An X-Ray Diffraction Method to Determine Stress at Constant Penetration/Information Depth

2006 ◽  
Vol 524-525 ◽  
pp. 13-18 ◽  
Author(s):  
A. Kumar ◽  
U. Welzel ◽  
M. Wohlschlögel ◽  
W. Baumann ◽  
Eric J. Mittemeijer
Keyword(s):  
Penetration Depth ◽  
Stress Gradient ◽  
Diffraction Method ◽  
Nickel Layer ◽  
X Ray Diffraction ◽  
X Ray ◽  
Stress Measurements ◽  
Information Depth ◽  
Depth Control ◽  
Sputter Deposited

A rigorous strategy for (X-ray) diffraction stress measurements at fixed penetration/information depths is described. Thereby errors caused by lack of penetration-depth control in traditional (X-ray) diffraction (sin2ψ) measurements are annulled. The ranges of accessible penetration/information depths and experimental aspects are briefly discussed. The power of the method is illustrated by the analysis of an only small stress gradient in a sputter-deposited nickel layer.

A method for the non-destructive analysis of gradients of mechanical stresses by X-ray diffraction measurements at fixed penetration/information depths

2006 ◽  
Vol 39 (5) ◽  
pp. 633-646 ◽  
Author(s):  
A. Kumar ◽  
U. Welzel ◽  
E. J. Mittemeijer
Keyword(s):  
Nickel Layer ◽  
Depth Gradient ◽  
X Ray Diffraction ◽  
X Ray ◽  
Stress Measurements ◽  
Information Depth ◽  
Depth Control ◽  
Destructive Analysis ◽  
Sputter Deposited ◽  
Non Destructive

A rigorous measurement strategy for (X-ray) diffraction stress measurements at fixed penetration/information depths has been developed. Thereby errors caused by lack of penetration-depth control in traditional (X-ray) diffraction (sin2ψ) measurements have been annulled. The range of accessible penetration/information depths and experimental aspects have been discussed. As a practical example, the depth gradient of the state of residual stress in a sputter-deposited nickel layer of 2 µm thickness has been investigated by diffraction stress measurements with uncontrolled penetration/information depth and two controlled penetration/information depths corresponding to about one quarter and one tenth of the layer thickness, respectively. The decrease of the planar tensile stress in the direction towards the surface could be well established quantitatively.

Depth Profiling Biaxial Stresses in Sputter Deposited Molybdenum Films; Use of the Cos2φ Method

1995 ◽  
Vol 39 ◽  
pp. 363-370
Author(s):  
B. L. Ballard ◽  
P. K. Predecki ◽  
T. R. Watkins ◽  
K. J. Kozaczek ◽  
D. N. Braski ◽  
...  
Keyword(s):  
Penetration Depth ◽  
Stress Gradient ◽  
Depth Profiling ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
Columnar Zone ◽  
X Ray ◽  
Depth Profiles ◽  
Oxygen Gradient ◽  
Sputter Deposited

Depth profiles of intrinsic in-plane, biaxial stresses were obtained as a function of τ, the 1/e penetration depth, in a 1.0 um thick planar d. c. magentron sputter deposited molybdenum film using asymmetric grazing incidence x-ray diffraction (GIXD). τ was varied between 20 and 276 Å. The stresses σ11 and σ22 were characterized in the directions parallel and perpendicular to the long axis of the cathode respectively using a cos2φ method. The results show that starting from τ=17Å, σ11 and σ22 are compressive and become rapidly more compressive with a minimum at τ ∼ 20 - 40 Å thereafter increasing gradually toward tensile values. The reasons for the shape of the stress gradient are not well understood but may be related to the relaxation of the stresses at the tops of the columnar Zone T-type microstructure and to the oxygen gradient in the film.

An X-Ray Diffraction Method to Determine Stress at Constant Penetration/Information Depth

2006 ◽  
pp. 13-18
Author(s):  
A. Kumar ◽  
U. Welzel ◽  
M. Wohlschlögel ◽  
W. Baumann ◽  
Eric J. Mittemeijer
Keyword(s):  
Diffraction Method ◽  
X Ray Diffraction ◽  
X Ray ◽  
Information Depth

Structure And Mechanical Properties Of Reactive Sputter Deposited Tin/Tan Multilayered Films

1997 ◽  
Vol 505 ◽  
Author(s):  
W.-H. Soe ◽  
T. Kitagaki ◽  
H. Ueda ◽  
N. Shima ◽  
M. Otsuka ◽  
...  
Keyword(s):  
Diffraction Method ◽  
Dislocation Motion ◽  
X Ray Diffraction ◽  
Multilayered Films ◽  
X Ray ◽  
Composition Modulation ◽  
Hardness Change ◽  
Sputter Deposited ◽  
Coherency Strains ◽  
Hardness Values

ABSTRACTTiN/TaN multilayers were grown by reactive magnetron sputtering on WC-Co sintered hard alloy and MgO(100) single crystal substrates. Multilayer structure and composition modulation amplitudes were studied using x-ray diffraction method. Hardness and elastic modulus were mea- sured by nanoindentation tester. For bilayer thickness (Λ) larger than 80 A˚, hardness are lower than rule-of-mixtures value of individual single layers, and increased rapidly with decreasing Λ, peaking at hardness values ≈33% higher than that at A=43 Å. As a result of analysis the inclination of applied load for indenter displacement on P-h curve (ΔP/Δh), this paper exhibits that the en- hancement of the resistance to dislocation motion and elastic anomaly due to coherency strains are responsible for the hardness change.

Influence of Surface Roughness on the Quality of Data Obtained by Pseudo-Grazing Incidence X-Ray Diffraction

2006 ◽  
Vol 514-516 ◽  
pp. 1618-1622 ◽  
Author(s):  
Maria José Marques ◽  
J.C.P. Pina ◽  
A. Morão Dias
Keyword(s):  
Residual Stress ◽  
Surface Roughness ◽  
Stress Gradient ◽  
Roughness Parameter ◽  
Diffraction Method ◽  
Grazing Incidence ◽  
Bragg Diffraction ◽  
X Ray Diffraction ◽  
Residual Surface Stress ◽  
X Ray

The conventional Bragg diffraction geometry, normally used to characterize the residual surface stress state, it is not suitable to evaluate surface treated materials and thin films. The X-ray path lengths through a surface layer or thin film are too short to produce adequate diffraction intensities in relation to the bulk or the substrate. Another limitation of the conventional technique appears when a residual stress gradient is present in the irradiated surface. The technique only enables the evaluation of the mean value of this gradient. In these cases, a recently proposed Pseudo-Grazing Incident X-ray Diffraction method would be better applicable. In this study, the Pseudo-Grazing Incidence X-ray Diffraction is applied to characterize the residual stress depth profiles of several AISI 4140 samples, which were prepared, by mechanical polishing and grinding, in order to present different surface roughness parameters, Ra. The experimental results lead to the conclusion that the surface roughness limits the application of the Pseudo-Grazing Incidence methodology to a minimum X-ray incident angle. This angle is the one that enables a mean X-ray penetration depth with the same order of magnitude of the sample surface roughness parameter, Ra.

scholarly journals Stress measurements by multi-reflection grazing-incidence X-ray diffraction method (MGIXD) using different radiation wavelengths and different incident angles

2017 ◽  
Vol 123 ◽  
pp. 157-166 ◽  
Author(s):  
Marianna Marciszko ◽  
Andrzej Baczmański ◽  
Chedly Braham ◽  
Mirosław Wróbel ◽  
Sebastian Wroński ◽  
...  
Keyword(s):  
Diffraction Method ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Stress Measurements

Contribution to residual-stress evaluation in high-stress-gradient zones by X-ray diffraction

2000 ◽  
Vol 33 (1) ◽  
pp. 26-34 ◽  
Author(s):  
V. Hennion ◽  
J. M. Sprauel ◽  
H. Michaud
Keyword(s):  
Stress Gradient ◽  
High Stress ◽  
Nonlinear Function ◽  
Diffraction Method ◽  
Incident Beam ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
Near Surface ◽  
X Ray ◽  
True Shape

The non-destructive X-ray diffraction method is usually employed to evaluate stress states at the near surface of materials. In specific zones with high-stress gradients parallel to the surface, like welding joins, areas affected by lasers, or ball-bearing raceways, the classical measurement method is not particularly well suited, as the irradiation spot covers regions of varying stress according to its size. This leads to inaccurate stress evaluations. A new X-ray diffraction measurement and data treatment method is therefore proposed. It is based on longitudinal step-by-step scanning in a fixed direction of the surface. As the acquired data results from the convolution of local diffraction peaks with the incident-beam intensity, an accurate model of the true two-dimensional intensity distribution inside the spot has been developed. Firstly, the true shape and size of the irradiation area is defined. The distribution of the intensity received by the sample surface is then computed. The true local strains and stresses along the scanning direction are finally determined from the acquired peaks using an optimization through a least-squares fitting by a nonlinear function.

Technology development for in-situ measurement of residual stress in arc welded joints of MDN 250 by portable Cosα X-ray diffraction method

2021 ◽  
pp. 095440892110590
Author(s):  
Bibin Jose ◽  
Manikandan Manoharan ◽  
Arivazhagan Natarajan
Keyword(s):  
Residual Stress ◽  
Welded Joints ◽  
Stress Measurement ◽  
Quantitative Estimation ◽  
Diffraction Method ◽  
X Ray Diffraction ◽  
Metallic Component ◽  
Substantial Impact ◽  
X Ray ◽  
Stress Measurements

Residual stresses are inherent stresses that exist in engineering components even though no external load is applied. They are caused by the non-uniform volumetric shift of the metallic component during manufacturing processes. Welding is a key manufacturing technique that has a substantial impact on the economy since it is required for the production of a diverse variety of products used in the engineering sector. The residual stress primarily affects the stability, durability and performance of the welded joints. Hence its determination is of utmost importance. X-ray diffraction (XRD) is the most commonly used method for residual stress analysis. There are mainly two approaches for measuring residual stress using XRD; one is the sin2ψ method and the other is the cosα method. The residual stress measurements using the cosα method are handy, quick and convenient compared to the sin2ψ method. This method is well suited for welded joints, as it provides flexibility for testing immediately after the welding operation. Apart from residual stress measurements, the cosα method also gives valuable insights in the form of Debye-Scherrer (DS) rings and full width at half maximum. The present study focuses on the development of a novel technique that not only enables residual stress measurement but also provides a quantitative estimation of hardness and qualitative estimation of grain size without performing metallurgical or mechanical characterization. The material used for the present study is an arc-welded joint of MDN 250 grade maraging steel. The residual stress results show a compressive profile throughout the weldment, with a maximum value of compressive residual stress of 428 MPa at the fusion zone.

Analysis of Residual Stress Gradients Below the Surface of a Material Using a Multi-Energy Method

2001 ◽  
Vol 678 ◽  
Author(s):  
Yanan Xiao ◽  
Tim Graber ◽  
Myungae Lee ◽  
Dale E. Wittmer ◽  
Susan M. Mini
Keyword(s):  
Residual Stress ◽  
Stress Gradient ◽  
Diffraction Method ◽  
X Ray Diffraction ◽  
Gradient Distribution ◽  
X Ray ◽  
Experimental Parameters ◽  
The Relationship ◽  
X Ray Absorption ◽  
Residual Stress Gradient

AbstractThe residual-stress-gradient distribution just below the surface of a material is an important factor to consider during the engineering and design of a component. With the availability of an intense energy-tunable synchrotron x-ray source, it becomes easier to analyze the stress gradient below the surface, using a multi-energy x-ray diffraction method. A program was developed to efficiently determine possible experimental parameters using a sample with a known stress gradient distribution. In addition, this program can also calculate the stress gradient distribution below the surface taking into account experimental results. It also includes a subroutine for calculating the x-ray absorption coefficients of all of the elements, generalizing it for use with any material. As an example, in the present study, the relationship between x-ray energy and the residual stress gradient is discussed according to the calculated result for a silicon nitride composition.

scholarly journals Gradient of Residual Stress and Lattice Parameter in Mechanically Polished Tungsten Measured Using Classical X-rays and Synchrotron Radiation

2020 ◽  
Vol 51 (11) ◽  
pp. 5945-5957
Author(s):  
Adrian Oponowicz ◽  
Marianna Marciszko-Wiąckowska ◽  
Andrzej Baczmański ◽  
Manuela Klaus ◽  
Christoph Genzel ◽  
...  
Keyword(s):  
Stress Gradient ◽  
Diffraction Method ◽  
High Energy ◽  
Lattice Parameter ◽  
Free Lattice ◽  
Stress Profile ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Subsurface Region

Abstract In this work, the stress gradient in mechanically polished tungsten sample was studied using X-ray diffraction methods. To determine in-depth stress evolution in the very shallow subsurface region (up to 10 μm), special methods based on reflection geometry were applied. The subsurface stresses (depth up to 1 μm) were measured using the multiple-reflection grazing incidence X-ray diffraction method with classical characteristic X-rays, while the deeper volumes (depth up to 10 μm) were investigated using energy-dispersive diffraction with white high energy synchrotron beam. Both complementary methods allowed for determining in-depth stress profile and the evolution of stress-free lattice parameter. It was confirmed that the crystals of tungsten are elastically isotropic, which simplifies the stress analysis and makes tungsten a suitable material for testing stress measurement methods. Furthermore, it was found that an important compressive stress of about − 1000 MPa was generated on the surface of the mechanically polished sample, and this stress decreases to zero value at the depth of about 9 μm. On the other hand, the strain-free lattice parameter does not change significantly in the examined subsurface region.

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