scholarly journals Automated mineralogy based on micro-energy-dispersive X-ray fluorescence microscopy (µ-EDXRF) applied to plutonic rock thin sections in comparison to a mineral liberation analyzer

2017 ◽  
Vol 6 (2) ◽  
pp. 429-437 ◽  
Author(s):  
Wilhelm Nikonow ◽  
Dieter Rammlmair
Keyword(s):  
Supervised Classification ◽  
Energy Dispersive ◽  
Chemical Information ◽  
Spectral Angle Mapper ◽  
Thin Sections ◽  
Mineral Distribution ◽  
X Ray ◽  
Distribution Maps ◽  
Mineral Liberation ◽  
Automated Mineralogy

Abstract. Recent developments in the application of micro-energy-dispersive X-ray fluorescence spectrometry mapping (µ-EDXRF) have opened up new opportunities for fast geoscientific analyses. Acquiring spatially resolved spectral and chemical information non-destructively for large samples of up to 20 cm length provides valuable information for geoscientific interpretation. Using supervised classification of the spectral information, mineral distribution maps can be obtained. In this work, thin sections of plutonic rocks are analyzed by µ-EDXRF and classified using the supervised classification algorithm spectral angle mapper (SAM). Based on the mineral distribution maps, it is possible to obtain quantitative mineral information, i.e., to calculate the modal mineralogy, search and locate minerals of interest, and perform image analysis. The results are compared to automated mineralogy obtained from the mineral liberation analyzer (MLA) of a scanning electron microscope (SEM) and show good accordance, revealing variation resulting mostly from the limit of spatial resolution of the µ-EDXRF instrument. Taking into account the little time needed for sample preparation and measurement, this method seems suitable for fast sample overviews with valuable chemical, mineralogical and textural information. Additionally, it enables the researcher to make better and more targeted decisions for subsequent analyses.

scholarly journals Automated mineralogy based on energy dispersive X-ray fluorescence microscopy (µ-EDXRF) applied to plutonic rock thin sections in comparison to Mineral Liberation Analyser

2017 ◽  
Author(s):  
Wilhelm Nikonow ◽  
Dieter Rammlmair
Keyword(s):  
Supervised Classification ◽  
Energy Dispersive ◽  
Chemical Information ◽  
Spectral Angle Mapper ◽  
Thin Sections ◽  
Mineral Distribution ◽  
X Ray ◽  
Distribution Maps ◽  
Mineral Liberation ◽  
Automated Mineralogy

Abstract. Recent development in the application of energy dispersive X-ray fluorescence spectrometry mapping (µ-EDXRF) has opened new opportunities for fast geoscientific analyses. Acquiring spatially resolved spectral and chemical information non-destructively for large samples of up to 20 cm length provides valuable information for geoscientific interpretation. Using supervised classification of the spectral information, mineral distribution maps can be obtained. In this work, thin sections of plutonic rocks are analyzed by µ-EDXRF and classified using the supervised classification algorithm Spectral Angle Mapper (SAM). Based on the mineral distribution maps, it is possible to obtain quantitative mineral information, i.e. to calculate the modal mineralogy, search and locate minerals of interest and perform image analysis. The results are compared to automated mineralogy obtained from the Mineral Liberation Analyser (MLA) of a Scanning Electron Microscope (SEM) and show good accordance, revealing variation resulting mostly from the limit of spatial resolution of the µ-EDXRF instrument. Taking into account the little time needed for sample preparation and measurement, this method seems well suitable for fast sample overviews with valuable chemical, mineralogical and textural information, and additionally, enabling the researcher to make better and more targeted decisions for subsequent analyses.

scholarly journals Micro-Fabric Analyzer (MFA): A New Semiautomated ArcGIS-Based Edge Detector for Quantitative Microstructural Analysis of Rock Thin-Sections

2021 ◽  
Vol 10 (2) ◽  
pp. 51 ◽  
Author(s):  
Roberto Visalli ◽  
Gaetano Ortolano ◽  
Gaston Godard ◽  
Rosolino Cirrincione
Keyword(s):  
Physical Properties ◽  
Electron Backscatter Diffraction ◽  
Microstructural Analysis ◽  
Image Features ◽  
Elemental Distribution ◽  
Edge Detector ◽  
Sandstone Sample ◽  
Thin Sections ◽  
X Ray ◽  
Distribution Maps

Micro-Fabric Analyzer (MFA) is a new GIS-based tool for the quantitative extrapolation of rock microstructural features that takes advantage both of the characteristics of the X-ray images and the optical image features. Most of the previously developed edge mineral grain detectors are uniquely based on the physical properties of the X-ray-, electron-, or optical-derived images; not permitting the exploitation of the specific physical properties of each image type at the same time. More advanced techniques, such as 3D microtomography, permit the reconstruction of tridimensional models of mineral fabric arrays, even though adjacent mineral grain boundaries with the same atomic density are often not detectable. Only electron backscatter diffraction (EBSD) allows providing high-performing grain boundary detection that is crystallographically differentiated per mineral phase, even though it is relatively expensive and can be executed only in duly equipped microanalytical laboratories by suitably trained users. Instead, the MFA toolbox allows quantifying fabric parameters subdivided per mineral type starting from a crossed-polarizers high-resolution RGB image, which is useful for identifying the edges of the individual grains characterizing rock fabrics. Then, this image is integrated with a set of micro-X-ray maps, which are useful for the quantitative extrapolation of elemental distribution maps. In addition, all this is achieved by means of low-cost and easy-to-use equipment. We applied the tool on amphibolite, mylonitic-paragneiss, and -tonalite samples to extrapolate the particle fabric on different metamorphic rock types, as well as on the same sandstone sample used for another edge detector, which is useful for comparing the obtained results.

A background correction for energy-dispersive X-ray analysis of thin sections

1977 ◽  
Vol 6 (3) ◽  
pp. 154-160 ◽  
Author(s):  
William M. Sherry ◽  
John B. Vander Sande
Keyword(s):  
Background Correction ◽  
Energy Dispersive ◽  
Thin Sections ◽  
X Ray

Energy-dispersive X-ray analysis on thin sections and unimpregnated soil material.

1975 ◽  
Vol 23 (2) ◽  
pp. 113-125
Author(s):  
E.B.A. Bisdom ◽  
S. Henstra ◽  
A. Jongerius ◽  
F. Thiel
Keyword(s):  
Chemical Elements ◽  
Research Abstract ◽  
Energy Dispersive ◽  
Topographic Image ◽  
Thin Sections ◽  
Soil Material ◽  
Crystalline Materials ◽  
X Ray ◽  
Loose Soil

A combination of scanning electron microscopy (SEM) and energy-dispersive X-ray analysis (EDXRA) was used in the study of soil materials. The investigation in situ of components in thin sections was used to estimate chemical elements with atomic numbers 11 upwards, from sodium on. EDXRA could detect chemical elements up to magnifications of X 10 000. The composition of amorphous and micro-crystalline materials cannot be estimated in thin sections by light microscopy but by this technique was clearly displayed. Composition of loose soil material can also be investigated. The material that could be studied by SEM-EDXRA did not need high polishing of the thin section, and the plastic used for impregnation of the soil material was not affected by the investigation.Identification of chemical elements in situ, high resolution of the topographic image and relatively short testing times for the elements make this combination of techniques useful for soil research. (Abstract retrieved from CAB Abstracts by CABI’s permission)

Thin sectioning, freeze fracturing, energy dispersive x-ray analysis, and chemical analysis in the study of inclusions in seed protein bodies: almond, Brazil nut, and quandong

1978 ◽  
Vol 56 (17) ◽  
pp. 2050-2061 ◽  
Author(s):  
John N. A. Lott ◽  
Mark S. Buttrose
Keyword(s):  
Chemical Analysis ◽  
Freeze Fracture ◽  
Prunus Dulcis ◽  
Energy Dispersive ◽  
Protein Bodies ◽  
Brazil Nut ◽  
Fixed Tissue ◽  
Thin Sections ◽  
X Ray ◽  
Freeze Dried

Protein bodies from almond (Prunus dulcis), Brazil nut (Bertholletia excelsa), and quandong (Santalum acuminatum) have been studied in thin sections of fixed and embedded tissue, in freeze-fracture replicas of unfixed tissue, by chemical analysis of tissue for P, K, Mg, and Ca, and by energy dispersive x-ray (EDX) analysis of both sections of glutaraldehyde-fixed tissue and freeze-dried tissue powders. The protein bodies in all three species contained globoid crystals, protein crystalloids, and proteinaceous matrix regions. Results of EDX analyses were consistent with globoid crystals being rich in phytin. Variation in both the structure and the elemental composition of globoids was common. In almond some globoids were lobed rather than spherical, and large globoid crystals often contained considerable calcium whereas small globoid crystals contained little if any calcium. The globoid crystals of Brazil nut often contained barium in addition to P, K, Ca, and Mg. Protein crystalloids of Brazil nut were compound crystals. Protein bodies of quandong seed, which is largely endosperm rather than embryo, were unexceptional.

Investigation of The Oxidation Behaviour of A TiAlCrYN Pvd Hard Coating

2000 ◽  
Vol 648 ◽  
Author(s):  
Mirkka I. Lembke ◽  
John M. Titchmarsh ◽  
D. Brian Lewis ◽  
W.-Dieter Münz
Keyword(s):  
Heat Treatment ◽  
High Speed ◽  
Steel Substrate ◽  
Energy Dispersive ◽  
Hard Coating ◽  
Base Layer ◽  
Sharp Change ◽  
Cross Sectional ◽  
X Ray ◽  
Distribution Maps

AbstractFor dry high speed cutting the oxidation resistance of the protective hard coating of the cutting tool surface is very important. Therefore the effects of heat treatment on a TiAlN based hard coating deposited by the combined cathodic arc unbalanced magnetron sputtering technique have been studied using cross sectional transmission electron microscopy (XTEM) and energy dispersive X-ray analysis (EDX). The combination of these analytical techniques revealed the diffusion paths and preferences in diffusion of various coating and substrate elements in a physical vapour deposited (PVD) type coating after heat treatment. The structure comprises a ~2 µm thick TiAlCrYN coating on top of a 0.25 µm thick TiAlCrN base layer deposited on a stainless steel substrate. In the as-deposited sample Y was distributed in a fine layered structure (1.7 nm) throughout the coating. The coating was heat treated at temperatures between 600 °C and 900 °C in air for 10 hrs duration. With increasing temperature the microstructure changed gradually from interrupted columnar growth to a fully columnar structure at 900 °C as observed with XTEM. EDX analysis after heat treatment at 700 °C showed the presence of substrate elements Fe and Cr mainly at column boundaries in the base layer. In contrast no evidence of substrate elements could be observed in the TiAlCrYN coating, thus showing a sharp change in elemental composition concerning Cr and Fe between base layer and coating. This indicates that Y segregation in the TiAlCrYN coating along column boundaries inhibited column boundary diffusion of the substrate elements Cr and Fe. Energy dispersive X-ray distribution maps recorded after 800 °C annealing showed distinct segregation of Y along the column boundaries. The substrate elements, Fe and Cr, were observed through the coating along column boundaries up to 0.95 µm from the base layer/coating interface. After heat treatment at 900 °C the substrate elements had diffused from the substrate/coating interface to the coating surface. Y out-diffused, too and was concentrated adjacent to TiO2 crystals in the oxide layer.

scholarly journals Wavelength and energy-dispersive X-ray microanalysis with EMA and SEM-EDXRA on thin sections of soils.

1976 ◽  
Vol 24 (4) ◽  
pp. 209-222
Author(s):  
E.B.A. Bisdom ◽  
S. Henstra ◽  
E.M. Hornsveld ◽  
A. Jongerius ◽  
A.C. Letsch
Keyword(s):  
Organic Matter ◽  
Organic Material ◽  
Manganese Nodule ◽  
Energy Dispersive ◽  
Mass Analyzer ◽  
Light Elements ◽  
Thin Sections ◽  
Soil Material ◽  
X Ray ◽  
Iron Manganese

Organic matter, minerals and iron-manganese nodules were studied in thin sections of soils with an electron microprobe analyzer (EMA) and a combination of a scanning electron microscope (SEM) and an energy-dispersive X-ray analyzer (EDXRA). Both instruments were used to estimate the presence and nature of chemical elements in two selected areas, one containing a combination of organic and mineral material and another inside an iron-manganese nodule. The detection of organic matter proved problematic. Of the light elements, N could not be detected with EMA and O was detected but was not specific to organic matter. EMA could not be used for C because of the C coating of the thin section. SEM-EDXRA only detected heavier elements. EMA produced somewhat better X-ray images of heavier elements, especially from an iron-manganese nodule. However, with organic material, SEM-EDXRA X-ray images were similar to or slightly better than EMA. An advantage of SEM-EDXRA over EMA is that the soil material can be analysed at various magnifications with a much higher limit, and point analysis can be made of loose material. For soil material, SEM-EDXRA was better as a routine instrument which solved most problems. EMA can be used as a complementary instrument. Other microanalytical techniques such as the ion microprobe mass analyzer (IMMA) were necessary to analyse light elements in organic material of soils. (Abstract retrieved from CAB Abstracts by CABI’s permission)

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