Design of lfsr (linear feedback shift register) for low power test pattern generator

2017 ◽  
Author(s):  
R. Saraswathi ◽  
R. Manikandan
Keyword(s):  
Low Power ◽  
Test Pattern ◽  
Pattern Generator ◽  
Shift Register ◽  
Linear Feedback Shift Register ◽  
Linear Feedback ◽  
Power Test ◽  
Low Power Test ◽  
Feedback Shift Register

scholarly journals Implementation and Utilization of LBIST for 16 bit ALU

2019 ◽  
Vol 8 (10) ◽  
pp. 1915-1920
Keyword(s):  
Low Power ◽  
Test Pattern ◽  
Pattern Generator ◽  
Binary Sequences ◽  
Linear Feedback ◽  
Random Pattern ◽  
Power Test ◽  
Low Power Test ◽  
Power Pattern ◽  
Selection Of

This paper refers to implementation of Low Power Built-In-Self-Test (LBIST) and its utilization for testing of 16 bit ALU core. Low Power Test Pattern (LP) Generator is programmable and able to produce pseudorandom test patterns. The programmability feature brings in selectiveness in toggling levels of test patterns. This helps to increase the error coverage gradient. This low power pattern generator consists of a pseudo random pattern generator (PSPR) which can be a linear feedback shift register or ring generator. The test pattern generator allows the production of binary sequences by devices with that selected toggling rate is defined as ‘Preselected toggling’ (PRESTO) activity. In this methodology, controls for operation of generator are selected automatically. Selection of all the controls is made simple and accurate for the tuning. Using this method fault coverage of test pattern generator can be improved as well as pattern count ratio gets improved. The proposed low power test compression method helps to get predictable test patterns. Here preselected toggling based logic BIST is used to get flexible and accurate test patterns hence high quality testing is achieved here with integration of PRESTO and LBIST method.

A Low Power Test Pattern Generator for BIST

2010 ◽  
Vol E93-C (5) ◽  
pp. 696-702 ◽  
Author(s):  
Shaochong LEI ◽  
Feng LIANG ◽  
Zeye LIU ◽  
Xiaoying WANG ◽  
Zhen WANG
Keyword(s):  
Low Power ◽  
Test Pattern ◽  
Pattern Generator ◽  
Power Test ◽  
Low Power Test

scholarly journals LPTest: a Flexible Low-Power Test Pattern Generator

2009 ◽  
Vol 25 (6) ◽  
pp. 323-335 ◽  
Author(s):  
Meng-Fan Wu ◽  
Kai-Shun Hu ◽  
Jiun-Lang Huang
Keyword(s):  
Low Power ◽  
Test Pattern ◽  
Pattern Generator ◽  
Power Test ◽  
Low Power Test
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