Investigation of Surface Grooves from Migrating Grain Boundaries

2002 ◽  
Vol 750 ◽  
Author(s):  
Nicole E. Munoz ◽  
Shelley R. Gilliss ◽  
N. Ravishankar ◽  
C. Barry Carter
Keyword(s):  
Atomic Force Microscopy ◽  
Grain Boundary ◽  
Light Microscopy ◽  
Grain Boundaries ◽  
High Purity ◽  
Moving Boundary ◽  
Migration Process ◽  
Force Microscopy ◽  
Atomic Force ◽  
And Migration

ABSTRACTVisible-light microscopy (VLM) and atomic-force microscopy (AFM) were used to study the progression of grain-boundary grooving and migration in high-purity alumina (Lucalox™). Groove profiles from the same grain boundaries were revisited using AFM following successive heat-treatments. The grooves measured from migrating grain boundaries were found to have asymmetric partial-angles compared to those measured from boundaries that did not migrate during the experiment. For a moving boundary, the grain with the larger partial-angle was consistently found to grow into the grain with the smaller partial-angle. Migrating boundaries were observed to leave behind remnant thermal grooves. The observations indicate that the boundary may be bowing out during the migration process.

Interrogation of Alumina Grain Boundaries using Atomic Force Microscopy

1999 ◽  
Vol 580 ◽  
Author(s):  
P.A. Tibble ◽  
B.R. Heywood ◽  
R. Richardson ◽  
P. Barnes
Keyword(s):  
Particle Size ◽  
Atomic Force Microscopy ◽  
Grain Boundary ◽  
Grain Boundaries ◽  
Preferential Growth ◽  
Polycrystalline Alumina ◽  
Present Evidence ◽  
Force Microscopy ◽  
Atomic Force ◽  
Uniform Growth

AbstractA number of MgO doped (3wt%) polycrystalline alumina samples were prepared. The preparation of these samples varied; different regimes for annealing (1500 – 1600°C) and a range of dwell times were examined. Atomic force microscopy (AFM) was used to study surface features. Information on grain boundary dimensions (depth, width) is presented along with a study of grain particle size. The growth of the grain boundaries was found to contradict Mullins' theory of uniform growth with time. We also present evidence for Ostwalds' ripening and the preferential growth of [001] oriented grains.

scholarly journals Evaluation of grain boundaries as percolation pathways in quartz-rich continental crust using Atomic Force Microscopy

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Ritabrata Dobe ◽  
Anuja Das ◽  
Rabibrata Mukherjee ◽  
Saibal Gupta
Keyword(s):  
Atomic Force Microscopy ◽  
Grain Boundary ◽  
Continental Crust ◽  
Electron Backscatter Diffraction ◽  
Vital Role ◽  
Force Microscopy ◽  
Atomic Force ◽  
Width Measurements ◽  
Lower Temperature ◽  
Backscatter Diffraction

AbstractHydrous fluids play a vital role in the chemical and rheological evolution of ductile, quartz-bearing continental crust, where fluid percolation pathways are controlled by grain boundary domains. In this study, widths of grain boundary domains in seven quartzite samples metamorphosed under varying crustal conditions were investigated using Atomic Force Microscopy (AFM) which allows comparatively easy, high magnification imaging and precise width measurements. It is observed that dynamic recrystallization at higher metamorphic grades is much more efficient at reducing grain boundary widths than at lower temperature conditions. The concept of force-distance spectroscopy, applied to geological samples for the first time, allows qualitative estimation of variations in the strength of grain boundary domains. The strength of grain boundary domains is inferred to be higher in the high grade quartzites, which is supported by Kernel Average Misorientation (KAM) studies using Electron Backscatter Diffraction (EBSD). The results of the study show that quartzites deformed and metamorphosed at higher grades have narrower channels without pores and an abundance of periodically arranged bridges oriented at right angles to the length of the boundary. We conclude that grain boundary domains in quartz-rich rocks are more resistant to fluid percolation in the granulite rather than the greenschist facies.

scholarly journals A thermal grooving study of relative grain boundary energies of nickel in polycrystalline Ni and in a Ni/YSZ anode measured by atomic force microscopy

2021 ◽  
pp. 116936
Author(s):  
Patricia Haremski ◽  
Lars Epple ◽  
Matthias Wieler ◽  
Piero Lupetin ◽  
Richard Thelen ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Grain Boundary ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Tattoo ink nanoparticles in skin tissue and fibroblasts

2015 ◽  
Vol 6 ◽  
pp. 1183-1191 ◽  
Author(s):  
Colin A Grant ◽  
Peter C Twigg ◽  
Richard Baker ◽  
Desmond J Tobin
Keyword(s):  
Atomic Force Microscopy ◽  
Light Microscopy ◽  
Collagen Fibril ◽  
Chemical Activity ◽  
The West ◽  
Force Microscopy ◽  
Atomic Force ◽  
The World ◽  
The Subject ◽  
Tattoo Inks

Tattooing has long been practised in various societies all around the world and is becoming increasingly common and widespread in the West. Tattoo ink suspensions unquestionably contain pigments composed of nanoparticles, i.e., particles of sub-100 nm dimensions. It is widely acknowledged that nanoparticles have higher levels of chemical activity than their larger particle equivalents. However, assessment of the toxicity of tattoo inks has been the subject of little research and ink manufacturers are not obliged to disclose the exact composition of their products. This study examines tattoo ink particles in two fundamental skin components at the nanometre level. We use atomic force microscopy and light microscopy to examine cryosections of tattooed skin, exploring the collagen fibril networks in the dermis that contain ink nanoparticles. Further, we culture fibroblasts in diluted tattoo ink to explore both the immediate impact of ink pigment on cell viability and also to observe the interaction between particles and the cells.

Imaging Electron Transport across Grain Boundaries in an Integrated Electron and Atomic Force Microscopy Platform: Application to Polycrystalline Silicon Solar Cells

2009 ◽  
Vol 1153 ◽  
Author(s):  
Manuel J Romero ◽  
Fude Liu ◽  
Oliver Kunz ◽  
Johnson Wong ◽  
Chun-Sheng Jiang ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Solar Cells ◽  
Electron Transport ◽  
Grain Boundaries ◽  
Polycrystalline Silicon ◽  
High Energy ◽  
Dominant Factor ◽  
Force Microscopy ◽  
Atomic Force

AbstractWe have investigated the local electron transport in polycrystalline silicon (pc-Si) thin-films by atomic force microscopy (AFM)-based measurements of the electron-beam-induced current (EBIC). EVA solar cells are produced at UNSW by <i>EVAporation</i> of a-Si and subsequent <i>solid-phase crystallization</i>–a potentially cost-effective approach to the production of pc-Si photovoltaics. A fundamental understanding of the electron transport in these pc-Si thin films is of prime importance to address the factors limiting the efficiency of EVA solar cells. EBIC measurements performed in combination with an AFM integrated inside an electron microscope can resolve the electron transport across individual grain boundaries. AFM-EBIC reveals that most grain boundaries present a high energy barrier to the transport of electrons for both p-type and n-type EVA thin-films. Furthermore, for p-type EVA pc-Si, in contrast with n-type, charged grain boundaries are seen. Recombination at grain boundaries seems to be the dominant factor limiting the efficiency of these pc-Si solar cells.

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