In Situ Atomic-Scale Observation of Dislocation Climb and Grain Boundary Transformation in Nanostructured Metal

We report atomic-scale observations of grain boundary (GB) dislocation climb in nanostructured Au during in situ straining at room temperature. Climb of a dislocation occurs by stress-induced reconstruction of two atomic columns at the edge of an extra half atomic plane in the dislocation core. Different from the conventional belief of dislocation climb by destruction or construction of a single atomic column at the dislocation core, the new atomic route is demonstrated to be energetically favorable by Monte Carlo simulations. Our in situ observations also reveal GB transformation through dislocation climb, which suggests a means of controlling microstructures and properties of nanostructured metals.

Influence of Sb2O3 Nanoparticles Addition on the Thermal, Microstructural and Creep Properties of Hypoeutectic Sn–Bi Solder Alloy

Here we investigate the effects (thermal, microstructural, and creep properties) of adding Sb2O3 nanoparticles to a hypoeutectic Sn-5 wt% Bi solder alloy. The Sb2O3-containing solder alloy was prepared by mechanically incorporating 0.5 wt% Sb2O3 nanoparticles into the Sn-5 wt% Bi solder alloy. The addition of nano-sized Sb2O3 particles to the Sn–Bi solder alloy increases the melting temperature, but only slightly. The main phases of the investigated solder alloys include the β-Sn and Bi-rich phases in addition to the crystalline phase of Sb2O3 nanoparticles. No other intermetallic compounds were observed in the β-Sn matrix. The tensile creep experiments have been carried out in the 303–363 K temperature interval under constant stresses ranging from 5.1 to 7.64 MPa. The creep parameters of both solders increased gradually with increasing creep temperature up to 333 K, after which they increased rapidly with relatively higher values. The creep parameters of the Sb2O3-containing solder alloys are smaller than that of Sb2O3-free solder alloys. The present solder alloys exhibit class-M creep behavior. The calculated stress exponent values and activation energy data for both solders could be related to dislocation climb through core diffusion as the dominant operating mechanism.