Р-ρ-Т Relationships of Low Pressure Helium—Hydrogen Mixtures at Cryogenic Temperatures

1967 ◽  
pp. 719-729
Author(s):  
A. M. Sholander ◽  
H. B. Nudelman
Keyword(s):  
Low Pressure ◽  
Cryogenic Temperatures ◽  
Hydrogen Mixtures

GAS DYNAMIC OPERATING MODES OF LOW PRESSURE GAS NETWORKS DURING TRANSPORT GAS-HYDROGEN MIXTURES

2017 ◽  
Author(s):  
Mariia Serediuk ◽  
Keyword(s):  
Volume Fraction ◽  
Chemical Properties ◽  
Low Pressure ◽  
Gas Networks ◽  
Operating Modes ◽  
Gas Dynamic ◽  
Dynamic Operating ◽  
Hydrogen Mixtures ◽  
Physical And Chemical ◽  
Gas Supply

By means of mathematical modeling the patterns of change the physical and chemical properties, necessary for calculations the gas networks of low pressure, for gas-hydrogen mixtures with volume fraction of hydrogen from zero to 100 % were found. The regularities of gas-dynamic calculations of lowpressure steel gas networks in the case of transportation of gas-hydrogen mixtures with different volume fraction of hydrogen while maintaining the costs and energy consumption of the elements of the gas supply system, typical for the transportation of natural gas were established.

Composites

1983 ◽  
pp. 413-463
Author(s):  
M. B. Kasen
Keyword(s):  
Composite Materials ◽  
Low Pressure ◽  
Concrete Aggregate ◽  
Reinforced Composites ◽  
Cryogenic Temperatures ◽  
Laminate Composites ◽  
Materials Properties ◽  
Cryogenic Technology ◽  
Composite Systems ◽  
Effects Of Radiation

Abstract Composite systems for cryogenic applications are discussed in this chapter. This chapter emphasizes filamentary-reinforced composites because they are the most widely used composite materials. It begins with a discussion on the approach to designing and fabricating with low-pressure laminate composites. This is followed by a section providing an overview of the materials in modern cryogenic technology. Then, the chapter describes the effect of cryogenic temperatures on materials properties; it also introduces the various joining techniques developed for composite materials. The effects of radiation on the properties of the materials are covered as well as the processes involved in testing laminates at cryogenic temperatures. Finally, the chapter provides information available on concrete aggregate composites.

Dissociation mechanism of chlorosilane to silicon in low pressure microwave plasmas of argon and argon with hydrogen mixtures

1983 ◽  
Vol 107 (3) ◽  
pp. 235-244 ◽  
Author(s):  
R. Avni ◽  
U. Carmi ◽  
I. Rosenthal ◽  
R. Manory ◽  
A. Grill
Keyword(s):  
Low Pressure ◽  
Microwave Plasmas ◽  
Dissociation Mechanism ◽  
Hydrogen Mixtures

Effects of Electrical Discharges in Low Pressure Gases on the Morphology of Polyethylene Crystals

1974 ◽  
Vol 32 ◽  
pp. 544-545
Author(s):  
L.H. Bolz ◽  
D.H. Reneker
Keyword(s):  
Power Distribution ◽  
Electrical Discharge ◽  
Dielectric Breakdown ◽  
Ionic Species ◽  
Low Pressure ◽  
Polymer Surfaces ◽  
Electrical Discharges ◽  
Adhesive Bonds ◽  
Power Distribution Lines ◽  
Modification Of The Surface

The attack, on the surface of a polymer, by the atomic, molecular and ionic species that are created in a low pressure electrical discharge in a gas is interesting because: 1) significant interior morphological features may be revealed, 2) dielectric breakdown of polymeric insulation on high voltage power distribution lines involves the attack on the polymer of such species created in a corona discharge, 3) adhesive bonds formed between polymer surfaces subjected to such SDecies are much stronger than bonds between untreated surfaces, 4) the chemical modification of the surface creates a reactive surface to which a thin layer of another polymer may be bonded by glow discharge polymerization.

Cryogenic atomic force microscopy

1991 ◽  
Vol 49 ◽  
pp. 54-55
Author(s):  
K. A. Fisher ◽  
M. G. L. Gustafsson ◽  
M. B. Shattuck ◽  
J. Clarke
Keyword(s):  
Room Temperature ◽  
Rapid Freezing ◽  
Cryogenic Temperatures ◽  
Soft Or ◽  
Electrically Conductive ◽  
Force Microscopy ◽  
Flexible Molecules ◽  
Advantages And Disadvantages ◽  
Atomic Force ◽  
Chemical Perturbation

The atomic force microscope (AFM) is capable of imaging electrically conductive and non-conductive surfaces at atomic resolution. When used to image biological samples, however, lateral resolution is often limited to nanometer levels, due primarily to AFM tip/sample interactions. Several approaches to immobilize and stabilize soft or flexible molecules for AFM have been examined, notably, tethering coating, and freezing. Although each approach has its advantages and disadvantages, rapid freezing techniques have the special advantage of avoiding chemical perturbation, and minimizing physical disruption of the sample. Scanning with an AFM at cryogenic temperatures has the potential to image frozen biomolecules at high resolution. We have constructed a force microscope capable of operating immersed in liquid n-pentane and have tested its performance at room temperature with carbon and metal-coated samples, and at 143° K with uncoated ferritin and purple membrane (PM).

Field ion microscopy

1988 ◽  
Vol 46 ◽  
pp. 434-435
Author(s):  
Gert Ehrlich
Keyword(s):  
Low Temperature ◽  
Sample Surface ◽  
Low Pressure ◽  
Radius Of Curvature ◽  
Field Ion Microscopy ◽  
Phosphor Screen ◽  
Ion Microscopy ◽  
Field Ion Microscope

The field ion microscope, devised by Erwin Muller in the 1950's, was the first instrument to depict the structure of surfaces in atomic detail. An FIM image of a (111) plane of tungsten (Fig.l) is typical of what can be done by this microscope: for this small plane, every atom, at a separation of 4.48Å from its neighbors in the plane, is revealed. The image of the plane is highly enlarged, as it is projected on a phosphor screen with a radius of curvature more than a million times that of the sample. Müller achieved the resolution necessary to reveal individual atoms by imaging with ions, accommodated to the object at a low temperature. The ions are created at the sample surface by ionization of an inert image gas (usually helium), present at a low pressure (< 1 mTorr). at fields on the order of 4V/Å.

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