In-plane lattice parameter determination of Zn:LiNbO3thin films epitaxially grown on x-cut LiNbO3substrates using X-ray diffraction methods

2007 ◽  
Vol 204 (8) ◽  
pp. 2585-2590 ◽  
Author(s):  
J. Kräußlich ◽  
C. Dubs ◽  
A. Lorenz ◽  
A. Tünnermann
Keyword(s):  
Lattice Parameter ◽  
Parameter Determination ◽  
X Ray Diffraction ◽  
X Ray ◽  
Plane Lattice

High-precision absolute lattice parameter determination of SrTiO3, DyScO3 and NdGaO3 single crystals

2012 ◽  
Vol 68 (1) ◽  
pp. 8-14 ◽  
Author(s):  
Martin Schmidbauer ◽  
Albert Kwasniewski ◽  
Jutta Schwarzkopf
Keyword(s):  
High Resolution ◽  
High Precision ◽  
Room Temperature ◽  
Systematic Errors ◽  
Lattice Parameter ◽  
Parameter Determination ◽  
X Ray Diffraction ◽  
X Ray ◽  
Bond Method

The lattice parameters of three perovskite-related oxides have been measured with high precision at room temperature. An accuracy of the order of 10−5 has been achieved by applying a sophisticated high-resolution X-ray diffraction technique which is based on the modified Bond method. The results on cubic SrTiO3 [a = 3.905268 (98) Å], orthorhombic DyScO3 [a = 5.442417 (54), b = 5.719357 (52) and c = 7.904326 (98) Å], and orthorhombic NdGaO3 [a = 5.428410 (54), b = 5.498407 (55) and c = 7.708878 (95) Å] are discussed in view of possible systematic errors as well as non-stoichiometry in the crystals.

Lattice Parameter Determination of Textured Co81−xCr15PtxTa4 Thin Films

1999 ◽  
Vol 562 ◽  
Author(s):  
B. Lu ◽  
S. D. Harkness ◽  
W. A. Lewis ◽  
D. E. Laughlin ◽  
D. N. Lambeth
Keyword(s):  
Thin Films ◽  
Electron Diffraction ◽  
Lattice Parameter ◽  
Parameter Determination ◽  
X Ray Diffraction ◽  
X Ray ◽  
Vegard’S Law ◽  
Variation Rate ◽  
Sputter Deposited

ABSTRACTThe thin films Co81−xCr15PtxTa4 with (0002) crystallographic texture have been sputter deposited with and without substrate bias. The lattice parameter of the thin films has been determined by a combination of x-ray diffraction and electron diffraction techniques. The resolution of the electron diffraction was enhanced by a digital imaging technique. The variation rate of the a lattice parameter with Pt content is consistent with Vegard's law. The change in the c lattice parameter is much greater than what is expected from Vegard's law.

Problems Associated with Kα Doublet in Residual Stress Measurements

1979 ◽  
Vol 23 ◽  
pp. 333-339
Author(s):  
S. K. Gupta ◽  
B. D. Cullity
Keyword(s):  
Residual Stress ◽  
Silicon Powder ◽  
Lattice Parameter ◽  
Diffraction Peak ◽  
Parameter Determination ◽  
X Ray Diffraction ◽  
X Ray ◽  
Analysis Techniques ◽  
The Difference ◽  
Similar Accuracy

Since the measurement of residual stress by X-ray diffraction techniques is dependent on the difference in angle of a diffraction peak maximum when the sample is examined consecutively with its surface at two different angles to the diffracting planes, it is important that these diffraction angles be obtained precisely, preferably with an accuracy of ± 0.01 deg. 2θ. Similar accuracy is desired in precise lattice parameter determination. In such measurements, it is imperative that the diffractometer be well-aligned. It is in the context of diffractometer alignment with the aid of a silicon powder standard free of residual stress that the diffraction peak analysis techniques described here have been developed, preparatory to residual stress determinations.

Lattice parameter determination by coincidental multi-beam X-ray diffraction

2009 ◽  
Vol 206 (8) ◽  
pp. 1699-1703 ◽  
Author(s):  
Mariana Borcha ◽  
Igor Fodchuk ◽  
Igor Krytsun
Keyword(s):  
Lattice Parameter ◽  
Parameter Determination ◽  
X Ray Diffraction ◽  
X Ray

X-ray structure determination of the rare earth oxides (Er1−uGdu)2O3applying the Rietveld method

2002 ◽  
Vol 35 (5) ◽  
pp. 577-580 ◽  
Author(s):  
Zein Heiba ◽  
Hasan Okuyucu ◽  
Y. S. Hascicek
Keyword(s):  
Rare Earth ◽  
Rietveld Method ◽  
Sol Gel ◽  
Average Crystallite Size ◽  
Lattice Parameter ◽  
X Ray Diffraction ◽  
X Ray ◽  
Gel Technique ◽  
Average Size

Nanosized polycrystalline samples of (Er1−uGdu)2O3(0 ≤u≤ 1.0) were synthesized by a sol–gel technique. X-ray diffraction data were collected and the crystal structures were refined by the Rietveld method. All samples are found to have the same crystal system and formed solid solutions over the whole range ofu. The Er3+and Gd3+ions were randomly distributed over two cationic sites, 8band 24d, in the space groupIa\bar{3} (206) in all refined structures. The lattice parameter was found to vary non-linearly with the composition (u). The average microstrain and average crystallite size have been calculated from the Williamson–Hall plots for each sample. The average size ranges from 50 to 70 nm, and the microstrain from 0.4 to 1.7%.

scholarly journals Determination of Residual Stresses in an Oxidized Metallic Alloy under Thermal Loadings

Metals ◽  
2018 ◽  
Vol 8 (11) ◽  
pp. 913
Author(s):  
Zhimao Wang ◽  
Jean-Luc Grosseau-Poussard ◽  
Benoît Panicaud ◽  
Guillaume Geandier ◽  
Pierre-Olivier Renault ◽  
...  
Keyword(s):  
Residual Stresses ◽  
Correction Method ◽  
Lattice Parameter ◽  
European Synchrotron Radiation Facility ◽  
X Ray Diffraction ◽  
Synchrotron Diffraction ◽  
X Ray ◽  
Crystallographic Planes

In order to clarify the mechanical features of a metal under thermal cyclic loading for the system Ni30Cr-Cr2O3, a specific study has been carried out. In the present work, the residual stresses in both the metal and the oxide layer have been investigated. An adapted method is applied to process the experimental results that were obtained by using in-situ high temperature synchrotron diffraction at European Synchrotron Radiation Facility. The sin2ψ analysis provides information about the stress in metal and oxide. X-ray diffraction provides also the lattice parameter between crystallographic planes in the metal. To obtain correct stress values, a correction method is also proposed taking into account different discrepancies sources to ensure the equation of mechanical balance.

Determination of lattice parameter and elastic properties of porous silicon by X-ray diffraction

1984 ◽  
Vol 68 (3) ◽  
pp. 727-732 ◽  
Author(s):  
K. Barla ◽  
R. Herino ◽  
G. Bomchil ◽  
J.C. Pfister ◽  
A. Freund
Keyword(s):  
Porous Silicon ◽  
Elastic Properties ◽  
Lattice Parameter ◽  
X Ray Diffraction ◽  
X Ray
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