Measurement of Residual Stresses in Thin Films by Two-Dimensional XRD

2006 ◽  
Vol 524-525 ◽  
pp. 613-618 ◽  
Author(s):  
Bob B. He
Keyword(s):  
Thin Films ◽  
Residual Stress ◽  
Residual Stresses ◽  
Recent Progress ◽  
Stress Measurement ◽  
Incident Angle ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
X Ray ◽  
Residual Stress Analysis

This paper introduces the recent progress in two-dimensional X-ray diffraction as well as its applications in residual stress analysis in thin films. The stress measurement with twodimensional x-ray diffraction can be done with low incident angle and is not limited to the peaks with high two-theta angles like the conventional method. When residual stresses of thin films are measured, a low incident angle is preferred to maximize the diffraction signals from the thin films surfaces instead of from the substrates and matrix materials. Since one stress measurement at one fixed incident angle is possible, stress gradients in depth can be measured by series of incident angles. Some experimental examples are given to show the stress measurement at low and fixed incident angle.

Influence of deposition parameters on the residual stresses of WC-Wo sputtered thin films

MRS Advances ◽  
2020 ◽  
Vol 5 (23-24) ◽  
pp. 1215-1223
Author(s):  
R.R. Phiri ◽  
O.P. Oladijo ◽  
E.T. Akinlabi
Keyword(s):  
Thin Films ◽  
Residual Stress ◽  
Residual Stresses ◽  
Substrate Surface ◽  
Tribological Performance ◽  
X Ray Diffraction ◽  
X Ray ◽  
Compressive Stresses ◽  
Deposition Parameters ◽  
Cobalt Thin Films

AbstractControl and manipulation of residual stresses in thin films is a key for attaining coatings with high mechanical and tribological performance. It is therefore imperative to have reliable residual stress measurements methods to further understand the dynamics involved. The sin2ψ method of X-ray diffraction was used to investigate the residual stresses on the tungsten carbide cobalt thin films deposited on a mild steel surface to understand the how the deposition parameters influence the generation of residual stresses within the substrate surface. X-ray spectra of the surface revealed an amorphous phase of the thin film therefore the stress measured was of the substrate surface and the effects of sputtering parameters on residual stress were analysed. Compressive stresses were identified within all samples studied. The results reveal that as the sputtering parameters are varied, the residual stresses also change. Optimum deposition parameters in terms of residual stresses were suggested.

Wheel Rim Axial Residual Stress and a Proposed Mechanism for Vertical Split Rim Formation

2011 ◽  
Author(s):  
Cameron Lonsdale ◽  
John Oliver
Keyword(s):  
Residual Stress ◽  
Residual Stresses ◽  
Stress Measurement ◽  
Axial Stress ◽  
X Ray Diffraction ◽  
X Ray ◽  
Axial Residual Stress ◽  
Railroad Wheels ◽  
Hoop Stresses ◽  
Future Work

Railroad wheels are manufactured with beneficial residual compressive hoop stresses, which are imparted by rim quenching and tempering. Hoop and radial residual stresses for wheels have been studied in detail by various organizations over the years and are relatively well characterized. However axial residual stresses, in the orientation across the rim width from back rim face to front rim face, have not been extensively investigated. This paper describes a failure mode known as a vertical split rim (VSR) and describes efforts to measure the axial residual stresses in, 1) new wheels, 2) service worn wheels and 3) wheels that have failed from VSRs. Initial axial residual stress measurement efforts, using core drilling and x-ray diffraction from the tread surface, are briefly reviewed. Further more extensive work using x-ray diffraction to measure axial residual stress on radial wheel slices is described and data are presented, focusing on differences between the three wheel types. The concept of Axial Stress Amplification (ASA) is outlined, and the relationship of axial residual stress to VSRs is discussed. A proposed mechanism for VSR formation is described. Future work, with a goal of reducing or eliminating VSRs in service, is considered.

Non-Destructive Residual Stress Analysis of Induction Hardened Components by Neutron and X-Ray Diffraction

2013 ◽  
Vol 768-769 ◽  
pp. 420-427 ◽  
Author(s):  
Jeremy Epp ◽  
Thilo Pirling ◽  
Thomas Hirsch
Keyword(s):  
Residual Stress ◽  
Chemical Composition ◽  
Residual Stresses ◽  
Stress Analysis ◽  
Stress Gradient ◽  
X Ray Diffraction ◽  
Neutron Measurement ◽  
X Ray ◽  
Layer Removal ◽  
Residual Stress Analysis

In this paper the microstructural and residual-stress analysis of an induction hardened plate of medium carbon steel is described. The stress gradient was determined using laboratory X-ray diffraction (IWT, Bremen, Germany) and neutron strain scanning (ILL, Grenoble, France). Due to slight variations of chemical composition in the depth, matchstick like (cross section 2×2mm²) d0-reference samples were prepared from a similarly treated sample. The d0shift induced by variation of chemical composition was measured by neutron and by X-ray diffraction along the strain free direction (sin²ψ*) and used for the evaluation of the neutron stress calculation. The d0distribution obtained from the neutron measurement did not appear reliable while the method using X-ray diffraction seems to be an efficient and reliable method to determine d0profiles in small samples. The evaluation of neutron measurements was then done using the X-ray diffraction d0distribution. High compressive residual stresses were measured in the hardened layer followed by high tensile residual stresses in the core. A comparison of the neutron measurements with X-ray diffraction (XRD) depth profiles obtained after successive layer removal showed that both methods give similar results. However, these investigations opened the question about the direct comparison of the residual stresses obtained by neutron and XRD. Indeed, a correction of the neutron data regarding the residual stresses in thickness direction might be necessary as these are released in the case of X-ray diffraction measurements after layer removal.

Residual Stress in Thin Films of Rf-Sputtered Aluminum by X-ray Multtaxial Stress Measurement

1995 ◽  
Vol 39 ◽  
pp. 433-438
Author(s):  
Shoukhi Ejiri ◽  
Zheng Lin ◽  
Tosihiko Sasaki ◽  
Yukio Hirose
Keyword(s):  
Thin Films ◽  
Residual Stress ◽  
Residual Stresses ◽  
Stress Measurement ◽  
Multiaxial Stress ◽  
Argon Gas ◽  
X Ray

Residual stress in thin films of RF-sputtered aluminum coated on substrate of glass was measured by X-ray multiaxial stress measurement. The films were manufactured under the various conditions such as temperature of substrate ranged from 473K to 573K, and pressure of argon gas range from 0.0093Pato 13.3Pa respectively. These results brought comprehension that residual stress existed in tri-axial and that was influenced by temperature of substrate and pressure of argon gas. Residual stresses were unstable in range of less than 1.33Pa of pressure of argon gas.

Investigation of Residual Stress in Green Compacts of Metal Powder Using X-Ray Diffraction

2012 ◽  
Vol 554-556 ◽  
pp. 461-464 ◽  
Author(s):  
Rui Zhou ◽  
Lian Hong Zhang ◽  
Yu Hong Liu
Keyword(s):  
Residual Stress ◽  
Residual Stresses ◽  
Significant Influence ◽  
Stress Measurement ◽  
X Ray Diffraction ◽  
X Ray ◽  
American Standard ◽  
Compaction Processes ◽  
Compacting Pressure

Residual stresses in green compacts have a significant influence on the quality of the compact and post-compaction processes like part handling. In this study, the latest European and American standard for residual stress measurement by X-ray diffraction have been used to obtain more exact residual stresses in surface of green compacts as experimental evidence for simulation. The influence of kinds of powders, compacting pressure and friction on residual stresses in green compact has been studied.

scholarly journals X-Ray Diffraction Technique for Residual Stress Measurement in NiCrMo Alloy Weld Metal

2018 ◽  
Vol 2018 ◽  
pp. 1-10 ◽  
Author(s):  
Vladimir Ivanovitch Monine ◽  
João da Cruz Payão Filho ◽  
Rodrigo Stohler Gonzaga ◽  
Elisa Kimus Dias Passos ◽  
Joaquim Teixeira de Assis
Keyword(s):  
Residual Stress ◽  
Residual Stresses ◽  
Weld Metal ◽  
Welded Joint ◽  
Stress Measurement ◽  
Steel Wire ◽  
X Ray Diffraction ◽  
X Ray ◽  
Wire Brushing ◽  
Alloy Weld

In the present work, residual stresses in nickel-based (Ni 625) superalloy weld metal of a 9%Ni steel-welded joint were measured by X-ray diffraction (XRD). This technique presents some difficulties in performing measurements in coarse and preferentially oriented weld metal microstructures. It is proposed a preliminary surface treatment by rotating steel wire brushing to perform the stress analysis through XRD technique possible for this kind of material. Stress measurements with proposed XRD technique showed that the stress state in Ni 625 weld metal on the outside surface of the welded joint is characterised by tensile stresses in the transverse and longitudinal directions, while compressive transverse and tensile longitudinal residual stresses are developed in the root pass region.

Residual Stress Analysis of Al Alloy Thin Films by X-Ray Diffraction as a Function of Film Thickness

1988 ◽  
Vol 130 ◽  
Author(s):  
Carla J. Shute ◽  
J. B. Cohen ◽  
D. A. Jeannottea
Keyword(s):  
Thin Films ◽  
Residual Stress ◽  
Film Thickness ◽  
Stress Analysis ◽  
Metal Film ◽  
High Stress ◽  
Al Alloy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Residual Stress Analysis

AbstractResidual stress has been measured as a function of layer thickness in thin films of an Al alloy on oxidized Si by the x-ray “d” versus sin2ψ technique. Samples with and without a passivation layer were examined. The results show an increase in residual stress with decreasing film thickness for the passivated samples and indicates that the interface between the metal film and SiO2 may be a region of high stress.

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