Safety and Reliability of Carbon Nanotubes in Nanoactuator Application

This paper presents a nanoactuator device as new model of the nanocomposite application. The carbon nanotube was incorporated in the polyvinylidne fluoride and trifluoroethylene P(VDF-TrFE) copolymer matrix. The P(VDF-TrFE) was chosen for its three characteristics which is ferroelectric, piezoelectric and pyroelectric to convert directly the electrical excitation to the mechanical motion (deflection). The SWCNT/P(VDF-TrFE) nanocomposite nanostructure is proposed as nanomaterial challenge to build a nanoactuator and drive systems in nanometer scale size. A deflection the SWCNT of about 10 picometer was found using the atomic force microscopy technique combined with lock-in-amplifier. And in this paper, we present a new method based on Optimal Safety Factors (OSF) in the context of the Reliability-Based Design Optimization (RBDO) analysis of of Carbon Nanotubes in Nanoactuator. We will underline also the different methods of the RBDO analysis and we highlight the advantage of our approach. Numerical results are given to illustrate the proposed method.

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Predicting the Reliability of Aligned Carbon Nanotube Bundles in Mechanical Structures

Applied Mechanics and Materials ◽

10.4028/www.scientific.net/amm.146.124 ◽

2011 ◽

Vol 146 ◽

pp. 124-129 ◽

Cited By ~ 1

Author(s):

Khalil El-Hami ◽

Abdelkhalak El Hami

Keyword(s):

Young’S Modulus ◽

Theoretical Study ◽

Young's Modulus ◽

Reliability Based Design Optimization ◽

Contact Mode ◽

Force Microscopy ◽

Nanotube Bundles ◽

Reliability Based Design ◽

Atomic Force ◽

Walled Carbon Nanotubes

We report new experimental and theoretical study of mechanical property of aligned and nonaligned (entangled) single walled carbon nanotubes (SWCNTs), and their effect on nanostructures. Experimentally, the contact mode atomic force microscopy cantilever tip is used to measure the Young’s modulus of aligned and nonaligned SWCNTs. The measured Young's modulus of aligned SWCNT bundles ranged between 1100 GPa (1.1 TPa) and 1300 GPa (1.3 TPa) with a relative uncertainty of 5 % whereas that of the entangled SWCNT bundles ranged between 500 GPa and 700 GPa. Young’s modulus increase with aligned SWCNT bundles and then increase their performance in nanostructure comparing with entangled SWCNT bundles. We put emphasis on the combination of physical modeling and reliability based design optimization of nanomaterials. After investigation, we could make suggestions such as how to improve the reliability of nanodevices and nanosystems, and how to reduce cost and economic rates.

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Nanomanipulation by atomic force microscopy of carbon nanotubes on a nanostructured surface

Surface Science ◽

10.1016/s0039-6028(03)00919-1 ◽

2003 ◽

Vol 543 (1-3) ◽

pp. 57-62 ◽

Cited By ~ 31

Author(s):

S. Decossas ◽

L. Patrone ◽

A.M. Bonnot ◽

F. Comin ◽

M. Derivaz ◽

...

Keyword(s):

Carbon Nanotubes ◽

Atomic Force Microscopy ◽

Nanostructured Surface ◽

Force Microscopy ◽

Atomic Force

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Effects of tip-nanotube interactions on atomic force microscopy imaging of carbon nanotubes

Nano Research ◽

10.1007/s12274-012-0203-8 ◽

2012 ◽

Vol 5 (4) ◽

pp. 235-247 ◽

Cited By ~ 13

Author(s):

Rouholla Alizadegan ◽

Albert D. Liao ◽

Feng Xiong ◽

Eric Pop ◽

K. Jimmy Hsia

Keyword(s):

Carbon Nanotubes ◽

Atomic Force Microscopy ◽

Microscopy Imaging ◽

Force Microscopy ◽

Atomic Force ◽

Atomic Force Microscopy Imaging

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Microwave Atomic Force Microscopy: Quantitative Measurement and Characterization of Electrical Properties on the Nanometer Scale

Applied Physics Express ◽

10.1143/apex.5.016602 ◽

2011 ◽

Vol 5 (1) ◽

pp. 016602 ◽

Cited By ~ 8

Author(s):

Lan Zhang ◽

Yang Ju ◽

Atsushi Hosoi ◽

Akifumi Fujimoto

Keyword(s):

Atomic Force Microscopy ◽

Electrical Properties ◽

Quantitative Measurement ◽

Nanometer Scale ◽

Force Microscopy ◽

Atomic Force

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In Situ Atomic Force Microscopy Tip-Induced Deformations and Raman Spectroscopy Characterization of Single-Wall Carbon Nanotubes

Nano Letters ◽

10.1021/nl3016347 ◽

2012 ◽

Vol 12 (8) ◽

pp. 4110-4116 ◽

Cited By ~ 13

Author(s):

P. T. Araujo ◽

N. M. Barbosa Neto ◽

H. Chacham ◽

S. S. Carara ◽

J. S. Soares ◽

...

Keyword(s):

Carbon Nanotubes ◽

Raman Spectroscopy ◽

Atomic Force Microscopy ◽

Single Wall Carbon Nanotubes ◽

Single Wall Carbon ◽

Force Microscopy ◽

Atomic Force

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Silica Nanoparticles to Polish Tooth Surfaces for Caries Prevention

Journal of Dental Research ◽

10.1177/154405910808701007 ◽

2008 ◽

Vol 87 (10) ◽

pp. 980-983 ◽

Cited By ~ 30

Author(s):

R.M. Gaikwad ◽

I. Sokolov

Keyword(s):

Silica Nanoparticles ◽

Ex Vivo ◽

Bacterial Attachment ◽

Nanometer Scale ◽

Human Teeth ◽

Cariogenic Bacteria ◽

Force Microscopy ◽

Atomic Force ◽

Tooth Surfaces ◽

Scale Roughness

Although silica particles have been used for tooth polishing, polishing with nanosized particles has not been reported. Here we hypothesize that such polishing may protect tooth surfaces against the damage caused by cariogenic bacteria, because the bacteria can be easily removed from such polished surfaces. This was tested on human teeth ex vivo. The roughness of the polished surfaces was measured with atomic force microscopy (AFM). A considerably lower nanometer-scale roughness was obtained when silica nanoparticles were used to polish the tooth surfaces, as compared with conventional polishing pastes. Bacterial attachment to the dental surfaces was studied for Streptococcus mutans, the most abundant cariogenic bacteria. We demonstrated that it is easier to remove bacteria from areas polished with silica nanoparticles. The results demonstrate the advantage of using silica nanoparticles as abrasives for tooth polishing.

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Measurement of electrostatic tip–sample interactions by time-domain Kelvin probe force microscopy

Beilstein Journal of Nanotechnology ◽

10.3762/bjnano.11.76 ◽

2020 ◽

Vol 11 ◽

pp. 911-921

Author(s):

Christian Ritz ◽

Tino Wagner ◽

Andreas Stemmer

Keyword(s):

Frequency Shift ◽

Surface Potential ◽

Electrostatic Force ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Atomic Force ◽

Alternative Approach ◽

Dc Component ◽

Lock In

Kelvin probe force microscopy is a scanning probe technique used to quantify the local electrostatic potential of a surface. In common implementations, the bias voltage between the tip and the sample is modulated. The resulting electrostatic force or force gradient is detected via lock-in techniques and canceled by adjusting the dc component of the tip–sample bias. This allows for an electrostatic characterization and simultaneously minimizes the electrostatic influence onto the topography measurement. However, a static contribution due to the bias modulation itself remains uncompensated, which can induce topographic height errors. Here, we demonstrate an alternative approach to find the surface potential without lock-in detection. Our method operates directly on the frequency-shift signal measured in frequency-modulated atomic force microscopy and continuously estimates the electrostatic influence due to the applied voltage modulation. This results in a continuous measurement of the local surface potential, the capacitance gradient, and the frequency shift induced by surface topography. In contrast to conventional techniques, the detection of the topography-induced frequency shift enables the compensation of all electrostatic influences, including the component arising from the bias modulation. This constitutes an important improvement over conventional techniques and paves the way for more reliable and accurate measurements of electrostatics and topography.

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