A High-Precision Scheme for MINS/GPS Ultra-Tight Integration System

2021 ◽  
pp. 4237-4250
Author(s):  
Jianxin Ren ◽  
Junlin Zi ◽  
Jin Li
Keyword(s):  
High Precision ◽  
Integration System ◽  
Tight Integration

A Novel Integration Method with Stabilizing Voltage and Frequency, UPS, Intelligent Charging for Mobile Power Supply

2014 ◽  
Vol 530-531 ◽  
pp. 1126-1129
Author(s):  
Yi Fei Wang ◽  
You Xin Yuan ◽  
Liang Yuan ◽  
Ping Kuang ◽  
Jing Chen
Keyword(s):  
High Precision ◽  
Power Supply ◽  
Topological Structure ◽  
Integration Method ◽  
Integrated System ◽  
Voltage Amplitude ◽  
Integration System ◽  
Advanced Method ◽  
Integrated Method ◽  
Precision Voltage

A novel integration method with stabilizing voltage and frequency, UPS, intelligent charging for mobile power supply has been proposed in this paper. Process of the advanced method can be divided into four steps, including the generating electricity, outputting stabilizing voltage and frequency, UPS, intelligent charging. The following works have been done in the study: the principle of the integration method, the topological structure of integration system, the Implementation of the integration method. According to the principle of the integrated method, the integrated system can be developed. The system can be realized functions, such as the generating electricity, outputting stabilizing voltage and frequency, UPS, intelligent charging and so on. By the system, the high precision voltage amplitude and frequency is supply to outdoor load, and the UPS state is maintained.

scholarly journals An Innovative High-Precision Scheme for a GPS/MEMS-SINS Ultra-Tight Integrated System

Sensors ◽  
2019 ◽  
Vol 19 (10) ◽  
pp. 2291
Author(s):  
Qunsheng Li ◽  
Yan Zhao
Keyword(s):  
High Precision ◽  
Carrier Phase ◽  
Integrated System ◽  
Integration Scheme ◽  
Tracking Loop ◽  
Phase Measurements ◽  
Gps Measurement ◽  
Global Positioning ◽  
Navigation Accuracy ◽  
Tight Integration

The Doppler-assisted error provided by a low-precision microelectromechanical system (MEMS) strapdown inertial navigation system (SINS) increases rapidly. Therefore, the bandwidth of the tracking loop for a global positioning system (GPS)/MEMS-SINS ultra-tight integration system is too narrow to track Doppler shift. GPS measurement error is correlated with the MEMS-SINS velocity error when the Doppler-assisted error exists, leading to tracking loop lock loss. The estimated precision of the integrated Kalman filter (IKF) also decreases. Even the integrated system becomes unstable. To solve this problem, an innovative GPS/MEMS-SINS ultra-tight integration scheme based on using high-precision carrier phase measurements as the IKF measurements is proposed in this study. By assisting the tracking loop with time-differenced carrier phase (TDCP) velocity, the carrier loop noise bandwidth and code correlator spacing are reduced. The tracking accuracies of the carrier and code are increased. The navigation accuracy of GPS/MEMS-SINS ultra-tight integration is further improved.

A High-precision Vectorial Integration System for Anemometers1

1961 ◽  
Vol 42 (5) ◽  
pp. 314-316
Author(s):  
L. P. Reiche ◽  
F. L. Ludwig
Keyword(s):  
High Precision ◽  
Wind Vector ◽  
Digital Form ◽  
Integration System ◽  
Average Wind ◽  
Electronic Instrumentation

An electronic instrumentation scheme for AC-type anemometers is described which permits the ten-minute-average wind vector to be determined with higher precision and reliability than by other means known to the authors. The average vector is conveniently given as two components in digital form.

Automatic measurement of SAED patterns from asbestos minerals

1988 ◽  
Vol 46 ◽  
pp. 846-847
Author(s):  
J. C. Russ ◽  
T. Taguchi ◽  
P. M. Peters ◽  
E. Chatfield ◽  
J. C. Russ ◽  
...  
Keyword(s):  
Diffraction Pattern ◽  
High Precision ◽  
Diffraction Data ◽  
Automatic Measurement ◽  
Automatic Method ◽  
Important Method ◽  
X Ray ◽  
Integrated Intensity ◽  
Asbestiform Minerals ◽  
True Center

Conventional SAD patterns as obtained in the TEM present difficulties for identification of materials such as asbestiform minerals, although diffraction data is considered to be an important method for making this purpose. The preferred orientation of the fibers and the spotty patterns that are obtained do not readily lend themselves to measurement of the integrated intensity values for each d-spacing, and even the d-spacings may be hard to determine precisely because the true center location for the broken rings requires estimation. We have implemented an automatic method for diffraction pattern measurement to overcome these problems. It automatically locates the center of patterns with high precision, measures the radius of each ring of spots in the pattern, and integrates the density of spots in that ring. The resulting spectrum of intensity vs. radius is then used just as a conventional X-ray diffractometer scan would be, to locate peaks and produce a list of d,I values suitable for search/match comparison to known or expected phases.

On effects of non-systematic reflections on weak-beam images of partial dislocations

1991 ◽  
Vol 49 ◽  
pp. 688-689
Author(s):  
K. Z. Botros ◽  
S. S. Sheinin
Keyword(s):  
High Precision ◽  
Stacking Fault ◽  
Important Application ◽  
Stacking Fault Energy ◽  
Sharp Peak ◽  
Weak Beam ◽  
Partial Dislocations ◽  
Deviation Parameter ◽  
Beam Diffraction

The main features of weak beam images of dislocations were first described by Cockayne et al. using calculations of intensity profiles based on the kinematical and two beam dynamical theories. The feature of weak beam images which is of particular interest in this investigation is that intensity profiles exhibit a sharp peak located at a position very close to the position of the dislocation in the crystal. This property of weak beam images of dislocations has an important application in the determination of stacking fault energy of crystals. This can easily be done since the separation of the partial dislocations bounding a stacking fault ribbon can be measured with high precision, assuming of course that the weak beam relationship between the positions of the image and the dislocation is valid. In order to carry out measurements such as these in practice the specimen must be tilted to "good" weak beam diffraction conditions, which implies utilizing high values of the deviation parameter Sg.

Digital differential hysteresis iimage processing displays what the microscope acquires but the eye can't see

1995 ◽  
Vol 53 ◽  
pp. 642-643
Author(s):  
Klaus-Ruediger Peters
Keyword(s):  
Image Processing ◽  
Visual System ◽  
High Precision ◽  
Image Data ◽  
Processing Technology ◽  
Output Data ◽  
Contrast Resolution ◽  
Pixel Intensity ◽  
Data Reading ◽  
Hysteresis Properties

Differential hysteresis processing is a new image processing technology that provides a tool for the display of image data information at any level of differential contrast resolution. This includes the maximum contrast resolution of the acquisition system which may be 1,000-times higher than that of the visual system (16 bit versus 6 bit). All microscopes acquire high precision contrasts at a level of <0.01-25% of the acquisition range in 16-bit - 8-bit data, but these contrasts are mostly invisible or only partially visible even in conventionally enhanced images. The processing principle of the differential hysteresis tool is based on hysteresis properties of intensity variations within an image.Differential hysteresis image processing moves a cursor of selected intensity range (hysteresis range) along lines through the image data reading each successive pixel intensity. The midpoint of the cursor provides the output data. If the intensity value of the following pixel falls outside of the actual cursor endpoint values, then the cursor follows the data either with its top or with its bottom, but if the pixels' intensity value falls within the cursor range, then the cursor maintains its intensity value.

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