Proton-induced single-event effect and influence of annealing on multiple feature size NAND flash memory
2019 ◽
Vol 58
(12)
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pp. 126002
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2006 ◽
Vol 53
(4)
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pp. 1813-1818
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2018 ◽
Vol 65
(1)
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pp. 19-26
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2017 ◽
Vol 64
(1)
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pp. 332-337
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2012 ◽
Vol E95.C
(5)
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pp. 837-841
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2020 ◽
Vol E103.C
(4)
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pp. 171-180
2013 ◽
Vol E96.A
(12)
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pp. 2645-2651
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