High Frequency Dielectric Permittivity Measurement of Dielectric Layer of MLCC Using Non-Contact Probe

2007 ◽  
Vol 350 ◽  
pp. 243-246
Author(s):  
Hirofumi Kakemoto ◽  
Jianyong Li ◽  
Takakiyo Harigai ◽  
Song Min Nam ◽  
Satoshi Wada ◽  
...  
Keyword(s):  
Dielectric Permittivity ◽  
Cross Sections ◽  
High Frequency ◽  
Permittivity Measurement ◽  
Data Process ◽  
Direct Observations ◽  
Contact Probe ◽  
Ceramic Capacitor ◽  
Microwave Probe ◽  
Reflection Intensity

Direct observations for high frequency microscopic dielectric distributions in cross sections of a multi-layer ceramic capacitor were carried out using non-contact type microwave probe. The measured data were imaged from the raw data and rounding data process. Using microwave reflection intensity mappings from cross sections of multi-layer ceramic capacitor, the dielectric permittivity distribution in micro-region of a multi-layer ceramic capacitor was measured at room temperature. The spatial resolution was experimentally estimated to be about 10 μm from mappings of the dielectric and inner electrode layers in a multi-layer ceramic capacitor.

Dielectric Permittivity Mapping up to 9GHz Region with Non-contact Microwave Probe for Ferroelectric Device

2006 ◽  
Vol 966 ◽  
Author(s):  
Hirofumi Kakemoto ◽  
Jianyong Li ◽  
Takakiyo Harigai ◽  
Song-Min Nam ◽  
Satoshi Wada ◽  
...  
Keyword(s):  
Dielectric Permittivity ◽  
Cross Sections ◽  
High Frequency ◽  
Room Temperature ◽  
Measured Data ◽  
Data Process ◽  
Direct Observations ◽  
Ceramic Capacitor ◽  
Microwave Probe ◽  
Reflection Intensity

ABSTRACTDirect observations for high frequency microscopic dielectric distributions in cross sections of a multi-layer ceramic capacitor were carried out using non-contact type microwave probe. The measured data were imaged from the raw data and rounding data process. Using microwave reflection intensity mappings from cross sections of multi-layer ceramic capacitor, the dielectric permittivity distribution in micro-region of a multi-layer ceramic capacitor was measured at room temperature. The spatial resolution was experimentally estimated to be about 10 μm from mappings of the dielectric and inner electrode layers in a multi-layer ceramic capacitor.

High Frequency Dielectric Permittivity Measurement of Dielectric Layer of MLCC Using Non-Contact Probe

2007 ◽  
pp. 243-246
Author(s):  
Hirofumi Kakemoto ◽  
Jianyong Li ◽  
Takakiyo Harigai ◽  
Song Min Nam ◽  
Satoshi Wada ◽  
...  
Keyword(s):  
Dielectric Permittivity ◽  
Dielectric Layer ◽  
High Frequency ◽  
Permittivity Measurement ◽  
Contact Probe

High Frequency Dielectric Mapping Using Un-Contact Probe for Dielectric Materials

2006 ◽  
Vol 320 ◽  
pp. 189-192
Author(s):  
Hirofumi Kakemoto ◽  
Song Min Nam ◽  
Satoshi Wada ◽  
Takaaki Tsurumi
Keyword(s):  
Dielectric Permittivity ◽  
Single Crystals ◽  
High Frequency ◽  
Room Temperature ◽  
Dielectric Materials ◽  
Minimum Point ◽  
Electromagnetic Simulation ◽  
Contact Probe ◽  
The Difference ◽  
Reflection Intensity

The microwave reflection intensity was measured at room temperature for Cu-plate, Al2O3 and SrTiO3 single crystals using a un-contact probe as a function of distance between sample and probe. The difference of reflection intensity for Cu-plate, Al2O3 and SrTiO3 single crystals was observed in the region where the distance of 0.2mm between sample and probe, and it was caused from dielectric permittivities of samples. The reflection coefficient of sample was estimated in comparison with results of electromagnetic simulation using finite differential time domain method. The reflection intensity for Cu-plate, Al2O3 and SrTiO3 single crystals was transformed to dielectric permittivity at reflection intensity minimum point. The dielectric permittivity mapping was also examined at reflection intensity minimum point.

scholarly journals Sintering, Microstructure, and Dielectric Properties of Copper Borates for High Frequency LTCC Applications

Materials ◽  
2021 ◽  
Vol 14 (14) ◽  
pp. 4017
Author(s):  
Dorota Szwagierczak ◽  
Beata Synkiewicz-Musialska ◽  
Jan Kulawik ◽  
Norbert Pałka
Keyword(s):  
Dielectric Properties ◽  
Dielectric Permittivity ◽  
High Frequency ◽  
Ceramic Materials ◽  
Sintering Behavior ◽  
Terahertz Time Domain Spectroscopy ◽  
Very High Frequency ◽  
X Ray ◽  
Low Dielectric ◽  
Very High

New ceramic materials based on two copper borates, CuB2O4 and Cu3B2O6, were prepared via solid state synthesis and sintering, and characterized as promising candidates for low dielectric permittivity substrates for very high frequency circuits. The sintering behavior, composition, microstructure, and dielectric properties of the ceramics were investigated using a heating microscope, X-ray diffractometry, scanning electron microscopy, energy dispersive spectroscopy, and terahertz time domain spectroscopy. The studies revealed a low dielectric permittivity of 5.1–6.7 and low dielectric loss in the frequency range 0.14–0.7 THz. The copper borate-based materials, owing to a low sintering temperature of 900–960 °C, are suitable for LTCC (low temperature cofired ceramics) applications.

Wide-Temperature-Range Dielectric Permittivity Measurement under High Pressure

2017 ◽  
Vol 34 (4) ◽  
pp. 040701
Author(s):  
Zhen Yuan ◽  
Jin-Long Zhu ◽  
Shao-Min Feng ◽  
Chang-Chun Wang ◽  
Li-Juan Wang ◽  
...  
Keyword(s):  
High Pressure ◽  
Dielectric Permittivity ◽  
Wide Temperature Range ◽  
Temperature Range ◽  
Permittivity Measurement

Enhanced Vibration Control of Ultrasonic Tooling Using Finite Element Analysis

1991 ◽  
Author(s):  
Kevin O’Shea
Keyword(s):  
Finite Element Analysis ◽  
Finite Element ◽  
Cross Sections ◽  
High Frequency ◽  
Excellent Correlation ◽  
Accurate Identification ◽  
Element Analysis ◽  
Optimum Configuration ◽  
Slot Length ◽  
Design Variables

Abstract The use of finite element analysis (FEA) in high frequency (20–40 kHz), high power ultrasonics to date has been limited. Of paramount importance to the performance of ultrasonic tooling (horns) is the accurate identification of pertinent modeshapes and frequencies. Ideally, the ultrasonic horn will vibrate in a purely axial mode with a uniform amplitude of vibration. However, spurious resonances can couple with this fundamental resonance and alter the axial vibration. This effect becomes more pronounced for ultrasonic tools with larger cross-sections. The current study examines a 4.5″ × 6″ cross-section titanium horn which is designed to resonate axially at 20 kHz. Modeshapes and frequencies from 17–23 kHz are examined experimentally and using finite element analysis. The effect of design variables — slot length, slot width, and number of slots — on modeshapes and frequency spacing is shown. An optimum configuration based on the finite element results is prescribed. The computed results are compared with actual prototype data. Excellent correlation between analytical and experimental data is found.

Dielectric Permittivity Measurement of Kraft Paper by the Resonant Ring Method

2019 ◽  
pp. 271-279
Author(s):  
Luis A. Morocho ◽  
Leonidas B. Peralta ◽  
Luis F. Guerrero-Vásquez ◽  
Jorge O. Ordoñez-Ordoñez ◽  
Juan P. Bermeo ◽  
...  
Keyword(s):  
Dielectric Permittivity ◽  
Permittivity Measurement ◽  
Kraft Paper ◽  
Ring Method

Shallow subsurface mapping by electromagnetic sounding in the 300 kHz to 30 MHz range: Model studies and prototype system assessment

Geophysics ◽  
1994 ◽  
Vol 59 (8) ◽  
pp. 1201-1210 ◽  
Author(s):  
Duff C. Stewart ◽  
Walter L. Anderson ◽  
Thomas P. Grover ◽  
Victor F. Labson
Keyword(s):  
Dielectric Permittivity ◽  
High Frequency ◽  
Low Frequency ◽  
Computer Programs ◽  
Thin Layers ◽  
Depth Range ◽  
Frequency Range ◽  
Model Studies ◽  
New Instrument ◽  
Displacement Currents

A new instrument designed for frequency‐domain sounding in the depth range 0–10 m uses short coil spacings of 5 m or less and a frequency range of 300 kHz to 30 MHz. In this frequency range, both conduction currents (controlled by electrical conductivity) and displacement currents (controlled by dielectric permittivity) are important. Several surface electromagnetic survey systems commonly used (generally with frequencies less than 60 kHz) are unsuitable for detailed investigation of the upper 5 m of the earth or, as with ground‐penetrating radar, are most effective in relatively resistive environments. Most computer programs written for interpretation of data acquired with the low‐frequency systems neglect displacement currents, and are thus unsuited for accurate high‐frequency modeling and interpretation. New forward and inverse computer programs are described that include displacement currents in layered‐earth models. The computer programs and this new instrument are used to evaluate the effectiveness of shallow high‐frequency soundings based on measurement of the tilt angle and the ellipticity of magnetic fields. Forward model studies indicate that the influence of dielectric permittivity provides the ability to resolve thin layers, especially if the instrument frequency range can be extended to 50 MHz. Field tests of the instrument and the inversion program demonstrate the potential for detailed shallow mapping wherein both the resistivity and the dielectric permittivity of layers are determined. Although data collection and inversion are much slower than for low‐frequency methods, additional information is obtained inasmuch as there usually is a permittivity contrast as well as a resistivity contrast at boundaries between different materials. Determination of dielectric permittivity is particularly important for hazardous waste site characterization because the presence of some contaminants may have little effect on observed resistivity but a large effect on observed permittivity.

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