Properties and Dynamics of Bulk Subgrains Probed In-Situ Using a Novel X-Ray Diffraction Method

In situ three-dimensional crystallographic orientation mapping in plastically-deformed polycrystalline iron is demonstrated using a modified three-dimensional x-ray diffraction method. This voxel-by-voxel measurement method enables the observation of intragranular orientation distribution. The experiment is performed using coarse-grained ferrite with a mean grain size of ~ 60 μm and an incident x-ray beam with a beam size of 20 μm × 20 μm. Grains averagely rotate approximately toward the <110> preferred orientation of body-centered cubic uniaxial tensile texture. Intragranular orientation distributions are spread as the tensile strain increases to 10.7 %. Furthermore, intragranular multidirectional rotations are observed in grains near the <100> and <111> corners in the inverse pole figure.

Download Full-text

In situ X-Ray Diffraction Method to Study Natural Gas Hydrates

Materials Science Forum ◽

10.4028/www.scientific.net/msf.278-281.335 ◽

1998 ◽

Vol 278-281 ◽

pp. 335-341 ◽

Cited By ~ 1

Author(s):

C.C. Tang ◽

M.C. Miller ◽

Robert J. Cernik ◽

S.M. Clark ◽

C.A. Koh ◽

...

Keyword(s):

Natural Gas ◽

Gas Hydrates ◽

Diffraction Method ◽

X Ray Diffraction ◽

X Ray ◽

Natural Gas Hydrates

Download Full-text

Evaluation of Tri-Axial Magnetostriction in Cube-Oriented Fe-Ga Single Crystal by Using X-Ray Diffraction Method

Materials Science Forum ◽

10.4028/www.scientific.net/msf.909.300 ◽

2017 ◽

Vol 909 ◽

pp. 300-305 ◽

Cited By ~ 1

Author(s):

Takehito Ikeuchi ◽

Akihiro Koyama ◽

Muneyuki Imafuku ◽

Shun Fujieda ◽

Yusuke Onuki ◽

...

Keyword(s):

Magnetic Field ◽

Single Crystal ◽

Volume Fraction ◽

Diffraction Method ◽

Diffraction Measurement ◽

Magnetic Field Direction ◽

Magnetic Domains ◽

X Ray Diffraction ◽

X Ray

We carried out in situ tri-axial magnetostriction analysis for cube-oriented Fe-18%Ga single crystal by X-ray diffraction measurement under magnetic field. Periodic change in tri-axial magnetostriction with applied magnetic field direction was clearly observed. However, those values in [100] and [010] directions were not equivalent. Theoretical calculation of magnetostriction considering domain structure revealed this is caused by the non-equivalent volume fraction of initial magnetic domains.

Download Full-text

Study of The Hydrothermal Synthesis of Gallium Phosphates Using in Situ Time-Resolved X-Ray Diffraction

MRS Proceedings ◽

10.1557/proc-547-63 ◽

1998 ◽

Vol 547 ◽

Cited By ~ 1

Author(s):

R.I. Walton ◽

T. Loiseau ◽

R.J. Francis ◽

D. O'Hare ◽

G. Férey

Keyword(s):

Kinetic Data ◽

Three Dimensional ◽

Diffraction Method ◽

Effect Of Temperature ◽

X Ray Diffraction ◽

Hydrothermal Conditions ◽

Time Resolved ◽

X Ray ◽

Phosphorus Source

AbstractThe hydrothermal crystallisation (130-180 °C) of three-dimensional open-framework gallium and aluminium oxyfluoro-phosphates with the ULM-3 and ULM-4 structures have been studied in situ for the first time. The in situ energy-dispersive X-ray diffraction method has allowed the formation of the crystalline products to be observed under hydrothermal conditions The integrated areas of the strongest Bragg reflections has allowed quantitative kinetic data to be extracted. The effect of temperature, phosphorus source, templating agent have been investigated. The nature of phosphorus source in the reaction mixture has been found to affect dramatically the course of reaction for certain combinations of amine and temperature. Previously unobserved transient crystalline phases have been seen during the production of ULM-3 gallium phosphates when P2O5 or polyphosphoric acid are used. The formation of these intermediates affects the kinetics of product growth. In the case of the aluminium ULM-3 materials reaction always proceeds via a crystalline intermediate whatever phosphorus source is used. The ULM-4 framework materials are found to always crystallise directly with no evidence for any intermediates. Kinetic data for each system have been modelled using standard solid-state chemistry expressions, and these calculations indicate the reactions to be diffusion controlled.

Download Full-text

Aging-time-resolvedin situmicrostructural investigation of tin films electroplated on copper substrates, applying two-dimensional-detector X-ray diffraction

Journal of Applied Crystallography ◽

10.1107/s0021889813024527 ◽

2013 ◽

Vol 46 (6) ◽

pp. 1645-1653 ◽

Cited By ~ 4

Author(s):

Jendrik Stein ◽

Udo Welzel ◽

Werner Huegel ◽

Sabine Blatt ◽

Eric Jan Mittemeijer

Keyword(s):

Diffraction Method ◽

Two Dimensional ◽

X Ray Diffraction ◽

Sn Whisker ◽

Grain Rotation ◽

Tin Films ◽

X Ray ◽

Layer Deposition ◽

Growth Phenomenon

Pure thin tin films, electroplated on copper substrates, were investigated byin situX-ray diffraction analysis during room-temperature aging, using a laboratory diffractometer equipped with a two-dimensional detector. Diffraction spots of single Sn grains in the Sn film could be observed and traced over time by using the diffraction method adopted. For the as-deposited specimens, striking changes of the Sn reflection spots, concerning their position and intensity, as well as sudden appearances and disappearances of additional diffraction spots, were observed. This could be ascribed to local microstructural changes in the films such as grain rotation, grain growth and grain dissolution. In contrast to the as-deposited specimens, so-called post-baked specimens (i.e.annealed at 423 K for 1 h after layer deposition) exhibited a stable microstructure. The results obtained are discussed with respect to their relevance for the Sn whisker-growth phenomenon.

Download Full-text