Direct Measurement of Carrier Mobility in Intrinsic Channel Tri-Gate Single Silicon Nanowire Metal–Oxide–Semiconductor Field-Effect Transistors
2013 ◽
Vol 52
(4S)
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pp. 04CC11
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2006 ◽
Vol 45
(4B)
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pp. 3133-3136
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2014 ◽
Vol 14
(11)
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pp. 8219-8224
2010 ◽
Vol 49
(8)
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pp. 084203
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2010 ◽
Vol 49
(4)
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pp. 04DN03
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2015 ◽
Vol 87
(19)
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pp. 9982-9990
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