Scanning Tunneling Microscopy and Atomic Force Microscopy of Chemical-Vapor-Deposition Diamond and Diamond-Like Carbon Thin Films

Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) investigation of tetracyanoquinodimethane (TCNQ) and the related C60-TCNQ thin films is presented. Periodic molecular chains of the TCNQ on highly oriented pyrolytic graphite (HOPG) substrates were imaged, which demonstrated that the crystalline (001) plane was parallel to the substrate. For the C60-TCNQ thin films, we found that there were grains on the film surface. STM images within the grain revealed that the well-ordered rows and terraces, and the parallel rows in different grains were generally not in the same orientation. Moreover, the grain boundary was also observed. In addition, AFM was employed to modify the organic TCNQ film surface for the application of this type of materials to information recording and storage at the nanometer scale. The nanometer holes were successfully created on the TCNQ thin film by the AFM.

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Study of resonant tunneling in Au nanoclusters on the surface of SiO2/Si thin films using the combined scanning tunneling microscopy and atomic-force microscopy technique

Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques ◽

10.1134/s1027451009040132 ◽

2009 ◽

Vol 3 (4) ◽

pp. 559-565 ◽

Cited By ~ 4

Author(s):

M. A. Lapshina ◽

D. O. Filatov ◽

D. A. Antonov ◽

N. S. Barantsev

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Scanning Tunneling Microscopy ◽

Resonant Tunneling ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Au Nanoclusters ◽

Force Microscopy ◽

Microscopy Technique ◽

Atomic Force

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A comparison of nucleation and growth investigations of thin films using scanning tunneling microscopy, atomic force microscopy and X-ray scattering

Materials Science and Engineering B ◽

10.1016/s0921-5107(00)00385-8 ◽

2000 ◽

Vol 75 (1) ◽

pp. 29-37 ◽

Cited By ~ 6

Author(s):

C.V. Dharmadhikari ◽

A.O. Ali ◽

N. Suresh ◽

D.M. Phase ◽

S.M. Chaudhari ◽

...

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Scanning Tunneling Microscopy ◽

Nucleation And Growth ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

X Ray ◽

Force Microscopy ◽

X Ray Scattering ◽

Atomic Force

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INFLUENCE OF PLASMA PRETREATMENT IN THE FORMATION OF DIAMOND-LIKE CARBON THIN FILMS

Surface Review and Letters ◽

10.1142/s0218625x09013426 ◽

2009 ◽

Vol 16 (06) ◽

pp. 881-886 ◽

Cited By ~ 6

Author(s):

R. MAHESWARAN ◽

SHIVARAMAN RAMASWAMY ◽

OJAS MAHAPATRA ◽

B. PURNACHANDRA RAO ◽

C. GOPALAKRISHNAN ◽

...

Keyword(s):

Thin Films ◽

Raman Spectroscopy ◽

Vapor Deposition ◽

Chemical Vapor ◽

The Other ◽

Diamond Like Carbon ◽

Force Microscopy ◽

Uniform Coating ◽

Atomic Force ◽

Plasma Pretreatment

Plasma-enhanced chemical vapor deposition has been used to synthesize diamond-like carbon (DLC) thin films. High purity argon and methane gases were used as precursors for the fabrication of the DLC films. The influence of plasma pretreatment on the growth of the DLC films has been studied by subjecting one of the substrates to plasma pretreatment prior to deposition of the DLC films, while maintaining the other substrate as the control. The structural properties of the DLC films have been characterized using atomic force microscopy and Raman spectroscopy. The film grown on the pretreated substrate shows a more uniform coating as compared to the film grown on non-pretreated silicon substrate. The results are discussed based on diffusivity of carbon on silicon and the effect of the plasma pretreatment.

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Scanning Tunneling Microscopy and Atomic Force Microscopy Investigations on Organic Material Thin Films and Adsorbate Particles in Air

Atomic Force Microscopy/Scanning Tunneling Microscopy ◽

10.1007/978-1-4757-9322-2_15 ◽

1994 ◽

pp. 143-152

Author(s):

Michael Hietschold ◽

Olaf Pester ◽

Waltraud Vollmann ◽

Andreas Heilmann ◽

Peter Stabeler ◽

...

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Scanning Tunneling Microscopy ◽

Organic Material ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Force Microscopy ◽

Atomic Force

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Metalorganic chemical vapor deposition (MOCVD) and atomic force microscopy (AFM) study of high-quality Bi-2223 superconducting thin films

10.1117/12.206902 ◽

1995 ◽

Author(s):

Kazuhiro Endo

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Vapor Deposition ◽

Metalorganic Chemical Vapor Deposition ◽

Chemical Vapor ◽

Superconducting Thin Films ◽

High Quality ◽

Force Microscopy ◽

Atomic Force ◽

Metalorganic Chemical

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Exploring Intramolecular Methyl–Methyl Coupling on a Metal Surface for Edge-Extended Graphene Nanoribbons

Organic Materials ◽

10.1055/s-0041-1726295 ◽

2021 ◽

Vol 03 (02) ◽

pp. 128-133

Author(s):

Zijie Qiu ◽

Qiang Sun ◽

Shiyong Wang ◽

Gabriela Borin Barin ◽

Bastian Dumslaff ◽

...

Keyword(s):

Raman Spectroscopy ◽

Atomic Force Microscopy ◽

High Resolution ◽

Graphene Nanoribbons ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Force Microscopy ◽

Methyl Methyl ◽

Atomic Force ◽

Edge Extension

Intramolecular methyl–methyl coupling on Au (111) is explored as a new on-surface protocol for edge extension in graphene nanoribbons (GNRs). Characterized by high-resolution scanning tunneling microscopy, noncontact atomic force microscopy, and Raman spectroscopy, the methyl–methyl coupling is proven to indeed proceed at the armchair edges of the GNRs, forming six-membered rings with sp3- or sp2-hybridized carbons.

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