scholarly journals Mapping of elasticity and damping in an α + β titanium alloy through atomic force acoustic microscopy

2015 ◽  
Vol 6 ◽  
pp. 767-776 ◽  
Author(s):  
M Kalyan Phani ◽  
Anish Kumar ◽  
T Jayakumar ◽  
Walter Arnold ◽  
Konrad Samwer
Keyword(s):  
Titanium Alloy ◽  
Ultrasonic Velocity ◽  
Bulk Sample ◽  
Elastic Stiffness ◽  
Acoustic Microscopy ◽  
Indentation Modulus ◽  
Velocity Measurements ◽  
Volume Fractions ◽  
Atomic Force ◽  
Average Modulus

The distribution of elastic stiffness and damping of individual phases in an α + β titanium alloy (Ti-6Al-4V) measured by using atomic force acoustic microscopy (AFAM) is reported in the present study. The real and imaginary parts of the contact stiffness k * are obtained from the contact-resonance spectra and by using these two quantities, the maps of local elastic stiffness and the damping factor are derived. The evaluation of the data is based on the mass distribution of the cantilever with damped flexural modes. The cantilever dynamics model considering damping, which was proposed recently, has been used for mapping of indentation modulus and damping of different phases in a metallic structural material. The study indicated that in a Ti-6Al-4V alloy the metastable β phase has the minimum modulus and the maximum damping followed by α′- and α-phases. Volume fractions of the individual phases were determined by using a commercial material property evaluation software and were validated by using X-ray diffraction (XRD) and electron back-scatter diffraction (EBSD) studies on one of the heat-treated samples. The volume fractions of the phases and the modulus measured through AFAM are used to derive average modulus of the bulk sample which is correlated with the bulk elastic properties obtained by ultrasonic velocity measurements. The average modulus of the specimens estimated by AFAM technique is found to be within 5% of that obtained by ultrasonic velocity measurements. The effect of heat treatments on the ultrasonic attenuation in the bulk sample could also be understood based on the damping measurements on individual phases using AFAM.

scholarly journals Measurement of the Indentation Modulus and the Local Internal Friction in Amorphous SiO2 Using Atomic Force Acoustic Microscopy

2016 ◽  
Vol 61 (1) ◽  
pp. 9-12
Author(s):  
B. Zhang ◽  
H. Wagner ◽  
M. Büchsenschütz-Göbeler ◽  
Y. Luo ◽  
S. Küchemann ◽  
...  
Keyword(s):  
Internal Friction ◽  
Amorphous Materials ◽  
Contact Stiffness ◽  
Ultrasonic Transducer ◽  
Amorphous Material ◽  
Acoustic Microscopy ◽  
Damping Factor ◽  
Indentation Modulus ◽  
Amorphous Sio2 ◽  
Atomic Force

Abstract For the past two decades, atomic force acoustic microscopy (AFAM), an advanced scanning probe microscopy technique, has played a promising role in materials characterization with a good lateral resolution at micro/nano dimensions. AFAM is based on inducing out-of-plane vibrations in the specimen, which are generated by an ultrasonic transducer. The vibrations are sensed by the AFM cantilever when its tip is in contact with the material under test. From the cantilver’s contactresonance spectra, one determines the real and the imaginary part of the contact stiffness k*, and then from these two quantities the local indentation modulus M' and the local damping factor Qloc-1 can be obtained with a spatial resolution of less than 10 nm. Here, we present measured data of M' and of Qloc-1 for the insulating amorphous material, a-SiO2. The amorphous SiO2 layer was prepared on a crystalline Si wafer by means of thermal oxidation. There is a spatial distribution of the indentation modulus M' and of the internal friction Qloc-1. This is a consequence of the potential energy landscape for amorphous materials.

Mapping of elasticity and damping in an α + β titanium alloy through atomic force acoustic microscopy

nano Online ◽  
2016 ◽  
Author(s):  
Phani ◽  
Anish Kumar ◽  
T Jayakumar ◽  
Walter Arnold ◽  
Konrad Samwer
Keyword(s):  
Titanium Alloy ◽  
Acoustic Microscopy ◽  
Atomic Force

Elastic Properties of Nano–Thin Films by Use of Atomic Force Acoustic Microscopy

2009 ◽  
Vol 1185 ◽  
Author(s):  
Malgorzata Kopycinska-Müller ◽  
Andre Striegler ◽  
Arnd Hürrich ◽  
Bernd Köhler ◽  
Norbert Meyendorf ◽  
...  
Keyword(s):  
Static Load ◽  
Silicon Oxide ◽  
Depth Resolution ◽  
Silicon Single Crystal ◽  
Acoustic Microscopy ◽  
Indentation Modulus ◽  
Atomic Force ◽  
Film Substrate ◽  
Non Destructive ◽  
Good Agreement

AbstractAtomic force acoustic microscopy (AFAM) is a non-destructive method able to determine the indentation modulus of a sample with high lateral and depth resolution. We used the AFAM technique to measure the indentation modulus of film-substrate systems Msam and then to extract the value of the indentation modulus of the film Mf. The investigated samples were films of silicon oxide thermally grown on silicon single crystal substrates by use of dry and wet oxidation methods. The thickness of the samples ranged from 7 nm to 28 nm as measured by ellipsometry. Our results clearly show that the values of Msam obtained for the film-substrate systems depended on the applied static load and the film thickness. The observed dependency was used to evaluate the indentation modulus of the film. The values obtained for Mf ranged from 77 GPa to 95 GPa and were in good agreement with values reported in the literature.

scholarly journals Stochastic excitation for high-resolution atomic force acoustic microscopy imaging: a system theory approach

2020 ◽  
Vol 11 ◽  
pp. 703-716
Author(s):  
Edgar Cruz Valeriano ◽  
José Juan Gervacio Arciniega ◽  
Christian Iván Enriquez Flores ◽  
Susana Meraz Dávila ◽  
Joel Moreno Palmerin ◽  
...  
Keyword(s):  
System Theory ◽  
High Resolution ◽  
White Noise ◽  
Acoustic Microscopy ◽  
Frequency Resolution ◽  
Indentation Modulus ◽  
Theory Approach ◽  
Microscopy Imaging ◽  
Atomic Force ◽  
Resonance Frequencies

In this work, a high-resolution atomic force acoustic microscopy imaging technique is developed in order to obtain the local indentation modulus at the nanoscale level. The technique uses a model that gives a qualitative relationship between a set of contact resonance frequencies and the indentation modulus. It is based on white-noise excitation of the tip–sample interaction and uses system theory for the extraction of the resonance modes. During conventional scanning, for each pixel, the tip–sample interaction is excited with a white-noise signal. Then, a fast Fourier transform is applied to the deflection signal that comes from the photodiodes of the atomic force microscopy (AFM) equipment. This approach allows for the measurement of several vibrational modes in a single step with high frequency resolution, with less computational cost and at a faster speed than other similar techniques. This technique is referred to as stochastic atomic force acoustic microscopy (S-AFAM), and the frequency shifts of the free resonance frequencies of an AFM cantilever are used to determine the mechanical properties of a material. S-AFAM is implemented and compared with a conventional technique (resonance tracking-atomic force acoustic microscopy, RT-AFAM). A sample of a graphite film on a glass substrate is analyzed. S-AFAM can be implemented in any AFM system due to its reduced instrumentation requirements compared to conventional techniques.

Local indentation modulus characterization via two contact resonance frequencies atomic force acoustic microscopy

2007 ◽  
Vol 84 (3) ◽  
pp. 490-494 ◽  
Author(s):  
D. Passeri ◽  
A. Bettucci ◽  
M. Germano ◽  
M. Rossi ◽  
A. Alippi ◽  
...  
Keyword(s):  
Acoustic Microscopy ◽  
Indentation Modulus ◽  
Atomic Force ◽  
Resonance Frequencies ◽  
Contact Resonance

Elastic stiffness coefficients (c11, c33, and c13) for freshly excised and formalin-fixed myocardium from ultrasonic velocity measurements

2006 ◽  
Vol 119 (3) ◽  
pp. 1880-1887 ◽  
Author(s):  
Min Yang ◽  
Steven L. Baldwin ◽  
Karen R. Marutyan ◽  
Kirk D. Wallace ◽  
Mark R. Holland ◽  
...  
Keyword(s):  
Ultrasonic Velocity ◽  
Elastic Stiffness ◽  
Velocity Measurements ◽  
Stiffness Coefficients ◽  
Formalin Fixed
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