Aluminum Implantation in 4H-SiC: Physical and Electrical Properties
2013 ◽
Vol 740-742
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pp. 581-584
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Keyword(s):
For this study, 4H SiC samples were implanted with aluminum at room temperature, 200°C and 600°C with different energies, ranging from 30 to 380 keV, for a total dose of 4x1015 cm 2, to create a “box-like” profile. To activate dopants, samples were then isochronally annealed from 1650°C to 1850°C during 30min. The lowest specific contact resistance achieved, evaluated to 1.3x10-5 Ω.cm2, has been obtained for the 200°C implanted sample annealed at 1850°C. For this condition, Scanning Capacitance Microscopy study has proved that the dopant activity is quite homogeneous in opposition with the samples implanted at RT and 600°C.
2018 ◽
Vol 924
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pp. 385-388
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Keyword(s):
2011 ◽
Vol 679-680
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pp. 193-196
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2008 ◽
Vol 600-603
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pp. 639-642
2013 ◽
Vol 4
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pp. 234-242
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