Time-of-flight mass spectrometry depth profiling of sodium-implanted polyethylene terephthalate

2017 ◽  
Vol 49 (10) ◽  
pp. 1049-1052
Author(s):  
Yu Kudriavtsev ◽  
A.G. Hernández ◽  
R. Asomoza ◽  
V.M. Korol
Keyword(s):  
Mass Spectrometry ◽  
Polyethylene Terephthalate ◽  
Time Of Flight ◽  
Depth Profiling ◽  
Flight Mass Spectrometry

Depth profiling by pulsed glow discharge time-of-flight mass spectrometry with a combined hollow cathode cell

2020 ◽  
Vol 35 (8) ◽  
pp. 1587-1596
Author(s):  
Anna Gubal ◽  
Victoria Chuchina ◽  
Yegor Lyalkin ◽  
Vladimir Mikhailovskii ◽  
Viktor Yakobson ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Glow Discharge ◽  
Hollow Cathode ◽  
Time Of Flight ◽  
Depth Profiling ◽  
Discharge Time ◽  
Pulsed Glow Discharge ◽  
Flight Mass Spectrometry ◽  
Depth Analysis ◽  
Mass Spectrometry System

A combined hollow cathode microsecond direct current pulsed glow discharge time-of-flight mass spectrometry system has proved its efficiency for quantification; however, it has not been properly tested for the purpose of depth analysis.

Depth profiling of nanometer thin layers by laser desorption and laser postionization time-of-flight mass spectrometry

2017 ◽  
Vol 32 (10) ◽  
pp. 1878-1884 ◽  
Author(s):  
Zhibin Yin ◽  
Xiaoling Cheng ◽  
Rong Liu ◽  
Wei Hang ◽  
Benli Huang
Keyword(s):  
Mass Spectrometry ◽  
Mass Spectrometer ◽  
Time Of Flight ◽  
Depth Profiling ◽  
Laser Desorption ◽  
Thin Layers ◽  
Flight Mass Spectrometer ◽  
Flight Mass Spectrometry

A laser desorption and laser postionization time-of-flight mass spectrometer was employed for the depth profiling of nanometer thin-layers.

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