Built‐in Electric Field Triggered Interfacial Accumulation Effect for Efficient Nitrate Removal at Ultra‐Low Concentration and Electroreduction to Ammonia

2021 ◽  
Author(s):  
Wu-Ji Sun ◽  
Hao-Qin Ji ◽  
Lan-Xin Li ◽  
Hao-Yu Zhang ◽  
Zhen-Kang Wang ◽  
...  
Keyword(s):  
Electric Field ◽  
Nitrate Removal ◽  
Low Concentration ◽  
Accumulation Effect

scholarly journals The Ohm Law as an Alternative for the Entropy Origin Nonlinearities in Conductivity of Dilute Colloidal Polyelectrolytes

Entropy ◽  
2020 ◽  
Vol 22 (2) ◽  
pp. 225
Author(s):  
Ioulia Chikina ◽  
Valeri Shikin ◽  
Andrey Varlamov
Keyword(s):  
Electric Field ◽  
Linear Function ◽  
Colloidal Particles ◽  
Colloidal Particle ◽  
Effective Conductivity ◽  
Spherical Approximation ◽  
Mean Spherical Approximation ◽  
Low Concentration ◽  
Multiply Charged ◽  
Experimental Findings

We discuss the peculiarities of the Ohm law in dilute polyelectrolytes containing a relatively low concentration n ⊙ of multiply charged colloidal particles. It is demonstrated that in these conditions, the effective conductivity of polyelectrolyte is the linear function of n ⊙ . This happens due to the change of the electric field in the polyelectrolyte under the effect of colloidal particle polarization. The proposed theory explains the recent experimental findings and presents the alternative to mean spherical approximation which predicts the nonlinear I–V characteristics of dilute colloidal polyelectrolytes due to entropy changes.

DOUBLE REFRACTION PHENOMENON OF ELECTRORHOLOGICAL FLUIDS

2001 ◽  
Vol 15 (06n07) ◽  
pp. 1057-1061 ◽  
Author(s):  
Xiaopeng Zhao ◽  
Changzhen Qu ◽  
Yun Ma
Keyword(s):  
Light Intensity ◽  
Electric Field ◽  
Laser Beam ◽  
Silicone Oil ◽  
Double Refraction ◽  
Low Concentration

In this paper, the adjustable double refraction phenomenon of Electrorhological fluids (ERF) was investigated. The measurements have been made of He-Ne laser through suspension of silica and pentaerythrite in silicone oil. When electric field was applied perpendicular to the laser beam, it was found that no light gets through the pair of perpendicular polarizing plate and analyzer plate without electric field. But when ERF is brought to bear electric field, the transmission light intensity increases with the electric field to be rising. For ERF of the same material, the double refraction phenomenon is more obviously to the low concentration. It is thought that the double refraction phenomenon of ERF is due to the fact that the particles link together to form thin chains or thick columns.

Resolution in photoelectron microscopy

1991 ◽  
Vol 49 ◽  
pp. 458-459
Author(s):  
G. F. Rempfer
Keyword(s):  
Electron Microscopy ◽  
Electric Field ◽  
Ultraviolet Light ◽  
Uniform Field ◽  
Virtual Image ◽  
Lens System ◽  
Photoemission Electron Microscopy ◽  
Planar Electrode ◽  
Electron Lens ◽  
Photoemission Electron

In photoelectron microscopy (PEM), also called photoemission electron microscopy (PEEM), the image is formed by electrons which have been liberated from the specimen by ultraviolet light. The electrons are accelerated by an electric field before being imaged by an electron lens system. The specimen is supported on a planar electrode (or the electrode itself may be the specimen), and the accelerating field is applied between the specimen, which serves as the cathode, and an anode. The accelerating field is essentially uniform except for microfields near the surface of the specimen and a diverging field near the anode aperture. The uniform field forms a virtual image of the specimen (virtual specimen) at unit lateral magnification, approximately twice as far from the anode as is the specimen. The diverging field at the anode aperture in turn forms a virtual image of the virtual specimen at magnification 2/3, at a distance from the anode of 4/3 the specimen distance. This demagnified virtual image is the object for the objective stage of the lens system.

Field-assisted ionization theory for microscopists

1994 ◽  
Vol 52 ◽  
pp. 820-821
Author(s):  
Patrick P. Camus
Keyword(s):  
Electric Field ◽  
Electron Tunneling ◽  
Ionization Probability ◽  
Critical Distance ◽  
Tunneling Probability ◽  
Field Ionization ◽  
Radius Of Curvature ◽  
Field Evaporation ◽  
A Value ◽  
Ion Emission

The theory of field ion emission is the study of electron tunneling probability enhanced by the application of a high electric field. At subnanometer distances and kilovolt potentials, the probability of tunneling of electrons increases markedly. Field ionization of gas atoms produce atomic resolution images of the surface of the specimen, while field evaporation of surface atoms sections the specimen. Details of emission theory may be found in monographs.Field ionization (FI) is the phenomena whereby an electric field assists in the ionization of gas atoms via tunneling. The tunneling probability is a maximum at a critical distance above the surface,xc, Fig. 1. Energy is required to ionize the gas atom at xc, I, but at a value reduced by the appliedelectric field, xcFe, while energy is recovered by placing the electron in the specimen, φ. The highest ionization probability occurs for those regions on the specimen that have the highest local electric field. Those atoms which protrude from the average surfacehave the smallest radius of curvature, the highest field and therefore produce the highest ionizationprobability and brightest spots on the imaging screen, Fig. 2. This technique is called field ion microscopy (FIM).

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