Stability of Current Gain in SiC BJTs

2014 ◽  
Vol 778-780 ◽  
pp. 1017-1020 ◽  
Author(s):  
Benedetto Buono ◽  
Fredrik Allerstam ◽  
Martin Domeij ◽  
Andrei Konstantinov ◽  
Krister Gumaelius ◽  
...  

In this work, large area SiC BJTs with good long-term stability in 1000 hrs DC stress tests are demonstrated. It is also illustrated how wafer scanning techniques can be used to reject BJT dies with basal plane dislocations, thereby eliminating the risk for bipolar degradation.

2011 ◽  
Vol 58 (8) ◽  
pp. 2665-2669 ◽  
Author(s):  
Reza Ghandi ◽  
Benedetto Buono ◽  
Martin Domeij ◽  
Carl-Mikael Zetterling ◽  
Mikael Ostling

2019 ◽  
Author(s):  
Fabio Matteocci ◽  
Emanuele Calabrò ◽  
Diego Di Girolamo ◽  
Enrico Lamanna ◽  
Danilo Dini ◽  
...  

Hypertension ◽  
2010 ◽  
Vol 55 (1) ◽  
pp. 131-136 ◽  
Author(s):  
Skjalg S. Hassellund ◽  
Arnljot Flaa ◽  
Leiv Sandvik ◽  
Sverre E. Kjeldsen ◽  
Morten Rostrup

2020 ◽  
Vol 32 (51) ◽  
pp. 2002217
Author(s):  
Sungmin Park ◽  
Taehee Kim ◽  
Seongwon Yoon ◽  
Chang Woo Koh ◽  
Han Young Woo ◽  
...  

2012 ◽  
Vol 225 ◽  
pp. 124-130 ◽  
Author(s):  
Hyung-Tae Lim ◽  
Soon Cheol Hwang ◽  
Young Min Park ◽  
In Sung Lee

Sign in / Sign up

Export Citation Format

Share Document