Fretting Characteristics and Environmental Reliability of Au-Sn Contact Pairs

2019 ◽  
Vol 953 ◽  
pp. 115-120 ◽  
Author(s):  
Xue Yan Lin ◽  
Hai Tao Hao ◽  
Min Xie
Keyword(s):  
Contact Resistance ◽  
Ambient Temperature ◽  
Contact Force ◽  
Salt Spray ◽  
Test System ◽  
Resistance Test ◽  
Contact Pair ◽  
Simulation Experiments ◽  
Micro Motion ◽  
Environmental Simulation

Based on the laboratory micro-motion contact resistance test system, fretting characteristics of the two contact pairs of gold-plated probe and tin-plated samples, gold-plated samples and tin-plated probe, is carried out at different plating thickness, contact force and temperatures. The contact pairs after the fretting experiment were subjected to temperature and humidity test and salt spray test to analyze its environmental reliability. 0.76μmAu-Sn has better fretting characteristics than 4μm Sn-Au. When the contact force is greater than or equal to 100 gf, the two kinds of contact pair exhibit good fretting characteristics. Thickness of sample plating is more important than that of probe. The influence of ambient temperature on fretting contact performance is the weakest. The increase of contact resistance of contact pair 4μm Sn-Au is higher than that of 0.76μmAu-Sn after accelerated environmental simulation experiments.

scholarly journals Characterization of the Resistance and Force of a Carbon Nanotube/Metal Side Contact by Nanomanipulation

Scanning ◽  
2017 ◽  
Vol 2017 ◽  
pp. 1-11 ◽  
Author(s):  
Ning Yu ◽  
Masahiro Nakajima ◽  
Qing Shi ◽  
Zhan Yang ◽  
Huaping Wang ◽  
...  
Keyword(s):  
Contact Resistance ◽  
Contact Force ◽  
Contact Area ◽  
Field Effect Transistors ◽  
Influence Factors ◽  
Contact Length ◽  
Before And After ◽  
Negative Exponential ◽  
Good Agreement

A high contact resistance restricts the application of carbon nanotubes (CNTs) in fabrication of field-effect transistors (FETs). Thus, it is important to decrease the contact resistance and investigate the critical influence factors such as the contact length and contact force. This study uses nanomanipulation to characterize both the resistance and the force at a CNT/Au side-contact interface inside a scanning electron microscopy (SEM). Two-terminal CNT manipulation methods, and models for calculating the resistance and force at contact area, are proposed to guide the measurement experiments of a total resistance and a cantilever’s elastic deformation. The experimental results suggest that the contact resistance of CNT/Au interface is large (189.5 kΩ) when the van der Waals force (282.1 nN) dominates the contact force at the interface. Electron-beam-induced deposition (EBID) is then carried out to decrease the contact resistance. After depositing seven EBID points, the resistance is decreased to 7.5 kΩ, and the force increases to 1339.8 nN at least. The resistance and force at the contact area where CNT was fixed exhibit a negative exponential correlation before and after EBID. The good agreement of this correlation with previous reports validates the proposed robotic system and methods for characterizing the contact resistance and force.

The Degradation of Electrical Contact Resistance of Metal Films at Low Contact Force

2004 ◽  
Author(s):  
Daniel J. Dickrell ◽  
Michael T. Dugger
Keyword(s):  
Contact Resistance ◽  
Contact Force ◽  
Environmental Control ◽  
Surface Film ◽  
Electrical Contact ◽  
Electrical Contact Resistance ◽  
Small Surface ◽  
Underlying Mechanisms ◽  
Cyclic Degradation ◽  
Current Reduction

The quality of electrical contact resistance is important to the performance and reliability of metal-contact microelectromechanical system (MEMS) relays and switches. The cyclic degradation of contact resistance was examined for a metal multilayer sphere-on-flat contact at low contact force. The relationships between the degradation and underlying mechanisms, particularly surface contamination effects, were investigated through experimentation and analysis. Results indicated that the degradation severity could be significantly decreased with environmental control and contact current reduction. Micro-arcs at very small surface gaps, which can decompose adsorbed contaminants and leave an insulating surface film, were proposed as a cause of the resistance degradation.

scholarly journals Simulation of Electric Networks Modes Using Steady-State and Heat Balance Equations

2020 ◽  
Vol 63 (1) ◽  
pp. 66-80
Author(s):  
A. B. Balametov ◽  
E. D. Halilov
Keyword(s):  
Steady State ◽  
Ambient Temperature ◽  
Temperature Dependence ◽  
Test System ◽  
Temperature Correction ◽  
Electrical Network ◽  
Overhead Line ◽  
Power Losses ◽  
Steady State Mode ◽  
Electric Network

In the traditional calculations of the steady-state mode of the electrical network, the dependences of the active resistances of the overhead line wire on the ambient temperature and currents in the branches are not taken into account. However, the temperature is a function of the active power losses, the power losses are a function of the resistance and current, and the resistance is temperature dependent. Therefore, these relations should be related to the traditional equations for stationary regimes. In order to increase the accuracy of steady-state calculations, a temperature correction of the resistance of the branches is required. In this paper, we present a method based on the joint solution of nonlinear equations of the steady-state electric network regime and the thermal balance of the wires of overhead lines. The algorithm and the program of calculation of the steady-state mode of an electric network taking into account dependence of active resistances of a wire of an overhead line on ambient temperature and currents in branches have been developed. The quantitative influence of the load current, wire temperature, wind speed, solar radiation on the active resistance of the wires has been estimated, and the errors in calculating annual variable energy losses have been determined. Numerical experiments were carried out for a 6-node modified version of the IEEE test system and equivalent circuit of 110 kV. The results of the calculations of the steady-state regime on various test circuits showed that the non-account of the temperature dependence of the active resistances might cause errors in power loss for individual loaded lines up to 10 %, and for total losses of the system – up to 30 %. This is unacceptable in simulating the modes of the electric network. The results of simulation of steady-state regimes taking into account the temperature dependence of the resistance of the wires are presented on the example of 6-node and 7-node circuits.

Sign in / Sign up

Export Citation Format

Share Document