Continuous Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy

Abstract Numerous nanometrology techniques concerned with probing a wide range of frequency dependent properties would benefit from a cantilevered sensor with tunable natural frequencies. In this work, we propose a method to arbitrarily tune the stiffness and natural frequencies of a microplate sensor for atomic force microscope applications, thereby allowing resonance amplification at a broad range of frequencies. This method is predicated on the principle of curvature-based stiffening. A macroscale experiment is conducted to verify the feasibility of the method. Next, a microscale finite element analysis is conducted on a proof-of-concept device. We show that both the stiffness and various natural frequencies of the device can be highly controlled through applied transverse curvature. Dynamic phenomena encountered in the method, such as eigenvalue curve veering, are discussed and methods are presented to accommodate these phenomena. We believe that this study will facilitate the development of future curvature-based microscale sensors for atomic force microscopy applications.

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Scanning speed phenomenon in contact-resonance atomic force microscopy

Beilstein Journal of Nanotechnology ◽

10.3762/bjnano.9.87 ◽

2018 ◽

Vol 9 ◽

pp. 945-952 ◽

Cited By ~ 3

Author(s):

Christopher C Glover ◽

Jason P Killgore ◽

Ryan C Tung

Keyword(s):

Atomic Force Microscopy ◽

Hydrodynamic Theory ◽

Squeeze Film ◽

Resonance Spectroscopy ◽

Related Phenomenon ◽

Contact Mode ◽

Force Microscopy ◽

Atomic Force ◽

Scan Speed ◽

Contact Resonance

This work presents data confirming the existence of a scan speed related phenomenon in contact-mode atomic force microscopy (AFM). Specifically, contact-resonance spectroscopy is used to interrogate this phenomenon. Above a critical scan speed, a monotonic decrease in the recorded contact-resonance frequency is observed with increasing scan speed. Proper characterization and understanding of this phenomenon is necessary to conduct accurate quantitative imaging using contact-resonance AFM, and other contact-mode AFM techniques, at higher scan speeds. A squeeze film hydrodynamic theory is proposed to explain this phenomenon, and model predictions are compared against the experimental data.

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Surface potential investigation on single wall carbon nanotubes by Kelvin probe force microscopy and atomic force microscope potentiometry

Nanotechnology ◽

10.1088/0957-4484/18/8/084008 ◽

2007 ◽

Vol 18 (8) ◽

pp. 084008 ◽

Cited By ~ 13

Author(s):

Yuji Miyato ◽

Kei Kobayashi ◽

Kazumi Matsushige ◽

Hirofumi Yamada

Keyword(s):

Carbon Nanotubes ◽

Atomic Force Microscope ◽

Surface Potential ◽

Kelvin Probe Force Microscopy ◽

Single Wall Carbon Nanotubes ◽

Kelvin Probe ◽

Single Wall Carbon ◽

Force Microscopy ◽

Atomic Force

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Atomic force microscopy of slip lines in FeAl

Journal of Materials Research ◽

10.1557/jmr.1995.2159 ◽

1995 ◽

Vol 10 (9) ◽

pp. 2159-2161 ◽

Cited By ~ 9

Author(s):

J.H. Schneibel ◽

L. Martínez

Keyword(s):

Atomic Force Microscopy ◽

Atomic Force Microscope ◽

Room Temperature ◽

Frequency Distributions ◽

Slip Lines ◽

Force Microscopy ◽

Atomic Force ◽

Shear Strains

Fe–40 at. % Al–0.1 at. % B specimens were polished flat, strained at room temperature, and examined in an atomic force microscope. The angles of height contours perpendicular to the slip lines were interpreted as shear strains and were statistically evaluated. The frequency distributions of these shear strains correlated well with the macroscopic strains. The maximum shear strains found were not much larger than the macroscopic strains. In particular, no steep slip steps corresponding to large local shears were found.

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