Scanning Surface Potential Microscopy

AbstractVariable temperature atomic force microscopy (AFM), scanning surface potential microscopy (SSPM) and piezoresponse imaging were applied to the characterization of a model BaTiO3(100) surface. The influence of the domain structure on surface topography, surface potential and piezoresponse image is discussed. The domain induced surface corrugations and piezoelectric response were found to disappear above the Curie temperature in full agreement with theoretical expectations. Relaxation of apparent surface potential after the transition to paraelectric state on heating and during the transition to ferroelectric state on cooling was observed. The kinetics of potential relaxation was orders of magnitude slower than that of the transition.

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Artifacts and Non-Local Effects in SPM Potential Measurements

Microscopy Today ◽

10.1017/s1551929500058156 ◽

2002 ◽

Vol 10 (4) ◽

pp. 16-21

Author(s):

Sergei V. Kalinin ◽

Dawn A. Bonnell

Keyword(s):

Surface Potential ◽

Scanning Probe Microscopy ◽

Nanoscale Systems ◽

First Pass ◽

Non Local ◽

Imaging Artifacts ◽

Dual Pass ◽

Scanning Surface Potential Microscopy ◽

Physical Phenomena ◽

Fundamental Physical

In the last few years Scanning Probe Microscopy (SPM) has become one of the primary tools of science and technology. In addition to topographical imaging, surface potential, conductivity, optical, ferroelectric and magnetic properties that can be studied down to the nanometer level. However, quantitative and sometimes qualitative studies of fundamental physical phenomena in meso- and nanoscale systems are often hindered by SPM imaging artifacts. Here we briefly discuss the principles of operation and the major sources of artifacts in electrostatic measurements by SPM.One of the most well known techniques for local potential imaging is Scanning Surface Potential Microscopy (SSPM). SSPM is based on dual pass imaging. The grounded tip acquires surface topography during the first pass.

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Effect of phase transition on the surface potential of the BaTiO3 (100) surface by variable temperature scanning surface potential microscopy

Journal of Applied Physics ◽

10.1063/1.372440 ◽

2000 ◽

Vol 87 (8) ◽

pp. 3950-3957 ◽

Cited By ~ 78

Author(s):

Sergei V. Kalinin ◽

Dawn A. Bonnell

Keyword(s):

Phase Transition ◽

Surface Potential ◽

Variable Temperature ◽

Temperature Scanning ◽

Scanning Surface Potential Microscopy

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Localized Charging Effects Resulting From Focused Ion Beam Processing Of Non-Conductive Materials

MRS Proceedings ◽

10.1557/proc-792-r10.11 ◽

2003 ◽

Vol 792 ◽

Author(s):

Marion. A. Stevens-Kalceff ◽

S. Rubanov ◽

P. R. Munroe

Keyword(s):

Surface Potential ◽

Focused Ion Beam ◽

Ion Beam ◽

Surface Potentials ◽

Conductive Materials ◽

Scanning Surface Potential Microscopy ◽

Charged Ions ◽

Insight Into ◽

Positively Charged ◽

Ion Implanted

ABSTRACTFocused Ion Beam (FIB) systems employ a finely focussed beam of positively charged ions to process materials. Ion induced charging effects in non-conductive materials have been confirmed using Scanning Surface Potential Microscopy (SSPM). Significant localized residual charging is observed within the ion implanted micro-volumes of non-conductive materials both prior to and following the onset of sputtering. Characteristic observed surface potentials associated with the resultant charging have been modelled, giving insight into the charging processes during implantation and sputtering. The results of this work have implications for the processing and microanalysis of non-conductive materials in FIB systems.

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