A background correction for energy-dispersive X-ray analysis of thin sections

1977 ◽  
Vol 6 (3) ◽  
pp. 154-160 ◽  
Author(s):  
William M. Sherry ◽  
John B. Vander Sande
Keyword(s):  
Background Correction ◽  
Energy Dispersive ◽  
Thin Sections ◽  
X Ray

Energy-dispersive X-ray analysis on thin sections and unimpregnated soil material.

1975 ◽  
Vol 23 (2) ◽  
pp. 113-125
Author(s):  
E.B.A. Bisdom ◽  
S. Henstra ◽  
A. Jongerius ◽  
F. Thiel
Keyword(s):  
Chemical Elements ◽  
Research Abstract ◽  
Energy Dispersive ◽  
Topographic Image ◽  
Thin Sections ◽  
Soil Material ◽  
Crystalline Materials ◽  
X Ray ◽  
Loose Soil

A combination of scanning electron microscopy (SEM) and energy-dispersive X-ray analysis (EDXRA) was used in the study of soil materials. The investigation in situ of components in thin sections was used to estimate chemical elements with atomic numbers 11 upwards, from sodium on. EDXRA could detect chemical elements up to magnifications of X 10 000. The composition of amorphous and micro-crystalline materials cannot be estimated in thin sections by light microscopy but by this technique was clearly displayed. Composition of loose soil material can also be investigated. The material that could be studied by SEM-EDXRA did not need high polishing of the thin section, and the plastic used for impregnation of the soil material was not affected by the investigation.Identification of chemical elements in situ, high resolution of the topographic image and relatively short testing times for the elements make this combination of techniques useful for soil research. (Abstract retrieved from CAB Abstracts by CABI’s permission)

Thin sectioning, freeze fracturing, energy dispersive x-ray analysis, and chemical analysis in the study of inclusions in seed protein bodies: almond, Brazil nut, and quandong

1978 ◽  
Vol 56 (17) ◽  
pp. 2050-2061 ◽  
Author(s):  
John N. A. Lott ◽  
Mark S. Buttrose
Keyword(s):  
Chemical Analysis ◽  
Freeze Fracture ◽  
Prunus Dulcis ◽  
Energy Dispersive ◽  
Protein Bodies ◽  
Brazil Nut ◽  
Fixed Tissue ◽  
Thin Sections ◽  
X Ray ◽  
Freeze Dried

Protein bodies from almond (Prunus dulcis), Brazil nut (Bertholletia excelsa), and quandong (Santalum acuminatum) have been studied in thin sections of fixed and embedded tissue, in freeze-fracture replicas of unfixed tissue, by chemical analysis of tissue for P, K, Mg, and Ca, and by energy dispersive x-ray (EDX) analysis of both sections of glutaraldehyde-fixed tissue and freeze-dried tissue powders. The protein bodies in all three species contained globoid crystals, protein crystalloids, and proteinaceous matrix regions. Results of EDX analyses were consistent with globoid crystals being rich in phytin. Variation in both the structure and the elemental composition of globoids was common. In almond some globoids were lobed rather than spherical, and large globoid crystals often contained considerable calcium whereas small globoid crystals contained little if any calcium. The globoid crystals of Brazil nut often contained barium in addition to P, K, Ca, and Mg. Protein crystalloids of Brazil nut were compound crystals. Protein bodies of quandong seed, which is largely endosperm rather than embryo, were unexceptional.

scholarly journals Automated mineralogy based on micro-energy-dispersive X-ray fluorescence microscopy (µ-EDXRF) applied to plutonic rock thin sections in comparison to a mineral liberation analyzer

2017 ◽  
Vol 6 (2) ◽  
pp. 429-437 ◽  
Author(s):  
Wilhelm Nikonow ◽  
Dieter Rammlmair
Keyword(s):  
Supervised Classification ◽  
Energy Dispersive ◽  
Chemical Information ◽  
Spectral Angle Mapper ◽  
Thin Sections ◽  
Mineral Distribution ◽  
X Ray ◽  
Distribution Maps ◽  
Mineral Liberation ◽  
Automated Mineralogy

Abstract. Recent developments in the application of micro-energy-dispersive X-ray fluorescence spectrometry mapping (µ-EDXRF) have opened up new opportunities for fast geoscientific analyses. Acquiring spatially resolved spectral and chemical information non-destructively for large samples of up to 20 cm length provides valuable information for geoscientific interpretation. Using supervised classification of the spectral information, mineral distribution maps can be obtained. In this work, thin sections of plutonic rocks are analyzed by µ-EDXRF and classified using the supervised classification algorithm spectral angle mapper (SAM). Based on the mineral distribution maps, it is possible to obtain quantitative mineral information, i.e., to calculate the modal mineralogy, search and locate minerals of interest, and perform image analysis. The results are compared to automated mineralogy obtained from the mineral liberation analyzer (MLA) of a scanning electron microscope (SEM) and show good accordance, revealing variation resulting mostly from the limit of spatial resolution of the µ-EDXRF instrument. Taking into account the little time needed for sample preparation and measurement, this method seems suitable for fast sample overviews with valuable chemical, mineralogical and textural information. Additionally, it enables the researcher to make better and more targeted decisions for subsequent analyses.

scholarly journals Wavelength and energy-dispersive X-ray microanalysis with EMA and SEM-EDXRA on thin sections of soils.

1976 ◽  
Vol 24 (4) ◽  
pp. 209-222
Author(s):  
E.B.A. Bisdom ◽  
S. Henstra ◽  
E.M. Hornsveld ◽  
A. Jongerius ◽  
A.C. Letsch
Keyword(s):  
Organic Matter ◽  
Organic Material ◽  
Manganese Nodule ◽  
Energy Dispersive ◽  
Mass Analyzer ◽  
Light Elements ◽  
Thin Sections ◽  
Soil Material ◽  
X Ray ◽  
Iron Manganese

Organic matter, minerals and iron-manganese nodules were studied in thin sections of soils with an electron microprobe analyzer (EMA) and a combination of a scanning electron microscope (SEM) and an energy-dispersive X-ray analyzer (EDXRA). Both instruments were used to estimate the presence and nature of chemical elements in two selected areas, one containing a combination of organic and mineral material and another inside an iron-manganese nodule. The detection of organic matter proved problematic. Of the light elements, N could not be detected with EMA and O was detected but was not specific to organic matter. EMA could not be used for C because of the C coating of the thin section. SEM-EDXRA only detected heavier elements. EMA produced somewhat better X-ray images of heavier elements, especially from an iron-manganese nodule. However, with organic material, SEM-EDXRA X-ray images were similar to or slightly better than EMA. An advantage of SEM-EDXRA over EMA is that the soil material can be analysed at various magnifications with a much higher limit, and point analysis can be made of loose material. For soil material, SEM-EDXRA was better as a routine instrument which solved most problems. EMA can be used as a complementary instrument. Other microanalytical techniques such as the ion microprobe mass analyzer (IMMA) were necessary to analyse light elements in organic material of soils. (Abstract retrieved from CAB Abstracts by CABI’s permission)

X-Ray Nanoanalysis in the SEM

2005 ◽  
Author(s):  
William E. Vanderlinde ◽  
Don Chernoff
Keyword(s):  
Computer Software ◽  
Energy Dispersive ◽  
Bulk Analysis ◽  
Thin Sections ◽  
X Ray ◽  
Interaction Volume ◽  
Surface Sensitivity ◽  
Analysis Technique ◽  
Environmental Sem ◽  
Volume Size

Abstract Scanning electron microscopy (SEM)/energy dispersive x-ray spectroscopy (EDS) is generally thought of as a bulk analysis technique that is not suited for nano-scale analysis. This paper discusses several options for reducing or eliminating the interaction volume size and obtaining x-ray data with much higher spatial resolution and surface sensitivity than is typically achieved in the SEM. These include collecting data at very low accelerating voltages to minimize beam spread in the sample, tilting the sample to keep the interaction volume near the surface, and analyzing thin sections to reduce or eliminate the problem of beam spread in the sample. Computer software simulations, in conjunction with experimental data are used to illustrate these methods. The paper also discusses issues effecting EDS analysis in the environmental SEM. It has been shown that computer modeling is a useful tool for determining the optimum beam conditions to improve energy dispersive analysis in the SEM.

scholarly journals Automated mineralogy based on energy dispersive X-ray fluorescence microscopy (µ-EDXRF) applied to plutonic rock thin sections in comparison to Mineral Liberation Analyser

2017 ◽  
Author(s):  
Wilhelm Nikonow ◽  
Dieter Rammlmair
Keyword(s):  
Supervised Classification ◽  
Energy Dispersive ◽  
Chemical Information ◽  
Spectral Angle Mapper ◽  
Thin Sections ◽  
Mineral Distribution ◽  
X Ray ◽  
Distribution Maps ◽  
Mineral Liberation ◽  
Automated Mineralogy

Abstract. Recent development in the application of energy dispersive X-ray fluorescence spectrometry mapping (µ-EDXRF) has opened new opportunities for fast geoscientific analyses. Acquiring spatially resolved spectral and chemical information non-destructively for large samples of up to 20 cm length provides valuable information for geoscientific interpretation. Using supervised classification of the spectral information, mineral distribution maps can be obtained. In this work, thin sections of plutonic rocks are analyzed by µ-EDXRF and classified using the supervised classification algorithm Spectral Angle Mapper (SAM). Based on the mineral distribution maps, it is possible to obtain quantitative mineral information, i.e. to calculate the modal mineralogy, search and locate minerals of interest and perform image analysis. The results are compared to automated mineralogy obtained from the Mineral Liberation Analyser (MLA) of a Scanning Electron Microscope (SEM) and show good accordance, revealing variation resulting mostly from the limit of spatial resolution of the µ-EDXRF instrument. Taking into account the little time needed for sample preparation and measurement, this method seems well suitable for fast sample overviews with valuable chemical, mineralogical and textural information, and additionally, enabling the researcher to make better and more targeted decisions for subsequent analyses.

Basic literacy in electron-excited x-ray microanalysis

1993 ◽  
Vol 51 ◽  
pp. 502-503
Author(s):  
Dale E. Newbury
Keyword(s):  
Biological Sciences ◽  
Energy Dispersive ◽  
Automation System ◽  
X Rays ◽  
Thin Sections ◽  
X Ray ◽  
Operational Characteristics ◽  
Analysis Strategy ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes

Electron beam x-ray microanalysis with energy dispersive x-ray spectrometry (EDS), as performed in electron probe microanalyzers (EPMA)/scanning electron microscopes (SEM) for thick specimens and analytical electron microscopes (AEM) for thin sections, is a powerful technique with wide applicability in the physical and biological sciences and technology communities. The operation of an EDS x-ray microanalysis system has been automated to the point that many users now consider EDS to be a routine tool where the results reported by the automation system are always correct Unfortunately, there are numerous pitfalls awaiting the unwary analyst. All EDS users require a basic level of literacy in x-ray microanalysis to properly interpret spectra and develop a sensible analysis strategy for their problems. This “basic literacy” includes knowledge of the factors controlling the efficiency of production of characteristic and continuum x-rays, the characteristic energies and structure of x-ray families that provide the basis for qualitative analysis, the operational characteristics of energy dispersive x-ray spectrometers, including artifacts, and the systematic procedures for qualitative and quantitative analysis.

scholarly journals Multi-Scale Measurements of Neolithic Ceramics—A Methodological Comparison of Portable Energy-Dispersive XRF, Wavelength-Dispersive XRF, and Microcomputer Tomography

Minerals ◽  
2020 ◽  
Vol 10 (10) ◽  
pp. 931
Author(s):  
Julia Menne ◽  
Astrid Holzheid ◽  
Christopher Heilmann
Keyword(s):  
Energy Dispersive ◽  
Concentration Data ◽  
Portable Xrf ◽  
Thin Sections ◽  
X Ray ◽  
Ancient Pottery ◽  
Production Techniques ◽  
Cost Efficient ◽  
Non Destructive ◽  
Xrf Analyses

Archaeometric investigation of ancient pottery with regard to their material composites allows insights into the material structures, production techniques and manufacturing processes. The applied methods depend on the classification of the pottery: some finds should remain unchanged for conservation reasons, other finds are less valuable or more common. While the first group cannot be destroyed for material analyses and the choice of analytical methods is limited, the latter can be investigated using destructive methods and thus can widen the spectrum of possible devices. Multi-element analyses of portable energy-dispersive X-ray fluorescence spectrometry (portable XRF) have become important for archaeological research, as portable XRF provides a quick overview about the chemical composition of potteries and can be used in non-destructive as well as destructive ways in addition to conventional microscopic examination and petrographic thin sections. While most portable XRF analyses of solely fracture surfaces do not provide satisfying results, portable XRF analyses on pulverized samples are a cost-efficient and fast alternative to wavelength-dispersive XRF (WD-XRF). In comparison to WD-XRF, portable XRF on pulverized samples provides reliable concentration data (K, Fe, Rb, Ti, V, Y, Zn, Zr), but other elements need to be corrected. X-ray microtomography (µCT) has proven to be a non-destructive technique to derive not only the porosity of ancient pottery but also to characterize temper components and non-plastic inclusions. Hence, the µCT technique has the potential to extract valuable information needed by archaeologists, for example, to deduce details about manufacturing.

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