Substrate Bias Enhanced Trap Effects on Time-Dependent Dielectric Breakdown of GaN MIS-HEMTs
2021 ◽
Vol 68
(5)
◽
pp. 2233-2239
Keyword(s):
2021 ◽
Vol 68
(5)
◽
pp. 2220-2225
Keyword(s):
2007 ◽
Vol 46
(No. 28)
◽
pp. L691-L692
◽
Keyword(s):
Keyword(s):
2013 ◽
Vol 26
(3)
◽
pp. 281-296
2011 ◽
Vol 51
(8)
◽
pp. 1283-1288
◽
Keyword(s):
2009 ◽
Vol 48
(2)
◽
pp. 021206
◽