Schätzung angesehen werden kann und dazu beiträgt, dass hohe Sicherheitsfaktoren anzusetzen sind. Im Rahmen von FE-Berechnungen zur Bemessung von Klebverbindungen wird das Material des Klebstoffs in der Regel durch hyperelastische Materialmodelle wie Ogden oder Mooney-Rivlin beschrieben. Diese Materialmodelle und ihre Herleitungen sind jedoch komplex und die Bestimmung der Materialparameter wird als aufwändig empfunden. Der Beitrag gibt einen Überblick über den Stand der Technik und beschreibt verschiedene Kennwertversuche sowie die Bestimmung der Materialparameter innerhalb des Programms ANSYS und gibt einen Ausblick auf ein neu entwickeltes Materialmodell.

Experience with the IMMa tyre test bench for the determination of tyre model parameters using genetic techniques

2005 ◽  
Vol 43 (sup1) ◽  
pp. 253-266 ◽  
Author(s):  
J. A. Cabrera ◽  
A. Ortiz ◽  
E. Carabias ◽  
A. Simón
Keyword(s):  
Test Bench ◽  
Model Parameters ◽  
Tyre Model ◽  
Genetic Techniques

scholarly journals Bestimmung des Anregungsspektrums für kontaktlose breitbandige Messungen der Übertragungsfunktion mit Plasmaanregung und Laser-Doppler-Vibrometrie

2020 ◽  
Vol 87 (s1) ◽  
pp. s102-s107
Author(s):  
Xiaodong Cao ◽  
Mengwei Yu ◽  
Georg Bauer ◽  
Christian Rembe
Keyword(s):  
Laser Doppler ◽  
Wird Eine ◽  
Stand Der Technik

ZusammenfassungDie Übertragungsfunktion eines mechanischen Systems ist eine der wichtigsten Messgrößen in der Schwingungsanalyse. Um die Übertragungsfunktion möglichst breitbandig bestimmen zu können, wird eine breitbandige Anregung benötigt, welche z.B. durch eine Plasmaanregung realisiert werden kann. Allerdings stellt die Bestimmung des Spektrums einer solchen Plasmaanregung, welche für die Ermittlung der Übertragungsfunktion notwendig ist, zurzeit noch eine Herausforderung in der Forschung dar. In diesem Beitrag bestimmen wir das Anregungsspektrum durch ein Simulationsmodell und vergleichen das Ergebnis mit dem Resultat einer bisher typischerweise eingesetzten experimentellen Schätzmethode. Der vorgestellte Ansatz benötigt einen deutlich geringeren Aufwand und stellt damit für praktische Anwendungen eine gute Alternative zum aktuellen Stand der Technik dar.

scholarly journals The seven sisters DANCe

2018 ◽  
Vol 612 ◽  
pp. A70 ◽  
Author(s):  
J. Olivares ◽  
E. Moraux ◽  
L. M. Sarro ◽  
H. Bouy ◽  
A. Berihuete ◽  
...  
Keyword(s):  
Spatial Distribution ◽  
Model Comparison ◽  
Precise Determination ◽  
Model Parameters ◽  
Data Sets ◽  
Adequate Model ◽  
Comparison Results ◽  
Bayesian Evidence ◽  
Mass Segregation

Context. Membership analyses of the DANCe and Tycho + DANCe data sets provide the largest and least contaminated sample of Pleiades candidate members to date. Aims. We aim at reassessing the different proposals for the number surface density of the Pleiades in the light of the new and most complete list of candidate members, and inferring the parameters of the most adequate model. Methods. We compute the Bayesian evidence and Bayes Factors for variations of the classical radial models. These include elliptical symmetry, and luminosity segregation. As a by-product of the model comparison, we obtain posterior distributions for each set of model parameters. Results. We find that the model comparison results depend on the spatial extent of the region used for the analysis. For a circle of 11.5 parsecs around the cluster centre (the most homogeneous and complete region), we find no compelling reason to abandon King’s model, although the Generalised King model introduced here has slightly better fitting properties. Furthermore, we find strong evidence against radially symmetric models when compared to the elliptic extensions. Finally, we find that including mass segregation in the form of luminosity segregation in the J band is strongly supported in all our models. Conclusions. We have put the question of the projected spatial distribution of the Pleiades cluster on a solid probabilistic framework, and inferred its properties using the most exhaustive and least contaminated list of Pleiades candidate members available to date. Our results suggest however that this sample may still lack about 20% of the expected number of cluster members. Therefore, this study should be revised when the completeness and homogeneity of the data can be extended beyond the 11.5 parsecs limit. Such a study will allow for more precise determination of the Pleiades spatial distribution, its tidal radius, ellipticity, number of objects and total mass.

scholarly journals Junction Parameter Extraction for Electronic Device Characterization

2004 ◽  
Vol 27 (2) ◽  
pp. 61-67
Author(s):  
S. Dib ◽  
C. Salame ◽  
N. Toufik ◽  
A. Khoury ◽  
F. Pélanchon ◽  
...  
Keyword(s):  
Electronic Device ◽  
Control Process ◽  
Parameter Extraction ◽  
Exponential Model ◽  
Voltage Characteristic ◽  
Model Parameters ◽  
Current Voltage Characteristic ◽  
Device Characterization ◽  
Current Voltage

A new method for the extraction of junction parameters from a description of the current–voltage characteristic is developed. A simulation is performed and a high accuracy is obtained for the determination of the singleexponential model parameters. The method is easy to implement in a control process for device characterization. An application, achieved to observe the degradation of the emitter–base junction of a bipolar transistor during an aging experiment, shows that the evolutions of the single exponential model parameters versus time introduce a means for degradation quantification.

Device Modeling of a-Si:H Alloy Solar Cells: Calibration Procedure for Determination of Model Input Parameters

1998 ◽  
Vol 507 ◽  
Author(s):  
M. Zeman ◽  
R.A.C.M.M. Van Swaaij ◽  
E. Schroten ◽  
L.L.A. Vosteen ◽  
J.W. Metselaar
Keyword(s):  
Solar Cell ◽  
Material Properties ◽  
Calibration Procedure ◽  
Model Parameters ◽  
Model Input ◽  
A Value ◽  
Input Parameters ◽  
Simulated Material ◽  
Good Agreement

ABSTRACTA calibration procedure for determining the model input parameters of standard a-Si:H layers, which comprise a single junction a-Si:H solar cell, is presented. The calibration procedure consists of: i) deposition of the separate layers, ii) measurement of the material properties, iii) fitting the model parameters to match the measured properties, iv) simulation of test devices and comparison with experimental results. The inverse modeling procedure was used to extract values of the most influential model parameters by fitting the simulated material properties to the measured ones. In case of doped layers the extracted values of the characteristic energies of exponentially decaying tail states are much higher than the values reported in literature. Using the extracted values of model parameters a good agreement between the measured and calculated characteristics of a reference solar cell was reached. The presented procedure could not solve directly an important issue concerning a value of the mobility gap in a-Si:H alloys.

scholarly journals Determination of GTN Model Parameters Based on Artificial Neutral Network for a Ductile Failure

2021 ◽  
Vol 2 (1) ◽  
pp. 01-05
Author(s):  
YASSINE CHAHBOUB ◽  
SZAVAI Szabolcs
Keyword(s):  
Ductile Failure ◽  
Compact Tension ◽  
Model Parameters ◽  
Single Edge ◽  
Direct Identification ◽  
Simulation Data ◽  
Short Period ◽  
Artificial Neural Network Ann ◽  
Excellent Tool

The Gurson – Tvergaard – Needleman (GTN) mechanical model is widely used to predict the failure of materials based on laboratory specimens, direct identification of Gurson – Tvergaard – Needleman parameters is not easy and time-consuming, and the most used method to determine them is the combination between the experimental results and those of the finite elements, the process consists of repeating the simulations several times until the simulation data matches the experimental data obtained at the specimen level.This article aims to find GTN parameters for the Compact Tension (CT) and Single Edge Tensile Test (SENT) specimen based on the Notch Specimen (NT) using the Artificial Neural Network (ANN) approach. . This work presents how the ANN could help us determine the parameters of GTN in a very short period of time. The results obtained show that ANN is an excellent tool for determining GTN parameters.

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