Nanostructural analysis by atomic force microscopy followed by light microscopy on the same archival slide

2009 ◽  
Vol 72 (7) ◽  
pp. 471-481
Author(s):  
Mathias Wagner ◽  
Dirk Kaehler ◽  
Olaf Anhenn ◽  
Thomas Betz ◽  
Sally Awad ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Light Microscopy ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Tattoo ink nanoparticles in skin tissue and fibroblasts

2015 ◽  
Vol 6 ◽  
pp. 1183-1191 ◽  
Author(s):  
Colin A Grant ◽  
Peter C Twigg ◽  
Richard Baker ◽  
Desmond J Tobin
Keyword(s):  
Atomic Force Microscopy ◽  
Light Microscopy ◽  
Collagen Fibril ◽  
Chemical Activity ◽  
The West ◽  
Force Microscopy ◽  
Atomic Force ◽  
The World ◽  
The Subject ◽  
Tattoo Inks

Tattooing has long been practised in various societies all around the world and is becoming increasingly common and widespread in the West. Tattoo ink suspensions unquestionably contain pigments composed of nanoparticles, i.e., particles of sub-100 nm dimensions. It is widely acknowledged that nanoparticles have higher levels of chemical activity than their larger particle equivalents. However, assessment of the toxicity of tattoo inks has been the subject of little research and ink manufacturers are not obliged to disclose the exact composition of their products. This study examines tattoo ink particles in two fundamental skin components at the nanometre level. We use atomic force microscopy and light microscopy to examine cryosections of tattooed skin, exploring the collagen fibril networks in the dermis that contain ink nanoparticles. Further, we culture fibroblasts in diluted tattoo ink to explore both the immediate impact of ink pigment on cell viability and also to observe the interaction between particles and the cells.

Investigation of Surface Grooves from Migrating Grain Boundaries

2002 ◽  
Vol 750 ◽  
Author(s):  
Nicole E. Munoz ◽  
Shelley R. Gilliss ◽  
N. Ravishankar ◽  
C. Barry Carter
Keyword(s):  
Atomic Force Microscopy ◽  
Grain Boundary ◽  
Light Microscopy ◽  
Grain Boundaries ◽  
High Purity ◽  
Moving Boundary ◽  
Migration Process ◽  
Force Microscopy ◽  
Atomic Force ◽  
And Migration

ABSTRACTVisible-light microscopy (VLM) and atomic-force microscopy (AFM) were used to study the progression of grain-boundary grooving and migration in high-purity alumina (Lucalox™). Groove profiles from the same grain boundaries were revisited using AFM following successive heat-treatments. The grooves measured from migrating grain boundaries were found to have asymmetric partial-angles compared to those measured from boundaries that did not migrate during the experiment. For a moving boundary, the grain with the larger partial-angle was consistently found to grow into the grain with the smaller partial-angle. Migrating boundaries were observed to leave behind remnant thermal grooves. The observations indicate that the boundary may be bowing out during the migration process.

Comparative analysis of clastogen-induced chromosome aberrations observed with light microscopy and by means of atomic force microscopy

2013 ◽  
Vol 753 (1) ◽  
pp. 29-35 ◽  
Author(s):  
Vanya Petrova Koleva ◽  
Asya Pencheva Dragoeva ◽  
Andreana Ivanova Andreeva ◽  
Marina Todorova Burova ◽  
Sevdalin Georgiev ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Comparative Analysis ◽  
Light Microscopy ◽  
Chromosome Aberrations ◽  
Force Microscopy ◽  
Atomic Force

Collapse and Self-Reconstruction of Mesoscopic Architectures of Supramolecular J Aggregates in Solution: From Strings to Tubular Rods

2004 ◽  
Vol 1 (3) ◽  
pp. 280-287 ◽  
Author(s):  
Hiroshi Yao ◽  
Chris Michaels ◽  
Stephan Stranick ◽  
Takeshi Isohashi ◽  
Keisaku Kimura
Keyword(s):  
Atomic Force Microscopy ◽  
Fluorescence Microscopy ◽  
Light Microscopy ◽  
Near Field ◽  
Polarized Light ◽  
Force Microscopy ◽  
Atomic Force ◽  
J Aggregates ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

: This Letter reports the collapse and subsequent self-reassembly of mesoscopic architectures of supramolecular J aggregates in solution. Ultrasonication of the string-like 5,5-dichloro-3,3-disulfopropyl thiacyanine (TC) J aggregates caused fragmentation (collapse) of the initial morphology, followed by a prompt self-reconstruction into mesoscopic rod-like architectures. Fluorescence microscopy, polarized light microscopy, atomic force microscopy and near-field scanning optical microscopy revealed that the apparent rod-like morphology was a tubular architecture with a monomolecular wall (single-wall) and open ends.

scholarly journals Advantages of Simultaneous Imaging Using an Atomic Force Microscope Integrated with an Inverted Light Microscope

2011 ◽  
Vol 19 (6) ◽  
pp. 22-29
Author(s):  
W. Travis Johnson
Keyword(s):  
Atomic Force Microscopy ◽  
Light Microscopy ◽  
Scanning Probe Microscopy ◽  
Light Microscope ◽  
Cell Biology ◽  
Numerical Aperture ◽  
Scanning Probe ◽  
Force Microscopy ◽  
Simultaneous Imaging ◽  
Atomic Force

Atomic Force Microscopy (AFM) permits measurements on biological samples below the limits of light microscopy resolution under physiological environments and other controlled conditions. Consequently, AFM has become an increasingly valuable technique in cell biology. One of the most exciting advances in AFM instrumentation has been its integration with the light microscope. This permits investigators to take advantage of the power and utility of light microscopy and scanning probe microscopy simultaneously. In combining a light microscope with an AFM, scanner components must be specifically designed so that they do not adversely impact the light microscope's optical imaging capabilities. For example, an AFM-ILM (inverted light microscope) hybrid system should be fully compatible with the highest quality, off-the-shelf 0.50–0.55 NA numerical aperture (NA) OEM objectives and condensers.

scholarly journals Taking Correlative Microscopy to a New Level

2003 ◽  
Vol 11 (4) ◽  
pp. 3-7
Author(s):  
Stephen W. Carmichael
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Atomic Force Microscopy ◽  
High Resolution ◽  
Light Microscopy ◽  
Wide Angle ◽  
Correlative Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron

We are all familiar with the concept of correlating an image acquired by light microscopy (LM) with one obtained by transmission electron microscopy (TEM). This allows us to take advantage of the “wide angle” view of LM and the high resolution of TEM. Correlative microscopy has been taken to a new level by Alvin Lin and Cynthia Goh who have designed a clever device. This device allows repetitive correlative microscopy between TEM and atomic force microscopy (AFM).

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