Surface Changes after Silver Formation on a Precoated Surface with Polyaniline for Textile Metallization

Silver (Ag) deposition was performed on a polyaniline-precoated surface for textile metallization. Polyaniline was utilized as an intermediate layer on fabrics to facilitate Ag formation. Inductivily coupled plasma atomic emission spectgrometry (ICP-AES) was used to monitor the content of metallic elements on Ag-laden polyaniline layers prepared under different conditions of polyaniline fomation. The surface modification of the samples before and after Ag plating was characterized by attenuated total reflection Fourier transform infrared spectroscopy (ATR-FTIR), X-ray photoelectron spectroscopy (XPS), scanning electron microscope (SEM) and atomic force microscopy (AFM).

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Characterization of X-ray irradiated graphene oxide coatings using X-ray diffraction, X-ray photoelectron spectroscopy, and atomic force microscopy

Powder Diffraction ◽

10.1017/s0885715613000109 ◽

2013 ◽

Vol 28 (2) ◽

pp. 68-71 ◽

Cited By ~ 40

Author(s):

Thomas N. Blanton ◽

Debasis Majumdar

Keyword(s):

Atomic Force Microscopy ◽

Graphene Oxide ◽

Photoelectron Spectroscopy ◽

High Energy ◽

X Ray Diffraction ◽

Carbon Phase ◽

X Ray ◽

Force Microscopy ◽

Atomic Force ◽

Before And After

In an effort to study an alternative approach to make graphene from graphene oxide (GO), exposure of GO to high-energy X-ray radiation has been performed. X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and atomic force microscopy (AFM) have been used to characterize GO before and after irradiation. Results indicate that GO exposed to high-energy radiation is converted to an amorphous carbon phase that is conductive.

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Synthesis and Characterization of Ag2S Layers Formed on Polypropylene

Journal of Chemistry ◽

10.1155/2013/987879 ◽

2013 ◽

Vol 2013 ◽

pp. 1-11 ◽

Cited By ~ 24

Author(s):

Valentina Krylova ◽

Nijolė Dukštienė

Keyword(s):

Photoelectron Spectroscopy ◽

Precursor Solution ◽

Attenuated Total Reflection ◽

Thiamine Hydrochloride ◽

X Ray Diffraction ◽

Spectra Analysis ◽

X Ray ◽

Force Microscopy ◽

Atomic Force ◽

Silver Sulphide

Silver sulphide, Ag2S, layers on the surface of polypropylene (PP) film was formed by chemical bath deposition method (CBD). Film samples were characterised by X-ray photoelectron spectroscopy (XPS), attenuated total reflection Fourier transform infrared (ATR-FTIR) spectroscopy, scanning electron microscopy (SEM), atomic force microscopy (AFM), and X-ray diffraction analysis (XRD). The surface morphology, texture, and uniformity of the silver sulphide layers were formed on PP surface dependent on the number of polymer immersions in the precursor solution. XPS analysis confirmed that on the surface of the polypropylene film, a layer of Ag2S was formed. ATR-FTIR and FTIR spectra analysis showed that the surface of Ag2S layers is slightly oxidized. All prepared layers gave multiple XRD reflections, corresponding to monoclinic Ag2S (acanthite). The Ag2S layer on polypropylene was characterized as an Ag+ion selective electrode in terms of potential response and detection limit. The electrode was also tested as an end-point electrode for argentometric titration of thiamine hydrochloride.

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Differences in nano-topography and tribochemistry of ZDDP tribofilms from variations in contact configuration with steel and DLC surfaces

Friction ◽

10.1007/s40544-021-0491-7 ◽

2021 ◽

Author(s):

Lucija Čoga ◽

Somayeh Akbari ◽

Janez Kovač ◽

Mitjan Kalin

Keyword(s):

Photoelectron Spectroscopy ◽

Attenuated Total Reflection ◽

Surface Films ◽

Zinc Dialkyldithiophosphate ◽

X Ray ◽

Force Microscopy ◽

Atomic Force ◽

Contact Configuration ◽

Crucial Effect ◽

Macro Scale

AbstractIn this work, we evaluated the effect of the counter-body material (the same or dissimilar) and contact configuration (moving or stationary body), at similar contact tribological conditions, on the tribochemical and nanotopography characteristics of adsorbed surface films. Zinc dialkyldithiophosphate (ZDDP), the best performing anti-wear additive, was used in self-mated steel/steel and DLC/DLC contacts, which were compared with mixed steel/DLC and DLC/steel contacts in 1-h and 6-h sliding tests. The macroscale (tribometer) and nanoscale (atomic force microscopy) friction, thickness, topography, and chemical (attenuated total reflection-Fourier transform infrared spectroscopy and X-ray photoelectron spectroscopy) properties of the tribofilms were studied. The results revealed unexpectedly large differences in all the studied tribofilm parameters; this is because all the tribofilms are completely different; this includes the chemical composition, which is known to have a crucial effect on the nano- and macro-scale tribological properties. These results clearly demonstrate that the surface material, additives, and common contact operating parameters, that is, pressure, velocity, and temperature, crucially affect the ZDDP tribofilm as well as the position of the moving or stationary surface within the contact, and the material of the moving/stationary bodies.

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Surface Modification of ZnxCd1-x Te Due to Low Energy Ion Sputtering

MRS Proceedings ◽

10.1557/proc-386-327 ◽

1995 ◽

Vol 386 ◽

Author(s):

S. Vijayalakshmi ◽

K.-T. Chen ◽

M. A. George ◽

A. Burger ◽

W. E. Collins

Keyword(s):

Atomic Force Microscopy ◽

Photoelectron Spectroscopy ◽

Infrared Detectors ◽

Lattice Mismatch ◽

Low Energy ◽

Ion Sputtering ◽

X Ray ◽

Force Microscopy ◽

Atomic Force ◽

Before And After

ABSTRACTZnxCd1-xTe is a widely used substrate for the epitaxial growth of HgCdTe, which is used in infrared detectors. Results of the effect of sputtering of ZnxCd1-xTe single crystals with low energy Ar beam are reported in this paper. X-ray photoelectron spectroscopy (XPS) and photoluminescence (PL) techniques were used to measure the concentration of Zn in these crystals. Selective sputtering of Zn atoms has been observed from freshly cleaved crystals using XPS studies. Sputtering is a common method of cleaning ZnxCd1-xTe crystals in their device preparation and our studies show that this method of cleaning alters the surface which may introduce lattice mismatch on the surface. Surface morphology before and after cleaving the crystals is studied using Atomic Force Microscopy (AFM).

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Grain Boundary Diffusion in NiFe/Ag Bilayer Thin Films

MRS Proceedings ◽

10.1557/proc-343-217 ◽

1994 ◽

Vol 343 ◽

Cited By ~ 2

Author(s):

M. Gall ◽

J.G. Pellerin ◽

P.S. Ho ◽

K.R. Coffey ◽

J.K. Howard

Keyword(s):

Grain Boundary ◽

Photoelectron Spectroscopy ◽

Annealing Temperature ◽

Boundary Diffusion ◽

Grain Boundary Diffusion ◽

X Ray Diffraction ◽

X Ray ◽

Force Microscopy ◽

Atomic Force ◽

Before And After

ABSTRACTX-ray photoelectron spectroscopy (XPS) has been used to investigate grain boundary diffusion of Ag through 250 Å thick Ni80Fe20 (permalloy) films in the temperature range of 375 to 475°C. Grain boundary diffusivities were determined by modeling the accumulation of Ag on Ni80Fe20 surfaces as a function of time at fixed annealing temperature. The grain boundary diffusivity of Ag through Ni80Fe20 is characterized by a diffusion coefficient prefactor, D0,gb, of 0.9 cm2/sec and an activation energy, Ea,gb, of 2.2 eV. The Ni80Fe20 film microstructure has been investigated before and after annealing by atomic force microscopy and x-ray diffraction. The microstructure of Ni80Fe20 deposited on Ag underlayers remained relatively unchanged upon annealing.

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STUDY OF THE MICROSTRUCTURE AND COMPOSITION OF TIN DIOXIDE LAYERS MODIFIED BY SILVER NANOPARTICLES

Physical and Chemical Aspects of the Study of Clusters Nanostructures and Nanomaterials ◽

10.26456/pcascnn/2021.13.447 ◽

2021 ◽

pp. 447-456

Author(s):

Замир Валериевич Шомахов ◽

Светлана Сергеевна Налимова ◽

Рустам Мухамедович Калмыков ◽

Кирилл Аубекеров ◽

Вячеслав Алексеевич Мошников

Keyword(s):

Silver Nanoparticles ◽

Gas Sensors ◽

Photoelectron Spectroscopy ◽

Tin Dioxide ◽

Surface Composition ◽

Metallic Silver ◽

X Ray ◽

Force Microscopy ◽

Atomic Force ◽

Before And After

Слои диоксида олова синтезированы гидротермальным методом из водного раствора SnF. Наночастицы серебра осаждены на поверхность полученных слоев методом фотовосстановления. Проведено исследование морфологии поверхности образцов методом атомно-силовой микроскопии. Размер наночастиц серебра зависит от концентрации раствора AgNO, используемого для проведения реакции фотовосстановления. При синтезе из раствора с концентрацией 0,02 М размер полученных наночастиц составляет варьируется от 10 до 100 нм, при увеличении концентрации раствора в два раза размер наночастиц составляет порядка 100 нм. С помощью рентгеновской фотоэлектронной спектроскопии изучен состав поверхности слоев до и после осаждения наночастиц серебра. При выбранных условиях синтеза формируется слой диоксида олова без посторонних включений, и происходит осаждение металлического серебра. Химический сдвиг пиков олова и кислорода после осаждения наночастиц серебра свидетельствует об обмене электронами между оловом и серебром. Полученные слои представляют интерес для применения в области полупроводниковых адсорбционных газовых сенсоров. Tin dioxide layers were synthesized by hydrothermal method from an aqueous solution of SnF. Silver nanoparticles were deposited on the surface of the obtained layers by the photoreduction method. The surface morphology of the samples was studied by atomic force microscopy. The size of the silver nanoparticles depends on the concentration of the AgNO solution used for the photoreduction reaction. When synthesized from 0,02 M solution with a concentration of, the size of the nanoparticles varies from 10 to 100 nm, when the concentration of the solution is doubled, the size of the nanoparticles is about 100 nm. The surface composition of the layers before and after the deposition of silver nanoparticles was studied using the X-ray photoelectron spectroscopy. It was shown that a layer of the tin dioxide is formed without external inclusions, and metallic silver is deposited. The chemical shift of the peaks of tin and oxygen after the deposition of silver nanoparticles indicates the exchange of electrons between tin and silver. The synthesized layers are of interest for application in the field of semiconductor adsorption gas sensors.

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Investigation of the Effect of Uv-Assisted Oxidation and Nitridation of Hafnium Metal Films

MRS Proceedings ◽

10.1557/proc-780-y5.5 ◽

2003 ◽

Vol 780 ◽

Author(s):

C. Essary ◽

V. Craciun ◽

J. M. Howard ◽

R. K. Singh

Keyword(s):

Uv Radiation ◽

Photoelectron Spectroscopy ◽

Grazing Angle ◽

X Ray Diffraction ◽

Metal Thin Films ◽

X Ray ◽

Force Microscopy ◽

Si Substrates ◽

Atomic Force ◽

Silicon Interface

AbstractHf metal thin films were deposited on Si substrates using a pulsed laser deposition technique in vacuum and in ammonia ambients. The films were then oxidized at 400 °C in 300 Torr of O2. Half the samples were oxidized in the presence of ultraviolet (UV) radiation from a Hg lamp array. X-ray photoelectron spectroscopy, atomic force microscopy, and grazing angle X-ray diffraction were used to compare the crystallinity, roughness, and composition of the films. It has been found that UV radiation causes roughening of the films and also promotes crystallization at lower temperatures.Furthermore, increased silicon oxidation at the interface was noted with the UVirradiated samples and was shown to be in the form of a mixed layer using angle-resolved X-ray photoelectron spectroscopy. Incorporation of nitrogen into the film reduces the oxidation of the silicon interface.

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Curcumin delivery by modified biosourced carbon-based nanoparticles

Nanomedicine ◽

10.2217/nnm-2021-0225 ◽

2022 ◽

Author(s):

Hossein Danafar ◽

Marziyeh Salehiabar ◽

Murat Barsbay ◽

Hossein Rahimi ◽

Mohammadreza Ghaffarlou ◽

...

Keyword(s):

Photoelectron Spectroscopy ◽

Free System ◽

X Ray ◽

Force Microscopy ◽

Atomic Force ◽

Transmission Electron ◽

Good Biocompatibility ◽

Drug Free ◽

Mcf 7 ◽

Carbon Based

Aim: To prepare a novel hybrid system for the controlled release and delivery of curcumin (CUR). Methods: A method for the ultrasound-assisted fabrication of protein-modified nanosized graphene oxide-like carbon-based nanoparticles (CBNPs) was developed. After being modified with bovine serum albumin (BSA), CUR was loaded onto the synthesized hybrid (labeled CBNPs@BSA–CUR). The structure and properties of the synthesized nanoparticles were elucidated using transmission electron microscopy (TEM), atomic force microscopy (AFM), ultraviolet-visible spectroscopy (UV-Vis), Fourier-transform infrared spectroscopy (FTIR) and x-ray photoelectron spectroscopy (XPS) methods. Results: CBNPs@BSA–CUR showed pH sensitivity and were calculated as controlled CUR release behavior. The drug-free system exhibited good biocompatibility and was nontoxic. However, CBNPs@BSA–CUR showed acceptable antiproliferative ability against MCF-7 breast cancer cells. Conclusion: CBNPs@BSA–CUR could be considered a highly promising nontoxic nanocarrier for the delivery of CUR with good biosafety.

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Effect of Surface Chemistry on Ruthenium Wet Etching

Solid State Phenomena ◽

10.4028/www.scientific.net/ssp.314.302 ◽

2021 ◽

Vol 314 ◽

pp. 302-306

Author(s):

Quoc Toan Le ◽

E. Kesters ◽

M. Doms ◽

Efrain Altamirano Sánchez

Keyword(s):

Surface Roughness ◽

Photoelectron Spectroscopy ◽

Etching Rate ◽

Wet Etching ◽

X Ray ◽

Force Microscopy ◽

Metal Free ◽

Atomic Force ◽

Different Types ◽

Effect Of Surface

Different types of ALD Ru films, including as-deposited, annealed Ru, without and with a subsequent CMP step, were used for wet etching study. With respect to the as-deposited Ru, the etching rate of the annealed Ru film in metal-free chemical mixtures (pH = 7-9) was found to decrease substantially. X-ray photoelectron spectroscopy characterization indicated that this behavior could be explained by the presence of the formation of RuOx (x = 2,3) caused by the anneal. A short CMP step applied to the annealed Ru wafer removed the surface RuOx, at least partially, resulting in a significant increase of the etching rate. The change in surface roughness was quantified using atomic force microscopy.

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