Determination of the Drain Saturation Voltage of a Metal–Oxide–Semiconductor Field-Effect Transistor by the Capacitance–Voltage Method
1993 ◽
Vol 32
(Part 1, No. 10)
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pp. 4393-4397
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2009 ◽
Vol 48
(1)
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pp. 011205
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2021 ◽
Vol 134
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pp. 106046
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2020 ◽
Vol 21
(3)
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pp. 339-347
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1997 ◽
Vol 9
(8)
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pp. 1143-1145
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2010 ◽
Vol 49
(4)
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pp. 04DE16
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