X-Ray Diffraction Scanning Microscopy — A New Method of Nondestructive Characterization of Composites

1989 ◽  
pp. 140-146
Author(s):  
M. P. Hentschel ◽  
A. Lange
Keyword(s):  
New Method ◽  
Scanning Microscopy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Nondestructive Characterization

scholarly journals Magnesium Borate Synthesis by Microwave Energy: A New Method

2013 ◽  
Vol 2013 ◽  
pp. 1-6 ◽  
Author(s):  
Azmi Seyhun Kipcak ◽  
Emek Moroydor Derun ◽  
Sabriye Piskin
Keyword(s):  
Reaction Times ◽  
High Heat ◽  
New Method ◽  
X Ray Diffraction ◽  
Magnesium Borate ◽  
X Ray ◽  
Boron Minerals ◽  
Ft Ir ◽  
Borate Minerals

Magnesium borates are one of the major groups of boron minerals that have important properties such as high heat and corrosion resistances and high coefficients of elasticity. In this study, magnesium borate minerals are synthesized using boric acid and magnesium oxide with a new method of microwave, and the synthesized minerals are characterized by various analysis techniques. The results show that pure, “magnesium borate hydrate” minerals are obtained at the end of various steps. The characterization of the products is determined with the techniques of X-Ray Diffraction (XRD), Fourier Transform Infrared Spectroscopy (FT-IR), Raman Spectroscopy, and Scanning Electron Microscopy (SEM). Additionally, overall “magnesium borate hydrate” yields are calculated and found about 67% at 270 W, 8 minutes and 360 W, 3 minutes of reaction times, respectively.

X-Ray Diffraction for Nondestructive Characterization of Polycrystalline Materials

1988 ◽  
Vol 142 ◽  
Author(s):  
C. O. Ruud ◽  
S. D. Weedman
Keyword(s):  
Computer Control ◽  
Polycrystalline Materials ◽  
X Ray Diffraction ◽  
X Ray ◽  
Position Sensitive ◽  
Computer Controlled ◽  
Xrd Techniques ◽  
Nondestructive Characterization

AbstractX-ray diffraction has long been the mainstay for materials characterization in the laboratory. This characterization includes the determination of phase composition, residual stress, microstrain, grain size, and crystallographic texture of polycrystalline metals, ceramics, and minerals. The analytical capabilities of XRD techniques have been expanded recently by the application of computer control to data collection and processing. These capabilities include the identification of irregularities in metals and ceramics that are caused by processing and fatigue damage, as well as the apriori prediction of processing anomolies. While the above applications have been largely restricted to the laboratory, the possibility for exploitation of the nondestructive nature of x-ray diffraction for inprocess evaluation of materials is now being realized. The availability of computer-controlled position-sensitive x-ray detectors can now provide rapid, non-contacting, in-process interrogation of materials. The examples of nondestructive characterization illustrated in this paper will be those that can be used for process control and/or damage assessment.

A Grazing Incidence X-Ray Reflectometer for Rapid Nondestructive Characterization of Thin Films and Interfaces

1991 ◽  
Vol 240 ◽  
Author(s):  
N. Loxley ◽  
A. Monteiro ◽  
M. L. Cooke ◽  
D. K. Bowen ◽  
B. K. Tanner
Keyword(s):  
Information Content ◽  
Grazing Incidence ◽  
Scattering Data ◽  
Quality Data ◽  
X Ray Diffraction ◽  
High Quality Data ◽  
X Ray ◽  
Minimum Criteria ◽  
Nondestructive Characterization

ABSTRACTWe describe a novel instrument dedicated to making rapid angular-dispersive grazing incidence X-ray reflectivity measurements. A novel, automatic, optical technique for rapid specimen alignment, is incorporated into the control software. We discuss the information content of diffuse scattering data collected in non-standard modes. Examples of data are presented showing the application to the characterization of semiconductors and metal multilayers. The technique is shown to be particularly powerful for measurement of the thickness of epitaxial films of AlGaAs on GaAs less than 50 nm thick and where high resolution X-ray diffraction becomes impracticable. We demonstrate that, as the method is insensitive to dislocation density, high quality data can be taken rapidly from heavily relaxed multilayers. Minimum criteria for adequate information content in the data are explored and the effect of specimen curvature is examined.

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

High Resolution Replication of Organoclay Surfaces

1982 ◽  
Vol 40 ◽  
pp. 576-577
Author(s):  
W. W. Barker ◽  
W. E. Rigsby ◽  
V. J. Hurst ◽  
W. J. Humphreys
Keyword(s):  
Clay Mineral ◽  
Organic Molecule ◽  
Organic Molecules ◽  
X Ray Diffraction ◽  
Xrd Pattern ◽  
X Ray ◽  
Naturally Occurring ◽  
Silicate Layers ◽  
Mineral Identification

Experimental clay mineral-organic molecule complexes long have been known and some of them have been extensively studied by X-ray diffraction methods. The organic molecules are adsorbed onto the surfaces of the clay minerals, or intercalated between the silicate layers. Natural organo-clays also are widely recognized but generally have not been well characterized. Widely used techniques for clay mineral identification involve treatment of the sample with H2 O2 or other oxidant to destroy any associated organics. This generally simplifies and intensifies the XRD pattern of the clay residue, but helps little with the characterization of the original organoclay. Adequate techniques for the direct observation of synthetic and naturally occurring organoclays are yet to be developed.

Synthesis and characterization of TiN / Ti / AISI 410 coatings

2018 ◽  
Vol 2 (1) ◽  
pp. 7
Author(s):  
S Chirino ◽  
Jaime Diaz ◽  
N Monteblanco ◽  
E Valderrama
Keyword(s):  
Synthesis And Characterization ◽  
Photoemission Spectroscopy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Columnar Grains ◽  
Tin Thin Films ◽  
Steel Aisi ◽  
Interacting Surfaces ◽  
Stainless Steel Aisi

The synthesis and characterization of Ti and TiN thin films of different thicknesses was carried out on a martensitic stainless steel AISI 410 substrate used for tool manufacturing. The mechanical parameters between the interacting surfaces such as thickness, adhesion and hardness were measured. By means of the scanning electron microscope (SEM) the superficial morphology of the Ti/TiN interface was observed, finding that the growth was of columnar grains and by means of EDAX the existence of titanium was verified.  Using X-ray diffraction (XRD) it was possible to observe the presence of residual stresses (~ -3.1 GPa) due to the different crystalline phases in the coating. Under X-ray photoemission spectroscopy (XPS) it was possible to observe the molecular chemical composition of the coating surface, being Ti-N, Ti-N-O and Ti-O the predominant ones.

Studies on the Preparation, Characterization and Solubility of -Cyclodextrin-Roxythromycin Inclusion Complexes

2009 ◽  
Vol 2 (2) ◽  
pp. 523-530
Author(s):  
D. Nagasamy Venkatesh ◽  
S. Karthick ◽  
M. Umesh ◽  
G. Vivek ◽  
R.M. Valliappan ◽  
...  
Keyword(s):  
Dissolution Rate ◽  
Inclusion Complexes ◽  
Phase Solubility ◽  
X Ray Diffraction ◽  
Scanning Calorimetry ◽  
X Ray ◽  
Ir Studies ◽  
Poorly Soluble ◽  
Poorly Soluble Drug

Roxythromycin/ β-cyclodextrin (Roxy/ β-CD) dispersions were prepared with a view to study the influence of β-CD on the solubility and dissolution rate of this poorly soluble drug. Phase-solubility profile indicated that the solubility of roxythromycin was significantly increased in the presence of β-cyclodextrin and was classified as AL-type, indicating the 1:1 stoichiometric inclusion complexes. Physical characterization of the prepared systems was carried out by differential scanning calorimetry (DSC), X-ray diffraction studies (XRD) and IR studies. Solid state characterization of the drug β-CD binary system using XRD, FTIR and DSC revealed distinct loss of drug crystallinity in the formulation, ostensibly accounting for enhancement of dissolution rate.

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