Morphology and Structure of the Interface Layers in Ni/Ge Thin Films
2014 ◽
Vol 215
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pp. 259-263
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Keyword(s):
Morphology and structure of the interface in Ni/Ge thin films being due to the mutual diffusion of these elements are investigated with the help of atomic force microscope, high resolution electron microscope and micro-diffraction. Strong effect of interface in magnetic behavior of Ni layers is demonstrated and explained by formation of magnetic order in the interface and rough boundaries between layers.
1977 ◽
Vol 33
(1)
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pp. 109-113
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1983 ◽
Vol 41
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pp. 28-29
1973 ◽
Vol 31
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pp. 486-487
1968 ◽
Vol 26
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pp. 338-339
1994 ◽
Vol 52
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pp. 714-715
1990 ◽
Vol 48
(1)
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pp. 532-533