Lattice Parameter Determination of Textured Co81−xCr15PtxTa4 Thin Films
Keyword(s):
X Ray
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ABSTRACTThe thin films Co81−xCr15PtxTa4 with (0002) crystallographic texture have been sputter deposited with and without substrate bias. The lattice parameter of the thin films has been determined by a combination of x-ray diffraction and electron diffraction techniques. The resolution of the electron diffraction was enhanced by a digital imaging technique. The variation rate of the a lattice parameter with Pt content is consistent with Vegard's law. The change in the c lattice parameter is much greater than what is expected from Vegard's law.
2007 ◽
Vol 204
(8)
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pp. 2585-2590
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High-precision absolute lattice parameter determination of SrTiO3, DyScO3 and NdGaO3 single crystals
2012 ◽
Vol 68
(1)
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pp. 8-14
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Keyword(s):
X Ray
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1996 ◽
Vol 54
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pp. 1020-1021
Structure determination of modulated structures by powder X-ray diffraction and electron diffraction
2016 ◽
Vol 3
(11)
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pp. 1351-1362
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Keyword(s):
X Ray
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2017 ◽
Vol 4
(10)
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pp. 1654-1659
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