scholarly journals A New Statistical Test for PRNG Based on the Attendance’s Law

Author(s):  
Babacar Alasane Ndaw ◽  
Ousmane Ndiaye ◽  
Mamadou Sanghar´e ◽  
Cheikh Thi´ecoumba Gueye

One family of the cryptographic primitives is random Number Generators (RNG) which have several applications in cryptography such that password generation, nonce generation, Initialisation vector for Stream Cipher, keystream. Recently they are also used to randomise encryption and signature schemes. A pseudo-random number generator (PRNG) or a pseudo-random bit generator (PRBG) is a deterministic algorithm that produces numbers whose distribution is on the one hand indistinguishable from uniform ie. that the probabilities of appearance of the different symbols are equal and that these appearances are all independent. On the other hand, the next output of a PRNG must be unpredictable from all its previous outputs. Indeed, A set of statistical tests for randomness has been proposed in the literature and by NIST to evaluate the security of random(pseudo) bit or block. Unfortunately there are non-random binary streams that pass these standardized tests. In this pap er, as outcome, we intro duce on the one hand a new statistical test in a static contextcalled attendance’s law and on the other hand a distinguisher based on this new attendance’s law.    

Information ◽  
2021 ◽  
Vol 12 (1) ◽  
pp. 19
Author(s):  
Alexey Semenkov ◽  
Dmitry Bragin ◽  
Yakov Usoltsev ◽  
Anton Konev ◽  
Evgeny Kostuchenko

Modern facial recognition algorithms make it possible to identify system users by their appearance with a high level of accuracy. In such cases, an image of the user’s face is converted to parameters that later are used in a recognition process. On the other hand, the obtained parameters can be used as data for pseudo-random number generators. However, the closeness of the sequence generated by such a generator to a truly random one is questionable. This paper proposes a system which is able to authenticate users by their face, and generate pseudo-random values based on the facial image that will later serve to generate an encryption key. The generator of a random value was tested with the NIST Statistical Test Suite. The subsystem of image recognition was also tested under various conditions of taking the image. The test results of the random value generator show a satisfactory level of randomness, i.e., an average of 0.47 random generation (NIST test), with 95% accuracy of the system as a whole.


2014 ◽  
Vol 573 ◽  
pp. 181-186 ◽  
Author(s):  
G.P. Ramesh ◽  
A. Rajan

—Field-programmable gate array (FPGA) optimized random number generators (RNGs) are more resource-efficient than software-optimized RNGs because they can take advantage of bitwise operations and FPGA-specific features. A random number generator (RNG) is a computational or physical device designed to generate a sequence of numbers or symbols that lack any pattern, i.e. appear random. The many applications of randomness have led to the development of several different methods for generating random data. Several computational methods for random number generation exist, but often fall short of the goal of true randomness though they may meet, with varying success, some of the statistical tests for randomness intended to measure how unpredictable their results are (that is, to what degree their patterns are discernible).LUT-SR Family of Uniform Random Number Generators are able to handle randomness only based on seeds that is loaded in the look up table. To make random generation efficient, we propose new approach based on SRAM storage device.Keywords: RNG, LFSR, SRAM


Entropy ◽  
2020 ◽  
Vol 22 (6) ◽  
pp. 630 ◽  
Author(s):  
Boris Ryabko

The problem of constructing effective statistical tests for random number generators (RNG) is considered. Currently, there are hundreds of RNG statistical tests that are often combined into so-called batteries, each containing from a dozen to more than one hundred tests. When a battery test is used, it is applied to a sequence generated by the RNG, and the calculation time is determined by the length of the sequence and the number of tests. Generally speaking, the longer is the sequence, the smaller are the deviations from randomness that can be found by a specific test. Thus, when a battery is applied, on the one hand, the “better” are the tests in the battery, the more chances there are to reject a “bad” RNG. On the other hand, the larger is the battery, the less time it can spend on each test and, therefore, the shorter is the test sequence. In turn, this reduces the ability to find small deviations from randomness. To reduce this trade-off, we propose an adaptive way to use batteries (and other sets) of tests, which requires less time but, in a certain sense, preserves the power of the original battery. We call this method time-adaptive battery of tests. The suggested method is based on the theorem which describes asymptotic properties of the so-called p-values of tests. Namely, the theorem claims that, if the RNG can be modeled by a stationary ergodic source, the value − l o g π ( x 1 x 2 … x n ) / n goes to 1 − h when n grows, where x 1 x 2 … is the sequence, π ( ) is the p-value of the most powerful test, and h is the limit Shannon entropy of the source.


2019 ◽  
Vol 2019 ◽  
pp. 1-11
Author(s):  
Hojoong Park ◽  
Yongjin Yeom ◽  
Ju-Sung Kang

We propose a new lightweight BCH code corrector of the random number generator such that the bitwise dependence of the output value is controllable. The proposed corrector is applicable to a lightweight environment and the degree of dependence among the output bits of the corrector is adjustable depending on the bias of the input bits. Hitherto, most correctors using a linear code are studied on the direction of reducing the bias among the output bits, where the biased input bits are independent. On the other hand, the output bits of a linear code corrector are inherently not independent even though the input bits are independent. However, there are no results dealing with the independence of the output bits. The well-known von Neumann corrector has an inefficient compression rate and the length of output bits is nondeterministic. Since the heavy cryptographic algorithms are used in the NIST’s conditioning component to reduce the bias of input bits, it is not appropriate in a lightweight environment. Thus we have concentrated on the linear code corrector and obtained the lightweight BCH code corrector with measurable dependence among the output bits as well as the bias. Moreover, we provide some simulations to examine our results.


Entropy ◽  
2019 ◽  
Vol 21 (10) ◽  
pp. 960 ◽  
Author(s):  
Luyao Wang ◽  
Hai Cheng

In recent years, a chaotic system is considered as an important pseudo-random source to pseudo-random number generators (PRNGs). This paper proposes a PRNG based on a modified logistic chaotic system. This chaotic system with fixed system parameters is convergent and its chaotic behavior is analyzed and proved. In order to improve the complexity and randomness of modified PRNGs, the chaotic system parameter denoted by floating point numbers generated by the chaotic system is confused and rearranged to increase its key space and reduce the possibility of an exhaustive attack. It is hard to speculate on the pseudo-random number by chaotic behavior because there is no statistical characteristics and infer the pseudo-random number generated by chaotic behavior. The system parameters of the next chaotic system are related to the chaotic values generated by the previous ones, which makes the PRNG generate enough results. By confusing and rearranging the output sequence, the system parameters of the previous time cannot be gotten from the next time which ensures the security. The analysis shows that the pseudo-random sequence generated by this method has perfect randomness, cryptographic properties and can pass the statistical tests.


2008 ◽  
Vol 18 (03) ◽  
pp. 851-867 ◽  
Author(s):  
K. W. TANG ◽  
H. S. KWOK ◽  
WALLACE K. S. TANG ◽  
K. F. MAN

Random number generators are widely used in different applications. However, it is difficult to obtain a good random number generator in low precision and resource constrained system, such as an eight-bit micro-controller system which is still commonly used in industrial and consumer markets. This paper provides a practical solution for this problem based on chaotic systems. By the use of a modified Chua's circuit, it is demonstrated that the sampled state, after post-processing by a high-dimensional chaotic map, can be used as a random source even in an eight-bit environment. The randomness of the generated sequence is testified and confirmed by different statistical tests and the up-to-date statistical suite.


Author(s):  
Kentaro Tamura ◽  
Yutaka Shikano

Abstract A cloud quantum computer is similar to a random number generator in that its physical mechanism is inaccessible to its users. In this respect, a cloud quantum computer is a black box. In both devices, its users decide the device condition from the output. A framework to achieve this exists in the field of random number generation in the form of statistical tests for random number generators. In the present study, we generated random numbers on a 20-qubit cloud quantum computer and evaluated the condition and stability of its qubits using statistical tests for random number generators. As a result, we observed that some qubits were more biased than others. Statistical tests for random number generators may provide a simple indicator of qubit condition and stability, enabling users to decide for themselves which qubits inside a cloud quantum computer to use.


2020 ◽  
Author(s):  
Scott Stoller

Random numbers are an important, but often overlooked part of the modern computing environment. They are used everywhere around us for a variety of purposes, from simple decision making in video games such as a coin toss, to securing financial transactions and encrypting confidential communications. They are even useful for gambling and the lottery. Random numbers are generated in many ways. Pseudo random number generators (PRNGs) generate numbers based on a formula. True random number generators (TRNGs) capture entropy from the environment to generate randomness. As our society and our devices become more connected in the digital world, it is important to develop new ways to generate truly random numbers in order to secure communications and connected devices. In this work a novel memristor-based True Random Number Generator is designed and a physical implementation is fabricated and tested using a W-based self-directed channel (SDC) memristor. The circuit was initially designed and prototyped on a breadboard. A custom Printed Circuit Board (PCB) was fabricated for the final circuit design and testing of the novel memristor-based TRNG. The National Institute of Standards and Technology (NIST) Statistical Test Suite (STS) was used to check the output of the TRNG for randomness. The TRNG was demonstrated to pass 13 statistical tests out of the 15 in the STS.


2021 ◽  
Author(s):  
Kayvan Tirdad

Pseudo random number generators (PRNGs) are one of the most important components in security and cryptography applications. We propose an application of Hopfield Neural Networks (HNN) as pseudo random number generator. This research is done based on a unique property of HNN, i.e., its unpredictable behavior under certain conditions. Also, we propose an application of Fuzzy Hopfield Neural Networks (FHNN) as pseudo random number generator. We compare the main features of ideal random number generators with our proposed PRNGs. We use a battery of statistical tests developed by National Institute of Standards and Technology (NIST) to measure the performance of proposed HNN and FHNN. We also measure the performance of other standard PRNGs and compare the results with HNN and FHNN PRNG. We have shown that our proposed HNN and FHNN have good performance comparing to other PRNGs accordingly.


ACTA IMEKO ◽  
2020 ◽  
Vol 9 (4) ◽  
pp. 128
Author(s):  
Daniel Chicayban Bastos ◽  
Luis Antonio Brasil Kowada ◽  
Raphael C. S. Machado

<p class="Abstract">Statistical sampling and simulations produced by algorithms require fast random number generators; however, true random number generators are often too slow for the purpose, so pseudorandom number generators are usually more suitable. But choosing and using a pseudorandom number generator is no simple task; most pseudorandom number generators fail statistical tests. Default pseudorandom number generators offered by programming languages usually do not offer sufficient statistical properties. Testing random number generators so as to choose one for a project is essential to know its limitations and decide whether the choice fits the project’s objectives. However, this study presents a reproducible experiment that demonstrates that, despite all the contributions it made when it was first published, the popular NIST SP 800-22 statistical test suite as implemented in the software package is inadequate for testing generators.</p>


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