scholarly journals Stochastic excitation for high-resolution atomic force acoustic microscopy imaging: a system theory approach

2020 ◽  
Vol 11 ◽  
pp. 703-716
Author(s):  
Edgar Cruz Valeriano ◽  
José Juan Gervacio Arciniega ◽  
Christian Iván Enriquez Flores ◽  
Susana Meraz Dávila ◽  
Joel Moreno Palmerin ◽  
...  
Keyword(s):  
System Theory ◽  
High Resolution ◽  
White Noise ◽  
Acoustic Microscopy ◽  
Frequency Resolution ◽  
Indentation Modulus ◽  
Theory Approach ◽  
Microscopy Imaging ◽  
Atomic Force ◽  
Resonance Frequencies

In this work, a high-resolution atomic force acoustic microscopy imaging technique is developed in order to obtain the local indentation modulus at the nanoscale level. The technique uses a model that gives a qualitative relationship between a set of contact resonance frequencies and the indentation modulus. It is based on white-noise excitation of the tip–sample interaction and uses system theory for the extraction of the resonance modes. During conventional scanning, for each pixel, the tip–sample interaction is excited with a white-noise signal. Then, a fast Fourier transform is applied to the deflection signal that comes from the photodiodes of the atomic force microscopy (AFM) equipment. This approach allows for the measurement of several vibrational modes in a single step with high frequency resolution, with less computational cost and at a faster speed than other similar techniques. This technique is referred to as stochastic atomic force acoustic microscopy (S-AFAM), and the frequency shifts of the free resonance frequencies of an AFM cantilever are used to determine the mechanical properties of a material. S-AFAM is implemented and compared with a conventional technique (resonance tracking-atomic force acoustic microscopy, RT-AFAM). A sample of a graphite film on a glass substrate is analyzed. S-AFAM can be implemented in any AFM system due to its reduced instrumentation requirements compared to conventional techniques.

scholarly journals Stochastic excitation for high-resolution Atomic Force Acoustic Microscopy imaging: a system theory approach.

2019 ◽  
Author(s):  
Edgar Cruz-Valeriano ◽  
J J Gervacio Arciniega ◽  
M A Hernández Landaverde ◽  
Christian I Enriquez-Flores ◽  
Yuri Chipatecua ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
White Noise ◽  
Acoustic Microscopy ◽  
Indentation Modulus ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
White Noise Excitation ◽  
Atomic Force ◽  
Resonance Frequencies

In this work, a high-resolution Atomic Force Acoustic Microscopy imaging technique is shown in order to obtain the local indentation modulus at nanoscale using a model which gives a quantitative relationship between a set of contact resonance frequencies and indentation modulus through a white-noise excitation. This technique is based on white-noise excitation for system identification due to non-linearities in the tip-sample interaction. During a conventional scanning, a Fast Fourier Transform is applied to the deflection signal which comes from the photo-diodes of the Atomic Force Microscopy (AFM) for each pixel, while the tip-sample interaction is excited by a white-noise signal. This approach allows the measurement of several vibrational modes in a single step with high frequency resolution, less computational data and at a faster speed than other similar techniques. This technique is referred to as Stochastic Atomic Force Acoustic Microscopy (S-AFAM), where the frequency shifts with respect to free resonance frequencies for an AFM cantilever can be used to determine the mechanical properties of a material. S-AFAM is implemented and compared to a conventional technique (Resonance Tracking-Atomic Force Microscopy, RT-AFAM), where a graphite film over a glass substrate sample is analyzed. S-AFAM can be implemented in any AFM system due to its reduced instrumentation compared to conventional techniques.

Local indentation modulus characterization via two contact resonance frequencies atomic force acoustic microscopy

2007 ◽  
Vol 84 (3) ◽  
pp. 490-494 ◽  
Author(s):  
D. Passeri ◽  
A. Bettucci ◽  
M. Germano ◽  
M. Rossi ◽  
A. Alippi ◽  
...  
Keyword(s):  
Acoustic Microscopy ◽  
Indentation Modulus ◽  
Atomic Force ◽  
Resonance Frequencies ◽  
Contact Resonance

Nanoscale Elastic-Property Mapping with Contact-Resonance-Frequency AFM

2004 ◽  
Vol 838 ◽  
Author(s):  
D. C. Hurley ◽  
A. B. Kos ◽  
P. Rice
Keyword(s):  
Resonance Frequency ◽  
Elastic Properties ◽  
Digital Signal Processor ◽  
Contact Stiffness ◽  
Acoustic Microscopy ◽  
Indentation Modulus ◽  
Atomic Force ◽  
Resonance Frequencies ◽  
Vertical Contact ◽  
Contact Resonance

ABSTRACTWe describe a dynamic atomic force microscopy (AFM) method to map the nanoscale elastic properties of surfaces, thin films, and nanostructures. Our approach is based on atomic force acoustic microscopy (AFAM) techniques previously used for quantitative measurements of elastic properties at a fixed sample position. AFAM measurements determine the resonant frequencies of an AFM cantilever in contact mode to calculate the tip-sample contact stiffness k*. Local values for elastic properties such as the indentation modulus M can be determined from k* with the appropriate contact-mechanics models. To enable imaging at practical rates, we have developed a frequency-tracking circuit based on digital signal processor architecture to rapidly locate the contact-resonance frequencies at each image position. We present contact-resonance frequency images obtained using both flexural and torsional cantilever images as well as the corresponding vertical contact-stiffness (k*) image calculated from flexural frequency images. Methods to obtain elastic-modulus images of M from vertical contact-stiffness images are also discussed.

scholarly journals Measurement of the Indentation Modulus and the Local Internal Friction in Amorphous SiO2 Using Atomic Force Acoustic Microscopy

2016 ◽  
Vol 61 (1) ◽  
pp. 9-12
Author(s):  
B. Zhang ◽  
H. Wagner ◽  
M. Büchsenschütz-Göbeler ◽  
Y. Luo ◽  
S. Küchemann ◽  
...  
Keyword(s):  
Internal Friction ◽  
Amorphous Materials ◽  
Contact Stiffness ◽  
Ultrasonic Transducer ◽  
Amorphous Material ◽  
Acoustic Microscopy ◽  
Damping Factor ◽  
Indentation Modulus ◽  
Amorphous Sio2 ◽  
Atomic Force

Abstract For the past two decades, atomic force acoustic microscopy (AFAM), an advanced scanning probe microscopy technique, has played a promising role in materials characterization with a good lateral resolution at micro/nano dimensions. AFAM is based on inducing out-of-plane vibrations in the specimen, which are generated by an ultrasonic transducer. The vibrations are sensed by the AFM cantilever when its tip is in contact with the material under test. From the cantilver’s contactresonance spectra, one determines the real and the imaginary part of the contact stiffness k*, and then from these two quantities the local indentation modulus M' and the local damping factor Qloc-1 can be obtained with a spatial resolution of less than 10 nm. Here, we present measured data of M' and of Qloc-1 for the insulating amorphous material, a-SiO2. The amorphous SiO2 layer was prepared on a crystalline Si wafer by means of thermal oxidation. There is a spatial distribution of the indentation modulus M' and of the internal friction Qloc-1. This is a consequence of the potential energy landscape for amorphous materials.

High resolution noncontact atomic force microscopy imaging with oxygen-terminated copper tips at 78 K

Nanoscale ◽  
2020 ◽  
Vol 12 (5) ◽  
pp. 2961-2965 ◽  
Author(s):  
Damla Yesilpinar ◽  
Bertram Schulze Lammers ◽  
Alexander Timmer ◽  
Saeed Amirjalayer ◽  
Harald Fuchs ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
High Precision ◽  
Organic Molecule ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Bond Lengths ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging

AFM experiments at 78 K with an atomically defined O-terminated Cu tip allow determining bond lengths of an organic molecule with high precision.

Elastic Properties of Nano–Thin Films by Use of Atomic Force Acoustic Microscopy

2009 ◽  
Vol 1185 ◽  
Author(s):  
Malgorzata Kopycinska-Müller ◽  
Andre Striegler ◽  
Arnd Hürrich ◽  
Bernd Köhler ◽  
Norbert Meyendorf ◽  
...  
Keyword(s):  
Static Load ◽  
Silicon Oxide ◽  
Depth Resolution ◽  
Silicon Single Crystal ◽  
Acoustic Microscopy ◽  
Indentation Modulus ◽  
Atomic Force ◽  
Film Substrate ◽  
Non Destructive ◽  
Good Agreement

AbstractAtomic force acoustic microscopy (AFAM) is a non-destructive method able to determine the indentation modulus of a sample with high lateral and depth resolution. We used the AFAM technique to measure the indentation modulus of film-substrate systems Msam and then to extract the value of the indentation modulus of the film Mf. The investigated samples were films of silicon oxide thermally grown on silicon single crystal substrates by use of dry and wet oxidation methods. The thickness of the samples ranged from 7 nm to 28 nm as measured by ellipsometry. Our results clearly show that the values of Msam obtained for the film-substrate systems depended on the applied static load and the film thickness. The observed dependency was used to evaluate the indentation modulus of the film. The values obtained for Mf ranged from 77 GPa to 95 GPa and were in good agreement with values reported in the literature.

scholarly journals Probe Tips Functionalized with Colloidal Nanocrystal Tetrapods for High-Resolution Atomic Force Microscopy Imaging

Small ◽  
2008 ◽  
Vol 4 (12) ◽  
pp. 2123-2126 ◽  
Author(s):  
Concetta Nobile ◽  
Paul D. Ashby ◽  
P. James Schuck ◽  
Angela Fiore ◽  
Rosanna Mastria ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging

Atomic force microscopy cantilever simulation by finite element methods for quantitative atomic force acoustic microscopy measurements

2006 ◽  
Vol 21 (12) ◽  
pp. 3072-3079 ◽  
Author(s):  
F.J. Espinoza Beltrán ◽  
J. Muñoz-Saldaña ◽  
D. Torres-Torres ◽  
R. Torres-Martínez ◽  
G.A. Schneider
Keyword(s):  
Atomic Force Microscopy ◽  
Finite Element ◽  
Elastic Modulus ◽  
Finite Element Methods ◽  
Sample Surface ◽  
Acoustic Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Resonance Frequencies ◽  
Wide Range

Measurements of vibrational spectra of atomic force microscopy (AFM) microprobes in contact with a sample allow a good correlation between resonance frequencies shifts and the effective elastic modulus of the tip-sample system. In this work we use finite element methods for modeling the AFM microprobe vibration considering actual features of the cantilever geometry. This allowed us to predict the behavior of the cantilevers in contact with any sample for a wide range of effective tip-sample stiffness. Experimental spectra for glass and chromium were well reproduced for the numerical model, and stiffness values were obtained. We present a method to correlate the experimental resonance spectrum to the effective stiffness using realistic geometry of the cantilever to numerically model the vibration of the cantilever in contact with a sample surface. Thus, supported in a reliable finite element method (FEM) model, atomic force acoustic microscopy can be a quantitative technique for elastic-modulus measurements. Considering the possibility of tip-apex wear during atomic force acoustic microscopy measurements, it is necessary to perform a calibration procedure to obtain the tip-sample contact areas before and after each measurement.

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