Research for an Automatic Measurement System for Centroidal Deviation of Projectiles Based on Three Points Method

2010 ◽  
Vol 26-28 ◽  
pp. 1-4
Author(s):  
Guo Nian Yao ◽  
Jun Hu Wei ◽  
Hao Sun ◽  
Guo Ji Sun

In order to improve the measuring accuracy and efficiency of projectiles’ centroidal deviation, the working principle and the relevant calculation formulae based on three points method are described in detail, the main factors affecting precision are discussed and quantitative analysis on precision of the equipment is made. The measuring platform with automatic leveling and locating based on the arc locating and so on are put forward to reduce error. The experimental results show that the system can satisfy the requirement for measuring with high accuracy. The equipment plays a very important role in testing ordnance, especially for measuring regular projectiles.

2020 ◽  
Vol 19 (4) ◽  
pp. 85-94
Author(s):  
T.M. Bormotova ◽  
◽  
Yu.N. Mazaev ◽  
O.V. Yakovlev ◽  

based on a comprehensive analysis of content, posted text and video arrays of publications in Internet sources and social media of the Samara region, the main factors affecting the formation of public opinion about the police are considered. Quantitative analysis of the publication arrays revealed the tone of meaningful interpretation of numerical patterns of information about the activities of the regional police. Recommendations aimed at improving the attitude of the population to the work of the regional police are formulated.


1994 ◽  
Vol 38 ◽  
pp. 47-57 ◽  
Author(s):  
D. L. Bish ◽  
Steve. J. Chipera

Abstract Accuracy, or how well a measurement conforms to the true value of a parameter, is important in XRD analyses in three primary areas, 1) 26 position or d-spacing; 2) peak shape; and 3) intensity. Instrumental factors affecting accuracy include zero-point, axial-divergence, and specimen- displacement errors, step size, and even uncertainty in X-ray wavelength values. Sample factors affecting accuracy include specimen transparency, structural strain, crystallite size, and preferred orientation effects. In addition, a variety of other sample-related factors influence the accuracy of quantitative analyses, including variations in sample composition and order/disorder. The conventional method of assessing accuracy during experimental diffractometry measurements is through the use of certified internal standards. However, it is possible to obtain highly accurate d-spacings without an internal standard using a well-aligned powder diffractometer coupled with data analysis routines that allow analysis of and correction for important systematic errors. The first consideration in such measurements is the use of methods yielding precise peak positions, such as profile fitting. High accuracy can be achieved if specimen-displacement, specimen- transparency, axial-divergence, and possibly zero-point corrections are included in data analysis. It is also important to consider that most common X-ray wavelengths (other than Cu Kα1) have not been measured with high accuracy. Accuracy in peak-shape measurements is important in the separation of instrumental and sample contributions to profile shape, e.g., in crystallite size and strain measurements. The instrumental contribution must be determined accurately using a standard material free from significant sample-related effects, such as NIST SRM 660 (LaB6). Although full-pattern fitting methods for quantitative analysis are available, the presence of numerous systematic errors makes the use of an internal standard, such as a-alumina mandatory to ensure accuracy; accuracy is always suspect when using external-standard, constrained-total quantitative analysis methods. One of the most significant problems in quantitative analysis remains the choice of representative standards. Variations in sample chemistry, order-disorder, and preferred orientation can be accommodated only with a thorough understanding of the coupled effects of all three on intensities. It is important to recognize that sample preparation methods that optimize accuracy for one type of measurement may not be appropriate for another. For example, the very fine crystallite size that is optimum for quantitative analysis is unnecessary and can even be detrimental in d-spacing and peak shape measurements.


2014 ◽  
Vol 643 ◽  
pp. 233-236
Author(s):  
Jing Bo Xu ◽  
Jian Song Zhang ◽  
Hong Tao Yu

This paper introduce the thought of USB interface application, an automatic measurement system is as an example. The PC control system of automatic measurement by the Labview software programming, then control relay, and control the work state of the HP3. It shows that the design of USB interface application system is realized by using labview programming easy and high efficiency.


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