Studies in cluster ion formation. Part II. Concentration and matrix effects on the cluster ions of tetraalkylammonium halide salts

1988 ◽  
Vol 23 (2) ◽  
pp. 98-104 ◽  
Author(s):  
Emirgül Tolun ◽  
John F. J. Todd
Keyword(s):  
Matrix Effects ◽  
Cluster Ions ◽  
Ion Formation ◽  
Tetraalkylammonium Halide ◽  
Cluster Ion ◽  
Halide Salts

Comparison of Laser (LMS), Californium-252 Plasma Desorption (252Cf-PDMS), Fast Atom Bombardment (FAB), Secondary Ion (SIMS), and Field Desorption (FD) Mass Spectra of a Series of Internal Salts

1987 ◽  
Vol 41 (5) ◽  
pp. 821-829 ◽  
Author(s):  
Kesagapillai Balasanmugam ◽  
Somayajula Kasi Viswanadham ◽  
David M. Hercules ◽  
Robert J. Cotter ◽  
David Heller ◽  
...  
Keyword(s):  
Structure Elucidation ◽  
Mass Spectra ◽  
Fast Atom Bombardment ◽  
Negative Ion ◽  
Cluster Ions ◽  
Field Desorption ◽  
Ion Formation ◽  
Plasma Desorption ◽  
Cluster Ion ◽  
Secondary Ion

Comparison of the mass spectral techniques of Laser (LMS), Californium-252 Plasma Desorption (252Cf-PDMS), Secondary Ion (SIMS), Fast Atom Bombardment (FAB), and Field Desorption (FD) Mass Spectrometry is presented for the positive- and negative-ion spectra of a series of internal salts (zwitterions) known as the sultaines. The spectral characteristics compared are: quasimolecular ions, fragment ions and their implication for structure determination, and cluster-ion formation. Quasimolecular ions corresponding to (M + H)+ (all techniques); (M+CH3)+ (LMS, PDMS, SIMS); (M+R)+ (R = long alkyl chain up to C12, LMS); (M+Na)+ (SIMS, 252Cf–PD); (M+Ag)+ (SIMS), (M–H)− (FAB); (M–CH3)−; and (M–R) were observed (negative-ion FD mass spectra were not obtained). Extensive fragmentation is observed for PDMS and LMS, providing the highest level of structural information. Also, the possibilities for structure elucidation by SIMS are very good. Minimal fragmentation is observed for FAB; however, complete structure elucidation is possible by using both the positive- and negative-ion FAB spectra. FD is a less favored technique for the structural analysis of the sultaines. The negative-ion spectra of sultaines obtained by LMS, PDMS, SIMS, and FAB showed identical peaks in the lower mass ranges ( m/z < (M–CH3)−), although of varying intensities. Cluster ions and solvated (glycerol) cluster ions are observed in negative FAB in the higher mass ranges ( m/z > (M–CH3)−). FAB is unique with respect to cluster-ion formation; cluster ions of high order [( nM + H)+, n = 2–14; ( nM?CH3)−, ( nM–R)−, n = 2–9; ( lM+ mG–H)−, l = 1–4, m = 1–3] are observed. Other techniques show cluster ions such as ( nM+H)+, n = 2–3 (SIMS, PDMS, FD); ( nM+Na)+, n = 2 (SIMS and PDMS); and (2M+Ag)+ (SIMS). No cluster ions were observed in LMS.

SPUTTERING WITH GAS CLUSTER-ION BEAMS

1996 ◽  
Vol 03 (01) ◽  
pp. 1017-1021 ◽  
Author(s):  
J. MATSUO ◽  
M. AKIZUKI ◽  
J. NORTHBY ◽  
G.H. TAKAOKA ◽  
I. YAMADA
Keyword(s):  
Ion Irradiation ◽  
Removal Rate ◽  
Ion Beam ◽  
Solid Surfaces ◽  
Silicon Surfaces ◽  
Cluster Ions ◽  
Mass Filter ◽  
Cluster Bombardment ◽  
Cluster Ion Beams ◽  
Cluster Ion

A high-current (~100 nA) cluster-ion-beam equipment with a new mass filter has been developed to study the energetic cluster-bombardment effects on solid surfaces. A dramatic reduction of Cu concentration on silicon surfaces has been achieved by 20-keV Ar cluster (N~3000) ion bombardment. The removal rate of Cu with cluster ions is two orders of magnitude higher than that with monomer ions. A significantly higher sputtering yield is expected for cluster-ion irradiation. An energetic cluster-ion beam is quite suitable for removal of metal.

A New Type of Cluster-Ion Source for Thin Film Deposition

1990 ◽  
Vol 206 ◽  
Author(s):  
Hellmut Haberland ◽  
Martin Karrais ◽  
Martin Mall
Keyword(s):  
Electron Impact ◽  
Plane Surface ◽  
Thin Film Deposition ◽  
Ion Source ◽  
Film Deposition ◽  
Cluster Ions ◽  
Cluster Ion ◽  
Impact Ionisation ◽  
Aggregation Technique ◽  
High Degree

ABSTRACTAtoms are gas discharge sputtered from a solid target. They are condensed to form clusters using the gas aggregation technique. An intense beam of clusters of all solid materials can be obtained. Up to 80 % of the clusters can be ionised without using additional electron impact ionisation. Total deposition rates vary between 1 and 1000 Å per second depending on cluster diameter, which can be varied between 3 and 500 nm. Thin films of Al, Cu, and Mo have been produced so far. For non accelerated beams a weakly adhering mostly coulored deposit is obtained. Accelerating the cluster ions this changes to a strongly adhering film, having a shiny metallic appearance, and a very sharp and plane surface as seen in an electron microscope. The advantages compared to Kyoto ICB-method are: easy control of the cluster size, no electron impact ionisation, high degree of ionisation, and sputtering is used instead of thermal evaporation, which allows the use of high melting point materials.

MASS SPECTRA AND DISSOCIATION PATTERNS OF TELLURIUM CLUSTERS USING POSITIVE AND NEGATIVE SECONDARY-ION MASS SPECTROMETRY

1996 ◽  
Vol 03 (01) ◽  
pp. 577-582 ◽  
Author(s):  
H. ITO ◽  
T. SAKURAI ◽  
T. MATSUO ◽  
T. ICHIHARA ◽  
I. KATAKUSE
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Cluster Ions ◽  
Mass Spectrometers ◽  
Scanning Method ◽  
Ion Mass Spectrometry ◽  
Cluster Ion ◽  
Sector Type ◽  
Fragmentation Patterns ◽  
Secondary Ion

Size distribution of positive and negative tellurium clusters in the size range from 2 to 56 atoms was investigated by secondary-ion mass spectrometry (SIMS). Cluster ions were produced by the 12-keV Xe+ ions bombardment of a sample tellurium sheet and were mass-analyzed using sector-type double-focusing mass spectrometers. It was found that a discontinuous variation of cluster-ion intensity appeared at specific numbers of n. These numbers were 5, 8, 12, 15, 19, and 23 for positive clusters and 6, 10, 13, and 16 for negative clusters. The dissociation pattern was also investigated by an acceleration-voltage scanning method. It was found that Te2, Te5, and Te6 fragmentation events occurred at a large probability. Observation of specific fragmentation patterns suggested the existence of nonsequential fragment channels.

Application of Cluster Ion Beam Smoothing to SiC and YBCO Surfaces

1999 ◽  
Vol 585 ◽  
Author(s):  
D. Fathy ◽  
O. W. Holland ◽  
R. Liu ◽  
J. Wosik ◽  
W. K Chu
Keyword(s):  
Surface Topography ◽  
Ion Irradiation ◽  
Ion Beam ◽  
High Temperature Superconductors ◽  
Cluster Ions ◽  
Microwave Surface Resistance ◽  
Average Roughness ◽  
Cross Sectional ◽  
Cluster Ion Beams ◽  
Cluster Ion

AbstractOptimization of the surface topography, especially in high-temperature superconductors (HTS) and silicon carbide is crucial for device processing. Surface smoothing in these materials was investigated using Gas Cluster Ion Beams (GCIB) capable of delivering cluster ions of ≥ 2000 Ar atoms with energies of up to 30keV. Examination of the surface topography after cluster-ion irradiation was done using cross-sectional transmission electron microscopy (TEM) and atomic force microscopy (AFM). The results indicate that typical as-deposited YBCO films on MgO substrates have an average roughness of the order of 40 nm, and interpeak distance between 300–600 nm. Application of GCIB to the surface planarization reduces the roughness to only 10 nm. Also power handling and microwave surface resistance of the YBCO film and its relationship to surface smoothness are reported. Similar observations using bulk SiC are discussed.

scholarly journals Experimental Study on the Biological Effect of Cluster Ion Beams in Bacillus subtilis Spores

2019 ◽  
Vol 3 (2) ◽  
pp. 8 ◽  
Author(s):  
Yoshihiro Hase ◽  
Katsuya Satoh ◽  
Atsuya Chiba ◽  
Yoshimi Hirano ◽  
Shigeo Tomita ◽  
...  
Keyword(s):  
Biological Effect ◽  
Biological Effects ◽  
Model Organism ◽  
Lethal Effect ◽  
Molecular Ions ◽  
Ion Beams ◽  
Cluster Ions ◽  
Significant Difference ◽  
Cluster Ion Beams ◽  
Cluster Ion

Cluster ion beams have unique features in energy deposition, but their biological effects are yet to be examined. In this study, we employed bacterial spores as a model organism, established an irradiation method, and examined the lethal effect of 2 MeV C, 4 MeV C2, and 6 MeV C3 ion beams. The lethal effect per particle (per number of molecular ions) was not significantly different between cluster and monomer ion beams. The relative biological effectiveness and inactivation cross section as a function of linear energy transfer (LET) suggested that the single atoms of 2 MeV C deposited enough energy to kill the spores, and, therefore, there was no significant difference between the cluster and monomer ion beams in the cell killing effect under this experimental condition. We also considered the behavior of the atoms of cluster ions in the spores after the dissociation of cluster ions into monomer ions by losing bonding electrons through inelastic collisions with atoms on the surface. To the best of our knowledge, this is the first report to provide a basis for examining the biological effect of cluster ions.

scholarly journals The mathematical principles and design of the NAIS – a spectrometer for the measurement of cluster ion and nanometer aerosol size distributions

2013 ◽  
Vol 6 (4) ◽  
pp. 1061-1071 ◽  
Author(s):  
S. Mirme ◽  
A. Mirme
Keyword(s):  
Size Range ◽  
Aerosol Particles ◽  
Charged Particles ◽  
Cluster Ions ◽  
Size Distributions ◽  
Neutral Cluster ◽  
Design Data ◽  
Cluster Ion ◽  
Principles Of Design ◽  
Spectrum Deconvolution

Abstract. The paper describes the Neutral cluster and Air Ion Spectrometer (NAIS) – a multichannel aerosol instrument capable of measuring the distribution of ions (charged particles and cluster ions) of both polarities in the electric mobility range from 3.2 to 0.0013 cm2 V−1 s−1 and the distribution of aerosol particles in the size range from 2.0 to 40 nm. We introduce the principles of design, data processing and spectrum deconvolution of the instrument.

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