Application of Combined X-Ray Photoelectron/Auger Spectroscopy to Studies of Inorganic Materials

1991 ◽  
pp. 1-23
Author(s):  
Dale L. Perry
Keyword(s):  
Auger Spectroscopy ◽  
Inorganic Materials ◽  
X Ray

History and Cross-Disciplinary Perspective of Compositional Imaging and Mapping With Nexafs Microscopy

1998 ◽  
Vol 4 (S2) ◽  
pp. 154-155
Author(s):  
H. Ade
Keyword(s):  
Electronic Structures ◽  
Chemical Shifts ◽  
Electronic States ◽  
Inorganic Materials ◽  
Chemical Bonds ◽  
Fundamental Physics ◽  
X Ray ◽  
Disciplinary Perspective ◽  
Core Electrons ◽  
X Ray Absorption

In Near Edge X-ray Absorption Fine Structure (NEXAFS) microscopy, excitations of core electrons into unoccupied molecular orbitals or electronic states provide sensitivity to a wide variety of chemical functionalities in molecules and solids. This sensitivity complements infrared (IR) spectroscopy, although the NEXAFS spectra are not quite as specific and “rich” as IR spectra. The sensitivity of NEXAFS to distinguish chemical bonds and electronic structures covers a wide variety of samples: from metals to inorganics and organics. (There is a tendency in the community to use the term NEXAFS for soft x-ray spectroscopy of organic materials, while for inorganic materials or at higher energies X-ray Absorption Near Edge Spectroscopy (XANES) is utilized, even though the fundamental physics is the same.) The sensitivity of NEXAFS is particularly high to distinguish saturated from unsaturated bonds. NEXAFS can also detect conjugation in a molecule, as well as chemical shifts due to heteroatoms.

scholarly journals A new Rubidium - Bismuth polyphosphate RbBi(PO3)4: Growth, X-ray single crystal and vibrational study

2014 ◽  
Vol 10 (7) ◽  
pp. 2881-2893
Author(s):  
Khaled JAOUADI ◽  
Tahar MHIRI ◽  
Nabil ZOUARI
Keyword(s):  
Single Crystal ◽  
Structural Type ◽  
Inorganic Materials ◽  
X Ray ◽  
Weighted Residuals ◽  
Type Iv ◽  
Anisotropic Temperature ◽  
Solution Studies ◽  
Bridge Oxygen ◽  
Temperature Factors

Solid-solution studies in the ternary Rb2O – Bi2O3 – P2O5 system, carried out in a search for inorganic materials have a considerable interest mainly for their optical properties, specifically in laser technology, yielded the new compound RbBi(PO3)4. Single-crystal X-ray measurement revealed that RbBi(PO3)4 crystallizes in space group P21/c with a structural type IV and has lattice parameters a = 10.430, b = 8.984, c = 12.967 Å,  = 126.1°, Z = 4 and V = 981.6 Å3. The all eighteen atoms were located in the asymmetric unit. Refinement using anisotropic temperature factors for all atoms yielded weighted residuals based on F and F2 values, respectively, of R1 = 0.0131 and WR2 = 0.0252 for all observed reflections. The atomic arrangement can be described as a long chain polyphosphate organization, helical ribbons (PO3)n. Two types of infinite chains, with a period of eight PO4 tetrahedra run along the longest unit-cell directions. Infrared and Raman spectra at room temperature, were investigated, show clearly some characteristics bands of infinite chains structure of PO4 tetrahedra linked by a bridge oxygen.

Structural and Concentration Heterogeneities during Formation of Silicide Phases in the Thin Film System Ti(5nm)/Ni(24nm)/Si(001)

2013 ◽  
Vol 344 ◽  
pp. 79-84
Author(s):  
S.I. Sidorenko ◽  
S.M. Voloshko ◽  
Yu.M. Мakogon ◽  
O.P. Pavlov ◽  
I.E. Kotenko ◽  
...  
Keyword(s):  
Thin Film ◽  
Mass Spectrometry ◽  
Solid State ◽  
Auger Spectroscopy ◽  
Solid State Reactions ◽  
Layer By Layer ◽  
Film System ◽  
X Ray ◽  
Thin Film System ◽  
Secondary Ions

By the methods of Auger-spectroscopy and mass-spectrometry of secondary ions, small-angle electron diffraction, X-ray and resistometry analyses the solid-state reactions in the Ti(5 nm)/ Ni(24 nm)/Si(001) thin film system at annealing in running nitrogen in the temperature interval of 723 – 1273 К are investigated. Regularities of phase transformations, consistency of solid-state reactions, layer-by-layer redistribution of components during annealing, features of surface morphology during formation of inclusions of silicide phases are established.

Al/Cu2O thermite compatibility studies by x-ray photoelectron and x-ray induced auger spectroscopy

1982 ◽  
Vol 5 (4) ◽  
pp. 297-308 ◽  
Author(s):  
P.S. Wang ◽  
L.D. Haws ◽  
W.E. Moddeman ◽  
A. Rengan
Keyword(s):  
Auger Spectroscopy ◽  
Compatibility Studies ◽  
X Ray

X-ray assembly for phase and element analysis of inorganic materials

2002 ◽  
Author(s):  
Nariman S. Ibraimov ◽  
Svetlana V. Nikitina ◽  
Ekaterina V. Likhushina ◽  
Oleg V. Michin
Keyword(s):  
Inorganic Materials ◽  
Element Analysis ◽  
X Ray

Solvothermal synthesis of hollow Eu2O3 microspheres using carbon template-assisted method

2012 ◽  
Vol 66 (8) ◽  
Author(s):  
Li-Xin Zhang ◽  
Yi-Xin Sun ◽  
Hong-Fang Jiu ◽  
Yue-Hua Fu ◽  
Yuan-Zhong Wang ◽  
...  
Keyword(s):  
Solvothermal Synthesis ◽  
Sol Gel ◽  
Hollow Structure ◽  
Inorganic Materials ◽  
Carbon Sphere ◽  
X Ray Diffraction ◽  
X Ray ◽  
High Productivity ◽  
Carbon Template ◽  
Transmission Electron

AbstractThis work presents a sol-gel carbon sphere template-assisted method of hollow Eu2O3 microspheres preparation. X-ray diffraction (XRD), transmission electron microscopy (TEM), thermogravimetric analysis (TGA), as well as photoluminescence (PL) were used to characterise the products. The formation of hollow structure Eu2O3 microspheres can be assigned to a sol-gel carbon template. Furthermore, this work may confirm that the precursor sol-gel can be loaded onto the inner as well as the outer surface of carbon templates similarly as ions and nanocrystals. The presented method can afford a simple and efficient technique to obtain a series of hollow structure inorganic materials with high productivity.

X-Ray Diffraction Intensity of Oxife Soild Soultions: Application to Qualitative and Quantitative Phase Analysis

1982 ◽  
Vol 26 ◽  
pp. 119-128 ◽  
Author(s):  
Ronald C. Gehringer ◽  
Gregory J. McCarthy ◽  
R.G. Garvey ◽  
Deane K. Smith
Keyword(s):  
Phase Analysis ◽  
Solid Solutions ◽  
Inorganic Materials ◽  
Quantitative Phase Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Cell Parameters ◽  
Qualitative And Quantitative ◽  
Quantitative Analyses ◽  
End Members

Solid solutions are pervasive in minerals and in industrial inorganic materials. The analyst is often called upon to provide qualitative and quantitative X-ray phase analysis for specimens containing solid solutions when all that is available are Powder Diffraction File (PDF) data or commercial standards for the end members. In an earlier paper (1) we presented several examples of substantial errors in accuracy of quantitative analysis that can arise when the crystallinity and composition of the analyte standard do not match those of the analyte in the sample of interest. We recommended that to obtain more accurate quantitative analyses, one should determine the analyte composition (e.g., from XRF on grains seen in a SEM or from comparison of cell parameters with those of the end members) and synthesize an analyte standard with this composition and with a crystallinity approximating that of the analyte (e.g., as determined from peak breadth or α1/ α2 splitting).

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